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检索条件"任意字段=Conference on Process Control and Diagnostics"
1531 条 记 录,以下是1431-1440 订阅
排序:
Using Pattern Recognition in controller Adaptation and Performance Evaluation
Using Pattern Recognition in Controller Adaptation and Perfo...
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American control conference (ACC)
作者: Ralph F. Hinde Douglas J. Cooper Department of Chemical Engineering University of Connecticut Storrs CT USA
This work presents pattern recognition-based methods for controller adaptation and performance evaluation. These methods comprise a passive model-based adaptive control algorithm that is simple to use, easy to underst... 详细信息
来源: 评论
Self-adjusting diagnostic system for the manufacture of crystal resonators
Self-adjusting diagnostic system for the manufacture of crys...
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conference Record of the IEEE Industry Applications Society Annual Meeting (IAS)
作者: B.H. Gwee M.H. Lim B.H. Soong School of Electrical and Electronic Engineering Nanyang Technological University Singapore
A self-adjusting diagnostic system for monitoring the frequency trimming process is described. The SAFUDS (self-adjusting fuzzy diagnostic system) is capable of adjusting its knowledge to the changes with two incorpor... 详细信息
来源: 评论
Discrete-Event Based Monitoring and Diagnosis of Manufacturing processes
Discrete-Event Based Monitoring and Diagnosis of Manufacturi...
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American control conference (ACC)
作者: Sujeet Chand Science Center Rockwell International Corporation Thousand Oaks CA USA
We describe a decentralized control method that augments Boolean logic control to provide greatly enhanced diagnostics and monitoring of systems with discrete-valued sensors and actuators. Unlike conventional Boolean ... 详细信息
来源: 评论
Fault detection and identification using a hierarchical neural network-based system
Fault detection and identification using a hierarchical neur...
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International conference on Industrial Electronics, control and Instrumentation
作者: M.F. Abdel Mageed A.F. Sakr A. Bahgat Electrical Engineering Department Cairo University Cairo Egypt
A new approach to detect and identify faults in complex processes is proposed. The approach is based on a hierarchical neural network structure. Other neural network applications in process fault diagnostics provide o... 详细信息
来源: 评论
A monitoring and diagnostics system for a plasma etching cell
A monitoring and diagnostics system for a plasma etching cel...
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1991 IEEE/SEMI Advanced Semiconductor Manufacturing conference and Workshop
作者: Moyne, James R. Etemad, Hossein Najafi, Nader
A three-level process monitoring and diagnostics system has been developed for a plasma etching cell. The physical and logical layout of this system is designed to co-exist with a proposed hierarchical cell control sy... 详细信息
来源: 评论
Application of optical emission diagnostics and control related to deposition processing
Application of optical emission diagnostics and control rela...
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35th Annual Technical conference Proceedings
作者: Barney, B. Viloria, G. Lopata, E. ITC Antioch United States
This paper will discuss and show applications of optical emission spectroscopy to the monitoring and control of physical vapor deposition. It is the intent of this paper to render a tutorial on the technology of optic... 详细信息
来源: 评论
Neural network application to comprehensive engine diagnostics
Neural network application to comprehensive engine diagnosti...
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IEEE International conference on Systems, Man, and Cybernetics, SMC 1992
作者: Marko, Kenneth A. Bryant, Bruce Soderborg, Nathan Ford Motor Company DearbornMI48121-2054 United States
This paper examines the application of trainable classification systems to the problem of diagnosing faults in engines at the manufacturing plant. Combining standard statistical methods and neural networks offers the ... 详细信息
来源: 评论
Optimal sliding-window detector for disruptions in random sequences
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Proceedings of the 1992 American control conference
作者: Chang, Wei Rorres, Chris Kam, Moshe Drexel Univ Philadelphia PA United States
The detection of instants of change in random process properties, a problem with a variety of applications in technical and medical diagnostics, control, and image processing, is considered. The focus in this study is... 详细信息
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IMC-based extended PID controller for sampled-data systems
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Proceedings of the 1992 American control conference
作者: Jian-Min Zhu, Jimmy Saucier, Michael F. Process & Instrumentation Diagnostics Inc Phoenix United States
Extended Proportional Integral Derivative (EPID) is a model based control algorithm which consists of a conventional digital PID controller plus an additional compensator. This novel extension to the PID control algor... 详细信息
来源: 评论
EZ-IMC controller in industry
EZ-IMC controller in industry
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Proceedings of the Industrial Computing conference
作者: Hall, Raymond C. Zhu, Jimmy J.M. Saucier, Michael F. McAllister, Greg A. Process & Instrumentation Diagnostics Inc Phoenix United States
For systems with difficult dynamics such as large deadtimes, inverse responses or large time constants, conventional PID controllers have to be detuned significantly to ensure stability due to the limitation of the co... 详细信息
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