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检索条件"任意字段=Conference on Process Control and Diagnostics"
1528 条 记 录,以下是71-80 订阅
排序:
Features of Power Supply Digital control System for Magnetic Pulse processing
Features of Power Supply Digital Control System for Magnetic...
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2022 conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2022
作者: Perevalov, Yuri Y. Parmenov, Vyacheslav E. Melnikov, Artem S. Maslennikov, Nazar V. Bondarenko, Dmitriy N. Saint Petersburg Electrotechnical University Faculty of Industrial Automation and Electrical Engineering Leti Saint Petersburg Russia
This article describes the development of a digital control system and a power source for charging high-voltage capacitors in installations of magnetic pulse processing of various cross-sections pipes and profiles. Co... 详细信息
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AI driven process Diagnostic & control: Device Manufacturing
AI driven Process Diagnostic & Control: Device Manufacturing
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IEEE Electron Devices Technology and Manufacturing conference (EDTM)
作者: Jaeyong Park Samsung Hwasung Republic of Korea
This paper explores the integration of Artificial Intelligence (AI) in process control and diagnostics in semiconductor manufacturing. It highlights current trends, including machine learning (ML) for data alignment a...
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In-Line Monitoring of Overlay and process Window using Design-Assisted Voltage Contrast Inspection for 14nm FINFET Technology  36
In-Line Monitoring of Overlay and Process Window using Desig...
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conference on Metrology, Inspection, and process control XXXVI Part of SPIE Advanced Lithography and Patterning conference
作者: Li, Runling Hsu, IKai Brozek, Tomasz Yang, Linrong He, Debiao Wu, Fangrui Ren, Jiadong Zhu, Yefang Zhang, Yan Liu, Pei Zhang, Haiqiong Zhang, Guifeng Fu, Yingying Yin, Shan Jia, Yujie Yu, Bo Shanghai Huali Integrated Circuit Corp Shanghai 201314 Peoples R China PDF Solut Santa Clara CA 95050 USA
A variety of middle-of-line lithography overlay (OVL) and process window (PW) parameters have been monitored using PDF Solutions Design-for-Inspection (TM) (DFI (TM)) in 14nm FinFET technology. The DFI system, which i... 详细信息
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Critical Information Infrastructure Facility Status Monitoring: Risk Potential of the process  15
Critical Information Infrastructure Facility Status Monitori...
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15th International conference Management of Large-Scale System Development, MLSD 2022
作者: Abdulova, Ekaterina Laboratory of Complex Networks V.A. Trapeznikov Institute of Control Sciences of Ras Moscow Russia
The paper is devoted to the issues of data mining and building on their basis predictive models for systems of diagnostics and monitoring of the technological process of facilities of critical information infrastructu... 详细信息
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Semiconductor Manufacturing Case Studies: Wedge Bonder Characterization via Advanced process control (APC)  39
Semiconductor Manufacturing Case Studies: Wedge Bonder Chara...
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IEEE 39th International Electronics Manufacturing Technology conference (IEMT)
作者: Ong, Cheng Guan Seet, Sue Yin Shah, Nazaruddin Md Ezzuddin, Zaril Infineon Technol Malaysia Sdn Bhd Equipment Engn Melaka Malaysia Infineon Technol Malaysia Sdn Bhd Unit Proc Engn Melaka Malaysia Infineon Technol Malaysia Sdn Bhd Factory Intergrat Melaka Malaysia
Advanced process control (APC) enables solution to finer levels of control and diagnostics with integration between machines to manufacturing system. Defining of each key-numbers thru mathematics derivation can be cru... 详细信息
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Rolling Bearing Fault diagnostics Using SSA-ELM and TVF-EMD Multi-Scale Entropy  7
Rolling Bearing Fault Diagnostics Using SSA-ELM and TVF-EMD ...
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7th International conference on Advanced Algorithms and control Engineering, ICAACE 2024
作者: Song, Shuo Wu, Guangcuan Wang, Wenbo Wuhan University Of Science And Technology Hubei Province Key Laboratory Of System Science In Metallurgical Process Wuhan430081 China Guangdong Hongtu Wuhan Die Casting Co. Wuhan430200 China
In order to address the issues with the traditional intelligent algorithm for optimizing ELM parameters-such as slow optimization speed, many adjustment parameters, and easy fall into the local optimal value-and its p... 详细信息
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Model-Assisted Reinforcement Learning for Online diagnostics in Stochastic controlled Systems  17
Model-Assisted Reinforcement Learning for Online Diagnostics...
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IEEE 17th International conference on control and Automation (ICCA)
作者: Noorani, Erfaun Somarakis, Christoforos Goyal, Raman Feldman, Alexander Rane, Shantanu Palo Alto Res Ctr Palo Alto CA 94304 USA Univ Maryland Inst Syst Res ISR Dept Elect & Comp Engn College Pk MD 20742 USA A James Clark Sch Engn College Pk MD 20742 USA
A mechanism to protect a controlled system in the event of a priori unknown abnormalities (e.g. faults, attacks) is the key to designing resilient and robust control systems. We explore bi-level control design archite... 详细信息
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Multi-Level Voltage control Strategy for Rural Distribution Network based on System Theory  6
Multi-Level Voltage Control Strategy for Rural Distribution ...
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6th IEEE International conference on Sensing, diagnostics, Prognostics, and control, SDPC 2022
作者: Wu, Min Wei, Fusheng Cai, Yongzht Guangdong Power Co. Ltd. Guangzhou China Metrology Center of Guangdong Power Grid Co. Ltd. Guangzhou China
In order to solve the problem that the existing voltage control methods cannot adapt to the demand of voltage control in active rural distribution networks, this paper presents a multi-level voltage control strategy o... 详细信息
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Health Indicator Development for Low-Voltage Battery diagnostics and Prognostics in Electric Vehicles  16
Health Indicator Development for Low-Voltage Battery Diagnos...
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16th Annual conference of the Prognostics and Health Management Society, PHM 2024
作者: Du, Xinyu Mu, Huaizheng Corr, Kevin Nowak, Matt Wang, Hong Chang, Tung-Wah Frederick Rahimifard, Sara General Motors Global Technical Center WarrenMI78092 United States General Motors Canadian Technical Center MarkhamONL3R4H8 Canada
Each electric vehicle (EV) requires a low-voltage (e.g., 12V) auxiliary battery to provide electric power to onboard electronic control units, lighting systems, and various sensors during power off. Therefore, when th... 详细信息
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Application of motion control in rehabilitation devices  23
Application of motion control in rehabilitation devices
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23rd International Carpathian control conference (ICCC)
作者: Cernohorsky, Josef Diblik, Martin Richter, Ales Tech Univ Liberec Fac Mechatron Informat & Interdisciplinary Studie Liberec Czech Republic
The paper presents an innovative solution of special recondition ergometer. This ergometer is designed as stationary bike with independent pedals. The synchronization of pedals to each other to preserve bipedal motion... 详细信息
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