This article describes the development of a digital control system and a power source for charging high-voltage capacitors in installations of magnetic pulse processing of various cross-sections pipes and profiles. Co...
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This paper explores the integration of Artificial Intelligence (AI) in processcontrol and diagnostics in semiconductor manufacturing. It highlights current trends, including machine learning (ML) for data alignment a...
This paper explores the integration of Artificial Intelligence (AI) in processcontrol and diagnostics in semiconductor manufacturing. It highlights current trends, including machine learning (ML) for data alignment and predictive maintenance, and anticipates future advancements in data sharing and standardization. This overview showcases AI’s transformative impact on equipment optimization and industry collaboration, underlining its role in shaping efficient, proactive manufacturing processes.
A variety of middle-of-line lithography overlay (OVL) and process window (PW) parameters have been monitored using PDF Solutions Design-for-Inspection (TM) (DFI (TM)) in 14nm FinFET technology. The DFI system, which i...
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ISBN:
(纸本)9781510649828;9781510649811
A variety of middle-of-line lithography overlay (OVL) and process window (PW) parameters have been monitored using PDF Solutions Design-for-Inspection (TM) (DFI (TM)) in 14nm FinFET technology. The DFI system, which incorporates voltage contrast (VC) electron beam (e-beam) technique on PDF Solutions knowledge based test structure designs, has proven to assist lithography overlay control and processdiagnostics, covering process loops of epitaxy, metal gate (MG), contact on active (M0A), contact on metal gate (M0P) as well as segmentation cuts of M0A and MG. In-line eBeam scans are performed after Contact CMP, and OVL and PW parameters are extracted from the curve fitting of VC signals responding to misalignment values. For each process module, dedicated test structures with different layout attributes are designed and placed on the wafer to characterize OVL and PW sensitivity to feature density, geometry and substrate doping. In this work, the concept of DFI system, with specific illustration of DFI M0A to MG OVL measurement to assist inline OVL control and process fix is reported. Although eBeam-based Voltage Contrast techniques traditionally have been used to detect Open and Short failures, and cannot be used to directly measure critical dimensions (CD) of patterned features, the DFI system is designed to monitor integrated process window (PW) variation introduced either by an intentional process split or an unintentional process/tool drift in production line. The results presented below demonstrate DFI capability to assist in-line OVL and PW control for yield enhancement, production monitoring, and excursion prevention.
The paper is devoted to the issues of data mining and building on their basis predictive models for systems of diagnostics and monitoring of the technological process of facilities of critical information infrastructu...
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Advanced processcontrol (APC) enables solution to finer levels of control and diagnostics with integration between machines to manufacturing system. Defining of each key-numbers thru mathematics derivation can be cru...
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ISBN:
(数字)9781665471701
ISBN:
(纸本)9781665471701
Advanced processcontrol (APC) enables solution to finer levels of control and diagnostics with integration between machines to manufacturing system. Defining of each key-numbers thru mathematics derivation can be crunch by APC Trend Suite using calculated and statistical key-numbers. Case studies of application of this feedback information illustrate that benefits can be achieved from straight-forward applications;however, these benefits can be expanded (especially) as more complex scheduling and control solutions are implemented. Realizing this type of yield-enhanced solution in a cost-effective manner requires manufacturing-wide adherence to standards and best practices for component integration, event-based control system operation, and user interface management. In these manufacturing case studies, hick wire wedge bonder platform was selected as primary case studies for abnormal characterization detection with the help of APC Trend Suite Software. Non-stick on lead (NSOL) defect is well known defect in ball bond or wedge bond process, and the post-mortem effect causing high effort of reverse engineering study. With APC connection, several trace data such as current, deformation and impedance able to be captured and correlated back to defect location (row and column). Consequently, the study also looked into Fault Detection, Classification and Prediction (FDC+P) of clamping finger wear and tear rate corresponding to Lot Run Yield and Clamping Touch Down.
In order to address the issues with the traditional intelligent algorithm for optimizing ELM parameters-such as slow optimization speed, many adjustment parameters, and easy fall into the local optimal value-and its p...
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A mechanism to protect a controlled system in the event of a priori unknown abnormalities (e.g. faults, attacks) is the key to designing resilient and robust control systems. We explore bi-level control design archite...
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ISBN:
(纸本)9781665495721
A mechanism to protect a controlled system in the event of a priori unknown abnormalities (e.g. faults, attacks) is the key to designing resilient and robust control systems. We explore bi-level control design architectures in which a supervisory Reinforcement Learning (RL) agent augments an over-observed controlled system. The RL agent monitors sensor signals, detects and takes action to mitigate unknown sensor faults. We use the system dynamics to extract features and develop a design method for the cost function of the RL module. We theoretically show that the designed cost function has a unique optimal policy that enables the diagnosis of arbitrary constant sensor faults. To conceptualize our architecture, we consider a linear version of an over-observed chemical process, controlled by a Linear Quadratic Gaussian (LQG) Servo-controller with Integral Action. Our experimental results, coupled with our theoretical analysis, show that the RL-agent is successful in identifying and mitigating the faults in one or more sensors in an online fashion.
In order to solve the problem that the existing voltage control methods cannot adapt to the demand of voltage control in active rural distribution networks, this paper presents a multi-level voltage control strategy o...
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Each electric vehicle (EV) requires a low-voltage (e.g., 12V) auxiliary battery to provide electric power to onboard electronic control units, lighting systems, and various sensors during power off. Therefore, when th...
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The paper presents an innovative solution of special recondition ergometer. This ergometer is designed as stationary bike with independent pedals. The synchronization of pedals to each other to preserve bipedal motion...
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ISBN:
(纸本)9781665466363
The paper presents an innovative solution of special recondition ergometer. This ergometer is designed as stationary bike with independent pedals. The synchronization of pedals to each other to preserve bipedal motion is based on electronic synchronization via master slave. This arrangement must be changed in each half rotation. The sensorless torque measurement, diagnostics and recondition process visualization is described in the paper too. The short description of mechanical design is a part of the paper.
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