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Conference on current developments in Lens design and optical engineering ii

作者： Sure, T Wesner, J Heil, J Leica Microsyst GmbH D-35578 Wetzlar Germany

ISBN: (纸本)0819441554

We discuss the requirements on design and production regarding geometric and chromatic aberrations for objectives used in 4Pi confocal microscopy. We show that even the selection of a category 1/1 glass will not automatically assure that these requirements are met. due to residual variations in the Abbe number nu within the manufacturers tolerances. Consequently, the optical design has to take into consideration the possibility of balancing chromatic aberrations by varying selected air spacings in the final assembly of each individual objective. We also demonstrate. that for analyzing the influence of aberrations on the intensity distribution along the optical axis. a scalar diffraction theory is still applicable and very useful.

关键词： 4Pi confocal microscopy geometrical aberrations chromatic aberrations diffraction limited objectives scalar diffraction theory apodization depolarization Twyman-Green interferometer

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Enhancements to the optimisation process in lens design (I)

Enhancements to the optimisation process in lens design (I)

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Conference on current developments in Lens design and optical engineering ii

作者： Schuhmann, R Adams, G The Optical Software Company United Kingdom LINOS Photonics GmbH Germany

ISBN: (纸本)0819441554

Over the years much time has been dedicated to improving lens optimisation routines. Most of the work has been upon the damped least squares (DLS) method. In this paper a number of theoretical and practical enhancements are presented. Some are new, others have already been published but never transposed into commercial software. These enhancements combine to allow the user to make more informed choices at every stage of an optimisation, and have now been incorporated into the widely used WinLens software package.

关键词： optical instrument lenses

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F-sin(theta) lens system and applications

F-sin(theta) lens system and applications

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Conference on current developments in Lens design and optical engineering ii

作者： Thibault, S INO Opt Engn Div St Foy PQ G1P 4S4 Canada

ISBN: (纸本)0819441554

Introducing the desired amount of distortion in an optical system is possible and relatively straight forward for optical designer. Known f-theta lenses used in laser scanner system is one of the most popular lenses of this type. With the development of DWDM system, compact spectrometer and various grating based devices, the interest in solving optical problems with innovative optical design has been a revival. On the other hand, it is possible to simplify considerably the task of the software by designing more sophisticated optical element. The F-sin(theta) lens is such a device which can be used in various grating based devices to improve the performance. This optical device is intended to provide a new lens or lens group which can be used with a diffraction grating to provide a linear output plane with the wavelength (lambda), but also with the order of diffraction (m), or with the grating spatial frequency, or with the inverse of the index of refraction (l/n). Based on theoretical consideration, we calculated which amount of distortion is desired to get linear output plane for a grating based device. We present singlet. achromatic doublet and mirror having this characteristic. These F-sin(theta) lenses present satisfactory distortion charateristic and have an improved correction for the curvature of image plane. F-sin(theta) lens will be also name F-lambda lens.

关键词： WDM DWDM distortion optical design aberration grating spectrometer

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Linear wavelength spectrometer

Linear wavelength spectrometer

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Conference on current developments in Lens design and optical engineering ii

作者： Thibault, S INO Opt Engn Div St Foy PQ G1P 4S4 Canada

ISBN: (纸本)0819441554

Generally, a spectrometer uses a diffraction grating to spread the spectral components of a light incident on the diffraction grating on a one-dimensional detector. The detector is composed of pixels linearly distributed along a line. However, the diffracted light is not spread linearly on the detector which means that the Wavelength on pixel I is not linearly correlated with the wavelength on pixel 2. The resolution is therefore not constant for all the spectral range of the spectrometer. To know which pixel corresponds to which wavelength, a nonlinear calibration process must be applied to get a linear relation between the diffracted light position and the wavelength of this light. The new spectrometer that we present uses a special lens configuration name F-sin(theta) lens to provide a linear relation in the image plane between the pixel position and the wavelength of the light. The f-sin(theta) characteristic is defined as the difference in percent between the design position of the wavelength in the image plane and its ideal position, if the lens is perfect. The characteristic of the lens used in the spectrometer is better than 0.1%. The concept can also be used for WDM and DWDM applications.

关键词： spectrometer WDM DWDM distortion optical design guided optics

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optical designs for the Mars '03 rover cameras

Optical designs for the Mars '03 rover cameras

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Conference on current developments in Lens design and optical engineering ii

作者： Smith, GH Hagerott, EC Scherr, LM Herkenhoff, KE Bell, JF GHS Opt Pasadena CA 91101 USA

ISBN: (纸本)0819441554

In 2003, NASA is planning to send two robotic rover vehicles to explore the surface of Mars. The spacecraft will land on airbags in different, carefully chosen locations. The search for evidence indicating conditions favorable for past or present life will be a high priority. Each rover will carry a total of ten cameras of five various types. There will be a stereo pair of color panoramic cameras, a stereo pair of wide-field navigation cameras, one close-up camera on a movable arm, two stereo pairs of fisheye cameras for hazard avoidance, and one Sun sensor camera. This paper discusses the lenses for these cameras. Included are the specifications, design approaches, expected optical performances. prescriptions, and tolerances.

关键词： optical engineering lens design cameras Mars JPL

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Moire interferometry for engineering mechanics: current practices and future developments

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JOURNAL OF STRAIN ANALYSIS FOR engineering design 2001年第1期36卷 101-117页

作者： Han, B Post, D Ifju, P Univ Maryland Dept Mech Engn Inst Technol College Pk MD 20742 USA Virginia Polytech Inst & State Univ Dept Engn Sci & Mech Blacksburg VA 24061 USA Univ Florida Gainesville FL USA

In the past decade, the optical method called moire interferometry has matured rapidly to emerge as an invaluable tool, proved by many industrial and scientific applications. It has been applied to numerous problems in engineering mechanics. It measures in-plane displacement fields with high sensitivity and high spatial resolution. This paper reviews current practices of moire interferometry and its extensions. Applications in diverse fields are addressed to demonstrate the wide applicability of the method, especially the recent applications for thermal deformation analyses of microelectronics devices. Speculation on future developments and practices is presented.

关键词： moire interferometry engineering mechanics

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Scalable MWIR and LWIR optical system designs employing a large spherical primary mirror and small refractive aberration correctors

Scalable MWIR and LWIR optical system designs employing a la...

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Conference on current developments in Lens design and optical engineering ii

作者： Beach, D Ind Res Ltd Auckland New Zealand

ISBN: (纸本)0819441554

design variants of a recently developed optical imaging system have been computed for the thermal infrared spectral bands, which offer some advantages for long-range surveillance and astronomy. Only the spherical primary mirror has the fall pupil diameter, all other components being sub-diameter, so scaling is possible up to relatively large pupils. Low-cost fabrication is enabled by the prevalence of spherical optical surfaces. Both MWIR and LWIR spectral transmissions are enabled by the choice of corrector materials, the examples given employing germanium and sapphire for 3.5-5.5 mum and germanium and zinc selenide for 3.5-5.5[mum and 8-12mum passbands. Diffraction at these wavelengths is the main contributor to resolution constraints, so high numerical aperture values are preferred to enable a better match of blur spot diameter to generally available pixel dimensions. The systems described can routinely be designed to have speeds of f/0.8 or faster, while maintaining diffraction-limited performance over useful angular fields. Because the new design system employs a relayed catadioptric, it is possible to make the aperture stop of the system coincident with the window of the detector cryostat, enabling precise radiometric geometry. The central obscuration provides a convenient location for a calibration source, and both this and a mask for secondary spider supports can be included within the detector cold screen structure. Dual-band operation could be enabled by inclusion of a spectral beam splitter prior to a dual relay/imager system.

关键词： MWIR imaging LWIR imaging diffraction-limited spherical mirror optics high speed wide field

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Advanced optical design for biochip scanning system

Advanced optical design for biochip scanning system

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Conference on current developments in Lens design and optical engineering ii

作者： Huang, GL Cheng, J Zhou, YX Feng, JH Liu, CX Jin, GF Wu, MX Yan, YB Yang, R Li, L Tsing Hua Univ Dept Biol Sci & Technol Beijing 100084 Peoples R China

ISBN: (纸本)0819441554

Laboratory-on-a-chip has been interested widely in recent years, where the sample preparation, bio-chemical reaction, separation, detection and analysis, are performed in a small biochip which is only a fingernall dimension. In order to obtain a high detection sensitivity I fluors/um(2) (one fluorescence molecule per square micrometer) in biochip scanning system it is required that the scanning objective lens is a big numerical aperture(>0.5), very small focal spot(<5um) and long back focal length(>3mm). In this paper, a combined lens is designed for the scanning objective lens, which is with big numerical aperture NA>0.7, very small focal spot(<2um) and long back focal length(>3mm). The phase aberrations of combined lens, including the aspherical aberration and the chromatic aberration corresponding to wavelength 532nm, 570nm 635nm, 670nm, are corrected very well. The encircled energy diagram of the lens is good to the diffraction limit. The focal spot diagram the optical path difference diagram, the transverse ray fan plot and the modulation transfer function, are studied also. A novel confocal scanning system of biochip with the designed combined lens as the objective lens is developed, some experiment results in a multi-channel biochip are obtained.

关键词： lens confocal fluorescence gene DNA biochip

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Optics for binocular telescopes.

Optics for binocular telescopes.

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Conference on current developments in Lens design and optical engineering ii

作者： Rayces, JL Rosete-Aguilar, M J L Rayces Consuting Ltd Laguna Niguel CA 92677 USA

ISBN: (纸本)0819441554

Low power telescopes such as those used in pairs in binoculars do not have a reticle at the intermediate, real, image plane. Therefore there is no need to correct aberrations of the intermediate images as it is in pointing devices. Generally, in order to keep the telescope simple and short the Petzval sum is not corrected. In most cases the solution is to introduce astigmatism in the eyepiece. If it is permissible to use the accommodation of the eye as a degree of freedom then it is possible to remove the astigmatism over the entire field of view and yet to obtain ever better imagery. The final virtual anastigmatic images presented to the eye by the telescope are formed on a curved surface convex towards the observer's eye. The eye will be focused at a close distance for axial images and relaxed for the extreme off-axis images. Then the telescope is to be designed for different conjugate positions at different field angles. Furthermore the telescope is to be designed for different exit pupil locations at different field angles in order to minimize vignetting when the exit pupil is not sufficiently large, designing for different conjugate and pupil position at different field angles is almost always possible with most optical design codes using multiple configuration mode.

关键词： optical design telescopes binoculars eyepieces

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High speed and high definition technology by multi-beam scanning in laser printing

High speed and high definition technology by multi-beam scan...

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Conference on current developments in Lens design and optical engineering ii

作者： Hayashi, Y Amada, T Ricoh Co Ltd Ricoh Imaging Technol Div Tokyo Japan

ISBN: (纸本)0819441554

Multi-beam scanning is the effective method for high speed and high definition in Laser Printing, and there are three systems for this method as fellows. 1) Laser Diode (LD) Array system 2) System for dividing a single light source 3) System for combining beams of multiple LDs by optical devices Each of these systems has both advantage and disadvantage, and which one to use among these three depends on application requirements. The third system above allows for the use of conventional LDs and therefore it is low cost and offers a large degree of freedom in selecting light sources. We have already developed a Two LD Prism-based Light Source Unit that uses a C, prism to combine the beams emitted by two LDs. This system achieves stable optical characteristics with any conventional scanning optical elements. We have further enhanced this system. We have determined an optimum design that includes scanning lens and have developed the Two LD Beam-crossing Light Source Unit which performs multi-beam scanning using two LDs without a prism. In this paper, we report on recent multi-beam-scanning technologies and introduce our newly developed the Two LD Beam-crossing Light Source Unit.

关键词： Light sources optical scanning systems Mirrors Prisms Monochromatic aberrations Nonimpact printing optical components optical fibers Temperature metrology Semiconductor lasers

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