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检索条件"任意字段=IEEE/ACM International Conference on Computer Aide Digest"
890 条 记 录,以下是121-130 订阅
排序:
Parallel multi-level analytical global placement on graphics processing units  09
Parallel multi-level analytical global placement on graphics...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Cong, Jason Zou, Yi Computer Science Department University of California Los Angeles Los Angeles CA 90095 United States
GPU platforms are becoming increasingly attractive for implementing accelerators because they feature a larger number of cores with improved programmability. In this paper, we describe our implementation of a state-of... 详细信息
来源: 评论
An accurate and efficient performance analysis approach based on queuing model for network on chip  09
An accurate and efficient performance analysis approach base...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Lai, Mingche Gao, Lei Xiao, Nong Wang, Zhiying School of Computer National Univ. of Defense Tech. Changsha China
An accurate and highly-efficient performance analysis approach is extremely important for the early-stage designs of network-onchip. In this paper, the novel M/G/1/N queuing models for generic routers are proposed to ... 详细信息
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Memory organization and data layout for instruction set extensions with architecturally visible storage  09
Memory organization and data layout for instruction set exte...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Athanasopoulos, Panagiotis Brisk, Philip Leblebici, Yusuf Ienne, Paolo School of Computer and Communication Sciences Bourns College of Engineering University of California Riverside Riverside CA 92521 United States Department of Computer Science and Engineering Bourns College of Engineering University of California Riverside Riverside CA 92521 United States CH-1015 Lausanne Switzerland
Present application specific embedded systems tend to choose instruction set extensions (ISEs) based on limitations imposed by the available data bandwidth to custom functional units (CFUs). Adoption of the optimal IS... 详细信息
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Adaptive power management using reinforcement learning  09
Adaptive power management using reinforcement learning
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Tan, Ying Liu, Wei Qiu, Qinru Department of Electrical and Computer Engineering Binghamton University State University of New York Binghamton NY 13902 United States
System level power management must consider the uncertainty and variability that comes from the environment, the application and the hardware. A robust power management technique must be able to learn the optimal deci... 详细信息
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A hierarchy of subgraphs underlying a timing graph and its use in capturing topological Correlation in SSTA  09
A hierarchy of subgraphs underlying a timing graph and its u...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Chung, Jaeyong Abraham, Jacob A. Computer Engineering Research Center University of Texas at Austin Austin TX 78712 United States
This paper shows that a timing graph has a hierarchy of specially defined subgraphs, based on which we present a technique that captures topological correlation in arbitrary block-based statistical static timing analy... 详细信息
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A rigorous framework for convergent net weighting schemes in timing-driven placement  09
A rigorous framework for convergent net weighting schemes in...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Chan, Tony F. Cong, Jason Radke, Eric Univ. of California Los Angeles Computer Science Dept. United States Univ. of California Los Angeles Mathematics Dept. United States Hong Kong University of Science and Technology Hong Kong
We present a rigorous framework that defines a class of net weighting schemes in which unconstrained minimization is successively performed on a weighted objective. We show that, provided certain goals are met in the ... 详细信息
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Minimizing expected energy consumption through optimal integration of DVS and DPM  09
Minimizing expected energy consumption through optimal integ...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Zhao, Baoxian Aydin, Hakan Department of Computer Science George Mason University Fairfax VA 22030 United States
While Dynamic Voltage Scaling (DVS) and Dynamic Power Management (DPM) techniques are widely used in real-time embedded applications, their complex interaction is not fully understood. In this research effort, we cons... 详细信息
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Compacting test vector sets via strategic use of implications  09
Compacting test vector sets via strategic use of implication...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Alves, Nuno Dworak, Jennifer Bahar, Iris Nepal, K. Division of Engineering Brown University Providence RI 02912 United States Electrical Engineering Dept. Bucknell University Lewisburg PA 17837 United States
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which in turn makes simple approaches for t... 详细信息
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Characterizing within-die variation from multiple supply port IDDQ measurements  09
Characterizing within-die variation from multiple supply por...
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Agarwal, Kanak Acharyya, Dhruva Plusquellic, Jim IBM Corp. United States Verigy Ltd. University of New Mexico United States
The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding characterization circuits in product ch... 详细信息
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Voltage binning under process variation  09
Voltage binning under process variation
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2009 ieee/acm international conference on computer-aided Design, ICCAD 2009
作者: Zolotov, Vladimir Visweswariah, Chandu Xiong, Jinjun IBM T.J. Watson Research Center Yorktown Heights NY United States IBM System and Technology Group Hopewell Junction NY United States
Process variation is recognized as a major source of parametric yield loss, which occurs because a fraction of manufactured chips do not satisfy timing or power constraints. On the other hand, both chip performance an... 详细信息
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