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检索条件"任意字段=IEEE/ACM International Conference on Computer Aide Digest"
890 条 记 录,以下是201-210 订阅
排序:
A voltage-frequency island aware energy optimization framework for networks-on-chip
A voltage-frequency island aware energy optimization framewo...
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2008 international conference on computer-aided Design, ICCAD
作者: Wooyoung, Jang Duo, Ding Pan, David Z. Department of Electrical and Computer Engineering University of Texas at Austin Austin TX 78712 United States
In this paper, we present a partitioning, mapping, and routing optimization framework for energy-efficient VFI (Voltage-Frequency Island) based Network-on-Chip. Unlike the recent work [10] which only performs partitio... 详细信息
来源: 评论
Power supply signal calibration techniques for improving detection resolution to hardware trojans
Power supply signal calibration techniques for improving det...
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2008 international conference on computer-aided Design, ICCAD
作者: Rad, Reza M. Wang, Xiaoxiao Tehranipoor, Mohammad Plusquellic, Jim Department of CSEE Univ. of Maryland Baltimore Campus Department of Electrical and Computer Engineering Univ. of Connecticut Department of Electrical and Computer Engineering Univ. of New Mexico
Chip design and fabrication is becoming increasingly vulnerable to malicious activities and alternations with globalization. An adversary can introduce a Trojan designed to disable and/or destroy a system at some futu... 详细信息
来源: 评论
On capture power-aware test data compression for scan-based testing
On capture power-aware test data compression for scan-based ...
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2008 international conference on computer-aided Design, ICCAD
作者: Li, Jia Liu, Xiao Zhang, Yubin Hu, Yu Li, Xiaowei Xu, Qiang Key Laboratory of Computer System and Architecture ICT CAS Beijing China Graduate University Chinese Academy of Sciences Beijing China Deptartment of Computer Science and Engineering Chinese University of Hong Kong Shatin N.T. Hong Kong
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the "don't-care" bits can be... 详细信息
来源: 评论
Thermal-aware floorplanning for task migration enabled active sub-threshold leakage reduction
Thermal-aware floorplanning for task migration enabled activ...
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2008 international conference on computer-aided Design, ICCAD
作者: Mogal, Hushrav D. Bazargan, Kia Department of Electrical and Computer Engineering University of Minnesota Minneapolis MN 55455 United States
This paper presents a new approach to active sub-threshold leakage reduction using task migration. The main idea is to replicate a hot module in a design so as to actively migrate its computation at regular intervals,... 详细信息
来源: 评论
NTHU-route 2.0: A fast and stable global router
NTHU-route 2.0: A fast and stable global router
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2008 international conference on computer-aided Design, ICCAD
作者: Chang, Yen-Jung Lee, Yu-Ting Wang, Ting-Chi Department of Computer Science National Tsing Hua University Hsinchu 30013 Taiwan
We present in this paper a fast and stable global router called NTHU-Route 2.0 that improves the solution quality and runtime of a state-of-the-art router, NTHU-Route, by the following enhancements: (1) a new history ... 详细信息
来源: 评论
Context-sensitive static transistor-level IR analysis
Context-sensitive static transistor-level IR analysis
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2008 international conference on computer-aided Design, ICCAD
作者: Guo, Weiqing Zhong, Yu Burd, Tom Silicon Design CAD Advanced Micro Devices Sunnyvale CA 94085 United States Dept. of Electrical and Computer Engineering Univ. of Illinois at Urbana-Champaign Urbana IL 61801 United States
With advances in semiconductor process technology, chip power density has dramatically increased, making power grid integrity a critical concern at all stages of the design process. Given the inherent difficulty of ca... 详细信息
来源: 评论
System-level thermal aware design of applications with uncertain execution time
System-level thermal aware design of applications with uncer...
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2008 international conference on computer-aided Design, ICCAD
作者: Zhang, Sushu Chatha, Karam S. Department of Computer Science and Engineering Arizona State University Tempe AZ 85287 United States
The paper introduces the problem of system-level thermal aware design of applications with uncertain run time on an embedded processor equipped with dynamic voltage/frequency scaling features. The problem takes as inp... 详细信息
来源: 评论
A framework for predictive dynamic temperature management of microprocessor systems
A framework for predictive dynamic temperature management of...
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2008 international conference on computer-aided Design, ICCAD
作者: Khan, Omer Kundu, Sandip Department of Electrical and Computer Engineering University of Massachusetts Amherst Amherst MA 01002 United States
The sustained push for performance, transistor count and instruction level parallelism has reached a point where IC thermal issues are at the forefront of design constraints. Many of the current systems deploy dynamic... 详细信息
来源: 评论
FastRoute3.0: A fast and high quality global router based on virtual capacity  08
FastRoute3.0: A fast and high quality global router based on...
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2008 international conference on computer-aided Design, ICCAD
作者: Yanheng, Zhang Yue, Xu Chu, Chris Department of Electrical and Computer Engineering Iowa State University Ames IA 50011 United States
As an easily implemented approach, ripup and reroute has been employed by most of today's global routers, which iteratively applies maze routing to refine solution quality. But traditional maze routing is suscepti... 详细信息
来源: 评论
Breaking the simulation barrier: SRAM evaluation through norm minimization
Breaking the simulation barrier: SRAM evaluation through nor...
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2008 international conference on computer-aided Design, ICCAD
作者: Dolecek, Lara Qazi, Masood Shah, Devavrat Chandrakasan, Anantha Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology Cambridge MA 02139 United States
With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM components is becoming a central issue. In this p... 详细信息
来源: 评论