conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover...
conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Provides an abstract only for each of the keynote presentations and may include a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the confe...
Provides an abstract only for each of the keynote presentations and may include a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings. These keynote speech abstracts discuss the following: The future of computing through brain-inspired architectures; Networks of NMOS and neurons.
Jointly sponsored by acm and ieee, the internationalconference on computer-aideddesign (ICCAD) is the premier forum to explore emerging technology challenges in electronic design automation (EDA), to present leading...
Jointly sponsored by acm and ieee, the internationalconference on computer-aideddesign (ICCAD) is the premier forum to explore emerging technology challenges in electronic design automation (EDA), to present leading-edge research and development solutions, and to identify future roadmaps for the design automation research areas.
Jointly sponsored by acm and ieee, the internationalconference on computer-aideddesign (ICCAD) is the premier forum to explore emerging technology challenges in electronic design automation (EDA), to present leading...
详细信息
The following topics are dealt with: circuit simulation, gate level test tools, database management systems (DBMS), circuit level test techniques, cell synthesis, testable arrays, device modeling, silicon compilers, d...
详细信息
ISBN:
(纸本)0818606878
The following topics are dealt with: circuit simulation, gate level test tools, database management systems (DBMS), circuit level test techniques, cell synthesis, testable arrays, device modeling, silicon compilers, design for testability, concurrent logic simulation, hardware accelerators, floor-planning tools, logic validation, module generators, timing simulation and analysis, layout verification, simulated annealing, knowledge-based systems, layout techniques, and high-level synthesis. 101 papers were presented, all of which are published in full in the present proceedings.
This publication contains 124 conference digest papers. The following topics are dealt with: routing algorithms and complexity;timing analysis and verification;routing methods;performance enhancements for logic and sw...
详细信息
ISBN:
(纸本)0818620552
This publication contains 124 conference digest papers. The following topics are dealt with: routing algorithms and complexity;timing analysis and verification;routing methods;performance enhancements for logic and switch-level simulation;interacting sequential machines and Boolean function manipulation;floorplanning algorithms;yield maximization;sequential verification;circuit simulation;logic synthesis;analog layout;high-level synthesis;automatic test pattern generation;technology driven routing;reliability simulation;sequential optimization;parallel matrix techniques;synthesis for test and diagnosis;exploratory initiatives in CAD frameworks;combinatorial optimization;partitioning and module generation;synthesis systems.
The following topics are dealt with: detailed routing;VLSI testing in practice;tool integration;hardware speedup of placement;built-in-self test;module generation and layout synthesis;electrical simulation;design for ...
详细信息
ISBN:
(纸本)0818607440
The following topics are dealt with: detailed routing;VLSI testing in practice;tool integration;hardware speedup of placement;built-in-self test;module generation and layout synthesis;electrical simulation;design for testability tools;behavior synthesis;timing analysis;automatic test pattern generation;rule-based synthesis;simulation on multiprocessors;gridless routing;data path and state machine synthesis;statistical design;global routing;control path synthesis;interconnect modeling;array testing;verification systems;gate matrix layout;fault simulation;minimization techniques;system concepts;call placement techniques;hardware accelerators;circuit extraction and DRC;new theory for place and route;IC design systems;module generators;system aspects and VLSI placement;process and device simulation;symbolic layout;generation and evaluation;and CAD for process design. 115 papers were presented, all of which are published in full in the present proceedings.
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