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检索条件"任意字段=IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD"
229 条 记 录,以下是1-10 订阅
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2009 ieee circuits and systems international conference on testing and diagnosis, ictd'09
2009 IEEE Circuits and Systems International Conference on T...
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2009 ieee circuits and systems international conference on testing and diagnosis, ictd'09
The proceedings contain 172 papers. The topics discussed include: study of the test flow optimization method in radar fault isolation;network cable fault location based on the wide pulse time domain reflection;researc...
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2009 ieee circuits and systems international conference on testing and diagnosis, ictd 09: Preface
2009 IEEE Circuits and Systems International Conference on T...
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2009 ieee circuits and systems international conference on testing and diagnosis, ictd'09 2009年
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Chair's Introduction to 2009 ieee circuits and systems international conference on testing and diagnosis
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Journal of Electronic Science and Technology of China 2009年 第4期7卷 289-289页
作者: Rueywen Liu General Chair of ICTD‘09 University of Notre Dame Notre Dame
Based on the recommendation of ictd'09 TPC members, this Special Issue of the Journal of Electronic Science & Technology of China (JESTC) contained 22 high quality papers selected from the Proceedings of 2009 ieee... 详细信息
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Chairs Introduction to 2009 ieee circuits and systems international conference on testing and diagnosis
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Journal of Electronic Science and Technology 2009年 第4期000卷
作者: Rueywen Liu University of Notre Dame Notre Dame Indiana 46556
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Design and implementation of FC-AE-1553 point to point transmission hardware platform
Design and implementation of FC-AE-1553 point to point trans...
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ieee circuits and systems international conference on testing and diagnosis
作者: Leng Yue Zong Zhulin Liu Wei Univ Elect Sci & Technol China Res Inst Elect Sci & Technol Chengdu 610054 Sichuan Peoples R China
This paper presents a method to realize FC-AE-1553 point to point data transmission hardware platform, and bring forward a method to test the platform. We used well developed protocol cards and embedded computer to re... 详细信息
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On the Effectiveness of the System Validation Based on the Black Box testing Methodology
On the Effectiveness of the System Validation Based on the B...
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ieee circuits and systems international conference on testing and diagnosis
作者: Marijan, Dusica Teslic, Nikola Temerinac, Miodrag Pekovic, Vukota Univ Novi Sad Fac Tech Sci Trg Dositeja Obradov 6 SRB-21000 Novi Sad Serbia Novi Sad Inst Informat Technol MicronasNIT SRB-21000 Novi Sad Serbia
This paper presents an original system verification methodology for complex consumer electronic devices. Automated verification of the system which consists of hardware (integrated circuit) and corresponding software ... 详细信息
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BIST Approach for testing Embedded Memory Blocks in System-on-Chips
BIST Approach for testing Embedded Memory Blocks in System-o...
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ieee circuits and systems international conference on testing and diagnosis
作者: Zhang, Zhiquan Wen, Zhiping Chen, Lei BMTI 9243 Beijing 100076 Peoples R China
This paper presents a Built-In Self-Test (BIST) approach to test embedded memory blocks in configurable System-on-Chips (SoCs). The idea of this paper is to develop BIST architecture and BIST configurations for testin... 详细信息
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Specific Design and Optimization of JTAG IP Core
Specific Design and Optimization of JTAG IP Core
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ieee circuits and systems international conference on testing and diagnosis
作者: Zhang, Xiaobo Jiang, Yanfeng Ju, Jiaxin N China Univ Technol Coll Informat Engn Dept Microelect Beijing 100144 Peoples R China
A JTAG IP core based on ieee1149.1 standard has been reported here, including its design and implementation. it has been described using synthesized Verilog HDL language. Simulation demonstration has also been made an... 详细信息
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Experimental Study on Real-time Control System testing
Experimental Study on Real-time Control System Testing
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ieee circuits and systems international conference on testing and diagnosis
作者: Wang, Jinhe Zhang, Nan He, Qinggang Qingdao Technol Univ Sch Comp Engn Qingdao 266033 Peoples R China Harbin Inst Technol Sch Software Engn Weihai 264200 Peoples R China
This paper presents an experimental study on the testing of process control for a real-time control system. Several indexes, such as the capability of system approximation output, the ramp rates, the smoothness and st... 详细信息
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A Novel BIST Approach for testing Input/Output Buffers in SOCs
A Novel BIST Approach for Testing Input/Output Buffers in SO...
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ieee circuits and systems international conference on testing and diagnosis
作者: Chen, Lei Wen, Zhiping Zhang, Zhiquan Min, Wang Beijing Microelect Tech Inst Beijing 100076 Peoples R China
A novel Built-in Self-Test (BIST) approach to test the configurable Input/Output buffers in Xilinx Virtex series SOCs using Hard Macro has been proposed in this paper. The proposed approach can completely detects sing... 详细信息
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