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检索条件"任意字段=IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD"
229 条 记 录,以下是1-10 订阅
排序:
A Fault diagnosis Method for Power Electronic circuits Based on GADF Coding and Channel Split Residual Network
A Fault Diagnosis Method for Power Electronic Circuits Based...
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2024 ieee international conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2024
作者: Meng, Linghui Xie, Jinyang Zhou, Zhenwei Chen, Yiqiang China Electronic Product Reliability and Environmental Testing Research Institute Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou China School of Electrical Engineering Beijing Jiaotong University Beijing China
With the objective to achieve an accurate diagnosis of commonly encountered fault problems in power electronic circuits and to prevent the occurrence of catastrophic failures, a soft fault diagnosis model for dc-dc co... 详细信息
来源: 评论
Adaptive Methods for Machine Learning-Based testing of Integrated circuits and Boards
Adaptive Methods for Machine Learning-Based Testing of Integ...
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ieee international Test conference (ITC)
作者: Liu, Mengyun Chakrabarty, Krishnendu Duke Univ Dept Elect & Comp Engn Durham NC 27706 USA
The relentless growth in information technology and artificial intelligence (AI) is placing demands on integrated circuits and boards for high performance, added functionality, and low power consumption. However, thes... 详细信息
来源: 评论
Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application  35
Reduction of Fault Dictionary Size by Optimizing the Order o...
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35th international Technical conference on circuits/systems, Computers and Communications (ITC-CSCC)
作者: Higami, Yoshinobu Inamoto, Tsutomu Wang, Senling Takahashi, Hiroshi Saluja, Kewal K. Ehime Univ Grad Sch Sci & Engn Bunkyocho 3 Matsuyama Ehime 7908577 Japan Univ Wisconsin Dept Elect & Comp Engn 1415 Engn Dr Madison WI 53706 USA
Fault dictionary based approach is known to be a popular diagnosis method. In this approach, output responses are compared between a circuit under diagnosis and an associated fault dictionary to deduce candidate fault... 详细信息
来源: 评论
A Learning-Based Cell-Aware diagnosis Flow for Industrial Customer Returns
A Learning-Based Cell-Aware Diagnosis Flow for Industrial Cu...
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ieee international Test conference
作者: S. Mhamdi P. Girard A. Virazel A. Bosio A. Ladhar LIRMM Univ. of Montpellier / CNRS Montpellier France INL École Centrale de Lyon France STMicroelectronics Crolles France
diagnosis is crucial in order to establish the root cause of observed failures in systems-on-Chip (SoC). In this paper, we present a new framework based on supervised learning for cell-aware defect diagnosis of custom... 详细信息
来源: 评论
Deep Convolutional Neural Network (DCNN) for Skin Cancer Classification
Deep Convolutional Neural Network (DCNN) for Skin Cancer Cla...
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ieee international conference on Electronics, circuits and systems (ICECS)
作者: Nour Aburaed Alavikunhu Panthakkan Mina Al-Saad Saad Ali Amin Wathiq Mansoor College of Engineering and IT University of Dubai Dubai UAE
Skin cancer is one of the most threatening types of cancer, with an increasing rates throughout the decade. Detecting and classifying skin cancer in its early stages provides better chances for treatment. In the recen... 详细信息
来源: 评论
High Throughput Chain diagnosis Methodology with Minimal Failure Data Collection
High Throughput Chain Diagnosis Methodology with Minimal Fai...
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ieee international Test conference on India (ITC India)
作者: Sameer Chillarige Anil Malik Atul Chhabra Bharath Nandakumar Kanika Kanwal Cadence Design Systems Noida India
The following topics are dealt with: integrated circuit testing; integrated circuit design; electronic engineering computing; automotive electronics; failure analysis; boundary scan testing; integrated circuit reliabi... 详细信息
来源: 评论
An Novel testing Sequence Optimization Method under Dynamic Environments  10
An Novel Testing Sequence Optimization Method under Dynamic ...
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10th international conference on Communications, circuits and systems (ICCCAS)
作者: Lu, Bo Mei, Wenjuan Zhou, Jianming Zhou, Hu Du, Li Liu, Zhen Beijing Aerosp Automat Control Inst Beijing Peoples R China Univ Elect Sci & Technol China Chengdu Sichuan Peoples R China
Over decades, testing sequence optimization has been an important part for the design of testability (DFT). However, most existed method suffers from high searching complexity. Meanwhile,with the high speed of updatin... 详细信息
来源: 评论
Accelerated Life testing and Performance Evaluation of Smart Pressure Transmitters for use in Nuclear Power Plants  7
Accelerated Life Testing and Performance Evaluation of Smart...
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7th international conference on Reliability, Infocom Technologies and Optimization - Trends and Future Directions (ICRITO)
作者: Chauhan, Yashasvi Shrestha, N. B. Santhosh, T. V. Shrivastava, Vivek Ramteke, P. K. Vinod, Gopika Chattopadhyay, J. Natl Inst Technol Delhi India Bhabha Atom Res Ctr Reactor Safety Div Mumbai Maharashtra India
Nuclear power plants (NPP) require continuous monitoring of various process parameters such as temperature, pressure and flow etc. for safe and reliable operation of the plant. Smart pressure transmitters (SPT) are in... 详细信息
来源: 评论
diagnosis of Performance Limiting Segments in Integrated circuits Using Path Delay Measurements
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ieee TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED circuits AND systems 2017年 第2期36卷 325-335页
作者: Somashekar, Ahish Mysore Tragoudas, Spyros Southern Illinois Univ Dept Elect & Comp Engn Carbondale IL 62901 USA
An approach capable of identifying the locations of distributed small delay defects, arising due to manufacturing aberrations, is proposed. It is shown that the proposed formulation can be transformed into a Boolean s... 详细信息
来源: 评论
Next Generation Armament Test Solutions for the Flightline
Next Generation Armament Test Solutions for the Flightline
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international Automatic testing conference, AUTOTESTCON
作者: Loofie Gutterman Marvin Test Solutions Irvine CA USA
Smart weapon systems are now common place within the U.S. Armed Forces community and among U. S. allies. And to ensure mission success, maintainers need to confirm that all of these systems are mission ready or Full M... 详细信息
来源: 评论