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检索条件"任意字段=IEEE International Symposium on On-Line Testing and Robust System Design"

共 809 条记录，以下是61-70 订阅

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A Power Supply Rejection Based Approach for robust Defect Detection in Operational Amplifiers

A Power Supply Rejection Based Approach for Robust Defect De...

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2023 ieee East-West design and Test symposium, EWDTS 2023

作者： Sekyere, Michael Saikiran, Marampally Chen, Degang Iowa State University Department of Electrical and Computer Engineering Iowa United States

ISBN: (纸本)9798350314847

This manuscript presents a comprehensive all-digital design for testability (DfT) approach which achieves high coverage in detecting defects in operational amplifiers (op amps) along with their reference and bias circuits. The proposed method has the capability of been applied both at production test and for on-line health monitoring post-deployment to detect zero-time and latent defects. The built-in self-test (BIST) circuitry is simple to design, occupies negligible area and exerts minimal to no influence on the op amp's regular performance. The proposed method is based primarily on DC parametric sweep which significantly shortens the test time and consequently leads to a substantial reduction in production test costs. Additionally, due to the digital nature of the method, it can also easily be implemented with existing digital testing infrastructure like IJTAG on a system on chip (SOC). Furthermore, in this work we introduce the duo digital window comparator, a novel detector for testing defects in the Widlar reference and the bias circuitry. We validate our method using extensive transistor-level simulation of a two-stage miller compensated folded cascode amplifier along with widlar reference and current bias circuit. Simulation results show that proposed method achieves a high defect coverage of 99% in main amplifier and 100% in widlar reference and bias circuitry. All the designs in this work are implemented in TSMC 180nm technology. © 2023 ieee.

关键词： Operational amplifiers

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Feedback-Tuned Fuzzing for Accelerating Quality Verification of Approximate Computing design

Feedback-Tuned Fuzzing for Accelerating Quality Verification...

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ieee symposium on On-line testing (IOLTS)

作者： Yusei Honda Yutaka Masuda Tohru Ishihara Nagoya University Nagoya Japan

This paper proposes a novel quality verification (q-verification) technique for approximate computing (AC) design, which explores the input patterns that violate the constraint of computational quality, e.g., image quality. The key component of the proposed technique is coverage-based grey-box fuzzing (CGF). For enhancing the efficacy of CGF, this work proposes a feedback tuning algorithm that controls the feedback information to the queue by referring to the computational quality. In a case study of approximate image processing design where the bit-width scaling is applied, we experimentally confirmed that the proposed method reduced the runtime required for q-verification by 1.92 times compared to the conventional q-verification method using CGF.

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Integrating LiDAR-Based Collision Avoidance on AMR-T for Advancing Operational Safety 26

Integrating LiDAR-Based Collision Avoidance on AMR-T for Adv...

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26th international Electronics symposium (IES) on Shaping the Future - Society 5.0 and Beyond

作者： Nurjanah, Riska Amalia Happyanto, Dedid Cahya Wijayanto, Ardik Politekn Elekt Negeri Surabaya Dept Elect Engn Surabaya Indonesia

ISBN: (纸本)9798350392005;9798350391992

Automatic Mobile Robot Transporter (AMR-T) represents a vital component in modern factory operations, offering enhanced efficiency and productivity. However, the deployment of AMR-T systems necessitates robust protection mechanisms to ensure safe navigation within dynamic environments. This study addresses the development of a protection system employing LiDAR sensors and fuzzy logic to enable obstacle detection and avoidance for AMR-T. LiDAR sensors are utilized to gather spatial data, enabling real-time analysis of the surrounding environment. Leveraging fuzzy logic, the system autonomously generates intelligent navigation decisions amidst uncertain or ambiguous conditions. The project encompasses comprehensive stages, including requirements analysis, system design, implementation, and rigorous testing. Key considerations such as system reliability, response, and detection accuracy are paramount throughout the development process. To maximize system performance, secondary sensors including inductive proximity sensors and limit switches were added. Results show high accuracy with an average error of 0.56%, effectiveness of inductive proximity sensors up to 14 mm, and reliability of limit switches for operational safety. The fuzzy logic approach successfully interprets collision threats and generates appropriate avoidance actions. This system enhances operational efficiency and safety, reduces the risk of product damage, and advances automation technology in the manufacturing industry. The anticipated outcomes aim to elevate operational efficiency and safety within factory settings, while also contributing to the advancement of automation technology across the manufacturing industry.

关键词： Automatic Mobile Robotic Transporter (AMR-T) collision avoidance system LiDAR sensor fuzzy logic obstacle detection

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Assessing robustness of Smart systems via Multi-domain Analog Fault Simulation

Assessing Robustness of Smart Systems via Multi-domain Analo...

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ieee symposium on On-line testing (IOLTS)

作者： Francesco Tosoni Nicola Dall’Ora Enrico Fraccaroli Sara Vinco Franco Fummi Department of Engineering for Innovation Medicine University of Verona Italy Department of Control and Computer Engineering Politecnico di Torino Italy

ISBN: (数字)9798350370553

ISBN: (纸本)9798350370560

Smart systems contain digital and analog components of several physical domains, e.g., electrical and mechanical During the design phase, the fault injection, which checks the system functionality following the guidelines of ISO standard 26262, enhances the system’s robustness. Unfortunately, fault injection and simulation on the analog side are i) not fully standardized compared to their digital counterparts, ii) highly domain-dependent, and iii) performed separately from the digital. This article proposes to improve the design of smart systems by generating faulty scenarios through analog fault injection across several physical domains. By exploiting these faulty scenarios it is possible to improve the robustness of the analog part and simultaneously improve the quality of the digital part that controls the system functionality.

关键词： ISO Standards Control systems robustness system analysis and design testing Guidelines

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On Evaluating Test Response Obfuscation and Encryption Countermeasures

On Evaluating Test Response Obfuscation and Encryption Count...

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ieee symposium on On-line testing (IOLTS)

作者： Gaurav Kumar Anjum Riaz Pardeep Kumar Yamuna Prasad Satyadev Ahlawat Dept. of EE IIT Jammu India Dept. of CSE IIT Jammu India

ISBN: (数字)9798350370553

ISBN: (纸本)9798350370560

The scan design is a widely accepted technique employed to enhance the testability of VLSI designs. However, it introduces exploitable side channels that allow attackers to illicitly access confidential information within crypto-cores. To address this concern, several countermeasures have been proposed. Among these countermeasures, two specific types include obfuscation and encryption of the test response at the Scan-Out (SO) port, rendering the test response inaccessible for analysis by potential attackers. This paper proposes a scan attack that effectively retrieves the AES encryption key, even in the presence of both obfuscation and encryption countermeasures.

关键词： Very large scale integration Rendering (computer graphics) Encryption system analysis and design testing

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Flip Flop Weighting: A technique for estimation of safety metrics in Automotive designs 27

Flip Flop Weighting: A technique for estimation of safety me...

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27th ieee international symposium on on-line testing and robust system design (IOLTS)

作者： da Silva, Felipe Augusto Bagbaba, Ahmet Cagri Hamdioui, Said Sauer, Christian Cadence Design Syst Munich Germany Delft Univ Technol Delft Netherlands

ISBN: (纸本)9781665433709

The requirements of ISO26262 for the development of safety-critical Integrated Circuits (IC) demand substantial efforts on fault analysis for safety metrics evaluation. Failing to achieve the required conditions entails modifications to the circuit, additional iterations through critical design phases, and consequently extra costs and delays. For that reason, providing accurate methods to estimate safety metrics is of great importance. This paper proposes a methodology that can efficiently and precisely estimate the safety metrics of Automotive designs. The technique is based on the characterization of a netlist to determine how hardware components contribute to fault propagation. Also, by examining the test stimuli applied during simulation, we can rank Workloads/Testbenches according to their fault detection coverage. The approach was verified running fault injection campaigns on distinct gate-level hardware designs, including an Automotive CPU. Our results show that the fault detection coverage can be estimated with an average error rate of 3% at up to 20X faster execution times when compared to the traditional campaigns. Hence the methodology provides an efficient and cost-effective mechanism to support engineers in a confident design space exploration.

关键词： ISO26262 design Space Exploration Fault Injection Formal Methods Simulation Functional Safety Verification

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Modelling our way out of a featureless correspondence problem for automatic calibration of laser stripe mapping systems

Modelling our way out of a featureless correspondence proble...

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ieee international symposium on Underwater Technology (UT)

作者： Stanley, David Bodenmann, Adrian Massot-Campos, Miquel Thornton, Blair Univ Southampton FEPS Ctr Situ & Remote Intelligent Sensing Southampton Hants England Univ Tokyo Inst Ind Sci Tokyo Japan

ISBN: (纸本)9798350331752

This paper discusses a problem in predicting observations for laser stripe mapping systems that is akin to the correspondence problem for stereo imagery and structure from motion. Solving this problem is essential for allowing robust, efficient, featureless calibration of laser stripe extrinsic parameters using ordinary mapping data, similar to a bundle adjustment and referred to here as an automatic calibration. Such a calibration is important for laser stripe systems to calibrate them in-situ using natural scenes without additional hardware or calibration routines. We propose a simple modelling approach that ensures single predictions are made per observation and we highlight the implications for the design of laser stripe systems that would make simple laser line extraction algorithms more robust. We present the results of an automatic calibration using this modelling approach for simulated observations of entirely featureless terrain by a laser stripe mapping system;proving the concept of a robust, efficient, featureless, automatic calibration of laser stripe extrinsics.

关键词： calibration laser stripe seafloor mapping featureless extrinsics structured light bundle adjustment correspondence problem design underwater robotics

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A Suitability Analysis of Software Based testing Strategies for the On-line testing of Artificial Neural Networks Applications in Embedded Devices 27

A Suitability Analysis of Software Based Testing Strategies ...

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27th ieee international symposium on on-line testing and robust system design (IOLTS)

作者： Ruospo, A. Piumatti, D. Floridia, A. Sanchez, E. Politecn Torino Dipartimento Automat & Informat Turin Italy

ISBN: (纸本)9781665433709

Electronic devices based on artificial intelligence solutions are pervading our everyday life. Nowadays, human decision processes are supported by real-time data gathered from intelligent systems. Artificial Neural Networks (ANNs) are one of the most used deep learning predictive models due to their outstanding computational capabilities. However, assessing their reliability is still an open issue faced by both the academic and industrial worlds, especially when ANNs are deployed on safety-critical systems, such as self-driving cars in the automotive world. In these systems, a strategy for identifying hardware faults is required by industry standards (e.g., ISO26262 for automotive, and DO254 for avionics). Among the existing in-field test strategies, the periodic scheduling of on-line Software Test Library (STL) is a wide strategy adopted;STL allows to reach an acceptable fault coverage without the need for additional hardware. However, when dealing with ANN-based applications, the execution of on-line tests interleaving the ANN inferences may jeopardise the strive for performance maximization. The paper presents a comprehensive analysis of six possible scenarios concerning the execution of on-line self-test programs in embedded devices running ANN-based applications. In the proposed scenarios, the impact of the STL execution on the ANN performance is analyzed;in particular, the execution times of an inference and the Fault Detection Time (FDT) of the STL are discussed and compared. Experimental analyses are provided by relying on: an open-source RISC-V platform running two different convolutional neural networks;a STL for RISC-V cores with a maximum achievable fault coverage of 90%.

关键词： Artificial Neural Networks applications safety-critical application Software-Test Library

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Safety-Relevant AI-Based system robustification with Neural Network Ensembles

Safety-Relevant AI-Based System Robustification with Neural ...

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ieee symposium on On-line testing (IOLTS)

作者： Adrià Aldomà Axel Brando Francisco J. Cazorla Jaume Abella Barcelona Supercomputing Center (BSC) Spain Universitat Politecnica de Catalunya (UPC) Spain

Functional safety requirements of AI-based safety critical applications challenge AI models, whose accuracy can be limited. In this paper, we show how using several cooperative deep learning (DL) models helps to raise... 详细信息

ISBN: (数字)9798350370553

ISBN: (纸本)9798350370560

关键词： Deep learning Accuracy Roads Neural networks Predictive models Safety Artificial intelligence

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Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation

Radiation Hardness Evaluations of a Stacked Flip Flop in a 2...

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ieee symposium on On-line testing (IOLTS)

作者： Shotaro Sugitani Ryuichi Nakajima Takafumi Ito Jun Furuta Kazutoshi Kobayashi Mathieu Louvat Francois Jacquet Jean-Christophe Eloy Olivier Montfort Lionel Jure Vincent Huard Dept. of Electronics Kyoto Institute of Technology Japan Dolphin Design France

In 22 nm FDSOI, the flip-well structure is used instead of the standard-well structure. We evaluated soft-error tolerance by heavy-ion irradiation tests on standard and stacked flip-flops (STDFF and STACKEDFF) in the flip-well structure. The error probability of STACKEDFF was significantly smaller than STDFF. Therefore, the stacked structure is also effective against soft error in the flip-well structure. However, as the supply voltage is lowered, even STACKEDFF becomes vulnerable to soft errors under certain conditions. The origin of these errors was pMOSFETs. Therefore, soft error countermeasures are needed to account for errors from pMOSFETs.

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