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ieee International symposium on circuits and systems (ISCAS)

作者： A. Reatti M.K. Kazimierczuk Department of Electronic Engineering University of Florence Florence Italy Department of Electrical Engineering Wright State University Dayton OH USA

An expression for the efficiency of a transformer version of a Class E, half-wave, low dv/sub D//dt rectifier is derived in a closed form as a function of the output current. The equations giving the losses in capacitor equivalent series resistances (ESRs) in the transformer windings, and conduction losses in the diode are derived. Plots of the rectifier efficiency are given for several values of the output power, e.g., 50 W, 100 W, and 240 W, for output voltages of 5 V and 12 V, and using several values of capacitor ESRs. The Class E, half-wave rectifier is suitable for high-frequency applications that require outputs of 12 V. It is also suitable for applications with 5-V outputs only if the output power is lower than 50 W and the capacitor ESRs are low, e.g., 0.01/spl Omega/. The method can be used for the design optimization of other rectifier topologies.< >

关键词： Rectifiers Diodes Capacitors Filters Threshold voltage circuits Delay Shape Zero voltage switching Switching loss

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General test framework for straight-line detection by Hough transforms

General test framework for straight-line detection by Hough ...

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ieee International symposium on circuits and systems (ISCAS)

作者： A.R. Hare M.B. Sandler Department of Electronic and Electrical Engineering King''s College London UK

The design and implementation of a general software framework is described for testing line-detection algorithms on digital images. This test framework is applied to compare the reliability and accuracy of different Hough transform algorithms, including a new hybrid. The software test-bed generates digital images containing lines that are drawn pseudorandomly according to parameters defined at run-time. A line-detection algorithm is applied to each simulated edge-image, and the parameters of the detected lines are compared with those of the known inputs. The errors in parametrization are evaluated for detected lines, and the numbers of undetected lines and false alarms are recorded. The Standard Hough Transform (SHT) is compared with variants that use different parametrizations and input-data sampling procedures, including the Counter-Based Hough Transform (CBHT), the Randomized Hough Transform (FIHT2), and an improved RHT developed as a result of these trials, the 'rhotheta parametrized RHT' (rtRHT).< >

关键词： Image edge detection Digital images Software testing Detection algorithms Image generation Runtime Statistics Image sampling Image storage Image segmentation

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CAD EMC-design in Microelectronics (Finding the Right Balance)

CAD EMC-Design in Microelectronics (Finding the Right Balanc...

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10th International Zurich symposium and Technical Exhibition on Electromagnetic Compatibility

作者： M. J. Coenen Product Concept & Application Laboratory Eindhoven PHILIPS Semiconductors P.O.Box 218 5600 MD Eindhoven The Netherlands

ISBN: (纸本)9781509031955

EMC is not commonly accepted in microelectronics design areas. The designers have the opinion that EMC has to do with mandatory electrical and electronic system/ product regulations instead of requirements to the integrated circuits they are designing. Effects like; ground-bounce, output-edge control, RF-substrate currents, on-chip cross-talk, on-chip decoupling, etc.. are therefore not always seen as EMC aspects but just seen as a consequence of extended functional requirements. As such, progress in these areas of research is quite often reported in i.e. ieee Transactions of Solid-State circuits or in the ieee Transactions on circuits and systems.

关键词： Integrated circuit modeling Solid modeling Microelectronics Integrated circuits Immunity testing Radio frequency Cables Wiring Biological system modeling Microcontrollers

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Analysis and design of a DC to DC resonant converter for railroad applications

Analysis and design of a DC to DC resonant converter for rai...

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ieee International symposium on Industrial electronics (ISIE)

作者： M. Akherraz Department of Electrical Engineering Sultan Qaboos University Muscat Oman

This paper presents the analysis and design of a series DC to DC resonant converter for railroad applications. The proposed power converter is based on IGBT modules for the AC-DC link and fast power diodes for the AC-DC conversion. The application sought is a SMPS for start-up verification of mechanical, electrical and electronic systems of train locomotives. A special feature of this converter is the use of a variable air-gap transformer in the AC link. Twelve possible operating sequences, during resonant commutation, are detailed in an analytical investigation. Experimental results are presented and commented upon.< >

关键词： Switched-mode power supply Capacitors DC-DC power converters Voltage Analog-digital conversion Frequency conversion Insulated gate bipolar transistors Magnetic resonance Magnetic separation circuits

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A design of AC servo motor drive system-BLDC type

A design of AC servo motor drive system-BLDC type

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ieee International symposium on Industrial electronics (ISIE)

作者： K. Huh Hankyung Bae Electronic Department Dankook University Cheonan Chungcheongnam South Korea Central Research and Development Institute Daewoo Heavy Industries Limited Incheon South Korea

A design method of a brushless DC type AC servomotor drive system is presented. The servomotor drive system is designed to be applied to factory automation. The AC servomotor used is a trapezoidal type designed and made by Daewoo Heavy Industries Ltd. The drive system consists of a velocity controller, current controller and inverter. In the drive system a power transistor is used as the switching device and a 16 bit, one chip microprocessor is applied for the implementation of digital control. The velocity control algorithm is basically PI control with appropriate filtering. The current controller is also based on PI control, which is implemented in analog circuits to reduce the time delay effect. The designed servomotor drive shows good performance up to a velocity of 4500 RPM, which is sufficient for most factory automation applications.< >

关键词： Servomechanisms Motor drives Servomotors Automatic control Velocity control Manufacturing automation Control systems Pi control design methodology Electrical equipment industry

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The reliability of the integrated circuits in automotive industry

The reliability of the integrated circuits in automotive ind...

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ieee International symposium on Defect and Fault Tolerance in VLSI systems

作者： E. Ferrati

To obtain the reliability targets in automotive products is difficult. The environment for automotive products is comparable to military application while their cost has to compare favorably with consumer electronics. Automotive devices have to withstand wide electrical transients, strong thermal and mechanical stresses. In fact the main causes of failure are in almost perfect correlation with the above mentioned stresses. The partnership with semiconductor suppliers has the objective not only to guarantee the correct value of device parameters but also to define, at the design stage, the packaging size and all the other parameters which have a direct impact on component reliability. It is important to be able to design the set of reliability tests to be used to simulate the actual stress which the component will undergo during its life.

关键词： Integrated circuit reliability Automotive engineering Thermal stresses Defense industry Electrical products industry Costs Consumer electronics electronic packaging thermal management Semiconductor device packaging Semiconductor device reliability

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Application of air cooled microchannel heat exchangers to card cage systems

Application of air cooled microchannel heat exchangers to ca...

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ieee symposium on Semiconductor Thermal Measurement and Management (SEMI-THERM)

作者： R. Nelson T. Dolbear K. Chen C. Chao Microelectronics and Computer Technology Corporation Austin TX USA Hewlett Packard Company Palo Alto CA USA

An application of a novel-geometry, air-cooled, microchannel heat exchanger for electronic chips reported by C. Hilbert et al. (1990) is described. These heat exchangers, based on narrow channels and laminar flow, are scaled to cool large packets, mated to high-power pin grid arrays (PGAs) or multichip modules (MCMs), and mounted on printed circuit boards in a card cage. The heat exchanger reported fits within the package footprint and meets chip temperature specifications to 50 W. The system provides cooling for two MCM or PGA boards, each carrying eight 35-W modules using the scaled design. The modules were mounted on a printed wiring board, along with conventional components dissipating an additional 100 W. Chip temperature rises within the packages were kept to 50 degrees C above ambient. The entire card cage contained the two MCM or PGA boards and several other conventionally cooled boards. Fan placement and air flow design were conventional except for the provision of ducting above the high-power packages. The heat exchangers operate at a very low pressure loss, allowing the MCM section to be cooled with two common axial flow fans while generating acoustic noise within the range acceptable for office equipment.< >

关键词： Microchannel electronics packaging Temperature Multichip modules Printed circuits Chip scale packaging Cooling Wiring Packaging machines Fans

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Measurements of power and current components in unbalanced and distorted three‐phase systems

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European Transactions on Electrical Power 1993年第1期3卷 75-83页

作者： Andria, G. Salvatore, L. Savino, M. Trotta, A. Dr. Gregorio Andria (1956) AEI received the M. S. degree in Electrical Engineering from the State University of Bari/Italy in 1981 and the Ph. D. degree in Electrical Engineering in 1987 from the same University. From 1981 to 1983 he was working in the Electrotechnics and Electronics Department of the University of Bari as a member of the research team on electrical measurements. From 1984 to 1986 he was a Doctoral Fellow and currently he is a researcher in the same department. His research interests are in the fields of electrical and electronic measurements on components and systems including digital measurements for the analysis of electrical quantities in non-sinusoidal systems and the design of integrated optical sensors for measurement and control of non-electrical physical quantities. (Department of Electrotechnics and Electronics Faculty of Engineering polytechnic of Bovia E. Orabona 4 1-70125 Bari. Italy T +3980/242266 Fax + 3980/242410) Prof. Luigi Salvatore (1945) AEI received the degree in electrical engineering from the University of Bari/Italy in 1970. Since 1976 he has worked in the Electrotechnical and Electronic Department of the same University as a member of the research team on electrical machines. From 1983 to 1987 he was a researcher of electrical machines in the same department. Since 1987 he has been an Associate Professor of electrical machines at the University of Bari. At the present time his research interests include the control monitoring and diagnostics of AC drives and the areas of signal processing anddigital measurements on power electronics systems. (Department of Electrotechnics and Electronics Faculty of Engineering Polytechnic of Bari via E. Orabona 4 I-70125 Bari Italy T + 3980/242258 Fax + 3980/242410) Prof. Mario Savino (1947) AEI received the degree in Electrical Engineering from the University of Barif Italy in 1971. Since then he has been working in the Electrotechnical Institute of Bari until 1973 as researcher from 1973 to 1982 as Assistant Profe

The paper deals with the instantaneous power theory in three‐phase circuits by using the instantaneous time phasors of voltage and current. Particularly it is shown that the instantaneous components of the current time‐phasor in a rotating reference frame p‐q, oriented in such a way that the instantaneous voltage time‐phasor points to the p‐axis direction, represent the active and reactive currents. These components give rise to instantaneous real and imaginary powers, respectively. The spectral analysis of the above‐mentioned time‐phasors gives the harmonic symmetrical components of positive and negative sequence of voltage and current three‐phase systems. The line‐by‐line product of the voltage sequence spectrum by the complex conjugate of the current sequence spectrum gives the DC components of the instantaneous real and imaginary powers. The paper shows also that the instantaneous active and reactive currents are different from those defined on grounds of the Fryze's theory, which can be determined from the voltage and current sequence spectra. Copyright © 1993 John Wiley & Sons, Ltd.

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HIERARCHICAL TEST-GENERATION AND diagnostics OF DIFFERENTIAL CASCODE VOLTAGE SWITCH circuits

HIERARCHICAL TEST-GENERATION AND DIAGNOSTICS OF DIFFERENTIAL...

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INTERNATIONAL SYMP ON circuits AND systems ( ISCAS 92 )

作者： WU, DM SWANSON, RM DAVIS, JW IBM Z4305 Advanced Workstation Division Austin 78758 TX United States IBM Boca Raton 33432 FL United States

ISBN: (纸本)0780305930

Differential Cascode Voltage Switch (DCVS) is a digital circuit technology that has demonstrated to yield higher density and performance than standard CMOS implementations. The hierarchical circuit structures and design rules of DCVS lead to a unique methodology in design-for-testability, fault modeling and test generation. © 1992 ieee.

关键词： design for testability

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The importance of testing complex electronics 12

The importance of testing complex electronics

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12th International electronic Manufacturing Technology symposium, IEMT 1992

作者： Sinnadurai, N. Ambleside Corder Road Ipswich SuffolkIP42XD United Kingdom

ISBN: (纸本)0780306295

The increasing functionality of modern electronics systems is being achieved through more complex integrated circuits, dense surface mount assemblies and increasingly through the use of multiple complex ICs interconnected to form multi-chip modules, all of which have progressively increased the cost of testing and its share of production cost, so that test costs are dominant today. Initiatives taken in Europe by leading corporations and recently adopted as ieee standards for logic circuit testability, are now enabling electronic access for in-circuit testing and diagnostics at IC and board and MCM level, thereby improving quality and throughput in the manufacture of electronics. various proprietary solutions are also being introduced very effectively for analogue circuits, and for specialised computing and telecommunications systems, some using expert systems to aid diagnostics and improving the quality and throughput of testing. The solutions are most cost-effectively introduced at the design stage when maximum impact can be achieved on subsequent life-cycle costs. © 1992 ieee.

关键词： ieee Standards

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