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检索条件"任意字段=IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"

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A high voltage DC buck regulator using a crossatron switch tube

A high voltage DC buck regulator using a crossatron switch t...

引用

ieee symposium Power Modulator

作者： E.A. Farrell Whittaker Electronic Systems Simi Valley CA USA

A relatively simple high-voltage (HV) buck regulator circuit using a series crossatron switch tube is presented. Implementation of the buck regulator circuit led to a HV sensor investigation. This investigation resulted in a novel high-voltage sensor circuit using a FET as a constant current source. The novel sensing and logic circuit samples the pulse discharge capacitor voltage and generates turn on/turn off triggers to the series crossatron switch tube to control the recharge time of the pulse discharge capacitor. Circuit analysis by Fortran programming and P-slice analysis indicate that the buck regulator design goal of 0.02% HV regulation can be met under the worst conditions of line and load variations and high PRF (pulse repetition frequency) stagger ratios.< >

关键词： Switches Voltage Regulators Pulse circuits Switching circuits Fault location Switched capacitor circuits FETs Logic circuits Pulse generation

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Understanding the susceptibility of digital avionics to HERF

Understanding the susceptibility of digital avionics to HERF

引用

ieee International symposium on Electromagnetic Compatibility (EMC)

作者： G. Fuller D. Sorenson C. K. C. Laboratories Transdata Corporation

It is suggested that the high-power RF hazards of electromagnetic radiation to flight (HERF) issue is characterizable in terms of one major and one minor effect. The major effect is the detailed understanding of the coupling of the internal field into the aircraft wiring and electronics. The minor effect is in the statistical characterization of the external field penetration into the interior of the aircraft taken across the fleet. These effects can now be well defined through analysis and specifically verified through tests instead of radiating the entire aircraft with high-power external fields and trying to observe upsets and malfunctions in the operational functions of these systems. It is now possible to design protective means into the electronic circuits and verify them through a combination of calculations and low level tests. It is concluded that no longer is it necessary to have isolated pass/fail criteria.< >

关键词： Aerospace electronics Aircraft Circuit testing Radio frequency Hazards Electromagnetic radiation Wiring System testing Protection electronic circuits

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Efficient computation of the discrete Wigner-Ville distribution

Efficient computation of the discrete Wigner-Ville distribut...

引用

ieee International symposium on circuits and systems (ISCAS)

作者： Shing-Chow Chan Ka-Leung Ho Department of Electrical and Electronic Engineering University of Hong Kong Hong Kong China

To ensure that the discrete Wigner-Ville distribution (DWVD) does not contain aliasing terms, the analytic signal is normally used instead of the real signal. However, the computation of the analytic signal amounts to most of the computation time. Eilouti and Khadra (1989) made use of the overlapping between two successive sequences to develop a recursive algorithm for updating the analytic signal. The time difference between the successive sequences was taken to be one. The more general case with a time difference (lag) of P is considered. It is shown that the analytic signal can effectively be updated by computing an aperiodic convolution. For small lag, the convolution is evaluated directly, while for a transform with larger lag, the convolution is evaluated by a real-valued pruning FFT (fast Fourier transform) based on the split-radix FFT. The DWVD is then obtained from the DFT (discrete Fourier transform) of a conjugate symmetric sequence of reduced length which can be computed with the real-valued split-radix FFT algorithms.< >

关键词： Distributed computing Signal analysis Convolution Kernel Time frequency analysis Algorithm design and analysis Discrete transforms Arithmetic Time domain analysis Finite impulse response filter

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SPC and setup analysis for screen printed thick films

SPC and setup analysis for screen printed thick films

引用

ieee/CHMT(CPMT) International electronics Manufacturing Technology symposium

作者： M.R. Parikh W.F. Quilty K.M. Gardiner Electronics Technical Center Ford Motor Company Limited Dearborn MI USA North Penn Electronics Facility Ford Electronics and Refrigeration Corporation Lansdale PA USA Manufacturing Systems Engineering Lehigh University Bethlehem PA USA

The authors describe some of the key process variables that affect the repeatability of the screen printing process for thick-film circuits and hence the quality of the final product. The discussion of major screen printing problem areas provides insight into the complexity of the overall process and the interrelationship of the process variables. The interrelationships of the key variables and their relative importance to process quality and performance are analyzed using a statistical process control technique, namely statistical design of experiments. The fractional factorial design is used as an example. The setting up of a screen printer is a manual operation. Some simple steps necessary to improve the learning process and record keeping are described based on S. Shingo's setup time analysis approach (1985).< >

关键词： Thick films Printing Thick film circuits Substrates Ceramics Chemical elements Printers Manuals Process control Resistors

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SBAR filter monolithically integrated with HBT amplifier

SBAR filter monolithically integrated with HBT amplifier

引用

ieee symposium (IUS) Ultrasonics

作者： D. Cushman K.F. Lau E.M. Garber K.A. Mai A.K. Oki K.W. Kobayashi Advanced Microelectronics Laboratory TRW Electronic Systems Group Redondo Beach CA USA

The authors describe the successful monolithic integration of bulk acoustic filters with gallium arsenide integrated circuits. Data are presented for a filter-amplifier chip with a center frequency of 1023 MHz, a 4 MHz bandwidth, and +14 dB gain. The size of the filter-amplifier chip is 1.6*3.2 mm. The monolithic filter is an SBAR (semiconductor bulk acoustic resonator) stacked crystal filter. The filter was fabricated with sputtered aluminum nitride piezoelectric films. The active circuit is a gallium arsenide HBT amplifier. The amplifier is a two-stage design and has biasing resistors and coupling capacitors on-chip. The integration process for the monolithic SBAR-HBT filter-amplifier is outlined.< >

关键词： Heterojunction bipolar transistors Resonator filters Monolithic integrated circuits Gallium arsenide Frequency Bandwidth Gain Aluminum nitride Piezoelectric films Active circuits

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Short and long loop manufacturing feedback using multi-sensor assembly test chip

Short and long loop manufacturing feedback using multi-senso...

引用

ieee/CHMT(CPMT) International electronics Manufacturing Technology symposium

作者： J.N. Sweet M.R. Tuck D.W. Peterson D.W. Palmer Packaging Technology Division Sandia National Laboratories Albuquerque NM USA

A three-generation family of CMOS silicon test chips for packaging diagnostics has been developed. These assembly test chips (ATCs) contain sensors that measure a number of variables associated with assembled IC degradation, including the degree of IC corrosion, handling damage, electrostatic discharge threat, parts per million by volume moisture, mechanical stress, mobile ion density, bond pad cratering, and high-speed logic degradation. The ATC family is intended to give manufacturing feedback in four ways: direct feedback in evaluation of an assembly manufacturing line in an objective, nonintrusive way; before-and-after comparisons on an assembly production line when an individual process, material, or piece of equipment has been changed; resident lifetime monitoring for system package aging, and ongoing reliability projection and thermal, mechanical, DC electrical, and high frequency analysis.< >

关键词： Feedback loop Packaging Logic testing High speed integrated circuits Degradation Manufacturing processes Assembly systems Silicon Integrated circuit testing Mechanical sensors

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Diagnosing systems modeled with piecewise linear constraints

Diagnosing systems modeled with piecewise linear constraints

引用

International Conference on Tools for Artificial Intelligence (ICTAI)

作者： H. Beringer B. De Backer IBM France Scientific Center Paris France

Most approaches to model-based diagnosis use incomplete constraint satisfaction techniques and are therefore incomplete. It is shown here how diagnostics may be considered as a general constraint satisfaction problem. Provided the system to be repaired is modeled with piecewise linear constraints on real variables, it is possible to give a clear characterization of the conflict set. Furthermore, a complete algorithm to find every conflict is described. This algorithm is an original and elegant solution to the diagnostic problem. Moreover, it can be used in order to build a compiled form of the initial model. Once this compiled model has been obtained, all the possible faults of a given system can be identified quite easily.< >

关键词： Piecewise linear techniques Programmable control Integrated circuit modeling Resistors Circuit faults Engines electronic circuits Algorithm design and analysis Analog circuits electronic components

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All-silicon plate wave oscillator system for sensor applications

All-silicon plate wave oscillator system for sensor applicat...

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ieee symposium (IUS) Ultrasonics

作者： M.J. Vellekoop A. van Rhijn G.W. Lubking A. Venema Faculty of Electrical Engineering/ Xensor Integration bv Delft University of Technnology Delft Netherlands Faculty of Electrical Engineering Delft University of Technnology USA

The authors present the design and realization of an all-silicon acoustic plate wave oscillator system for sensor applications. The plate wave device and the electronic circuitry have been fabricated in two separate silicon chips. The plate wave device embodies a silicon membrane covered with piezoelectric zinc oxide. For protection of the zinc oxide, a thin silicon nitride layer is deposited on top.< >

关键词： Oscillators Sensor systems and applications Silicon Acoustic sensors Zinc oxide Acoustic applications Acoustic devices Acoustic waves circuits Biomembranes

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design of FIR sampled-data filters for data transmission

Design of FIR sampled-data filters for data transmission

引用

ieee International symposium on circuits and systems (ISCAS)

作者： H. Baher M. O'Malley Electrical Engineering Department Worcester Polytechnic Institute Worcester MA USA Depertment of Electronic & Electrical Engineering University College Dublin Ireland

A technique is presented for the design of finite-duration-impulse-response (FIR) sampled-data filters which can be used for data transmission as Nyquist channel filters. The filters have zero intersymbol interference in the time domain, as well as linear phase and arbitrary attenuation characteristics in the frequency domain. Compared with more elaborate optimization techniques, the proposed method gives an optimum solution, and it has a number of advantages and features. In the critical case of two samples per baud interval, the resulting filter amplitude response has a remarkable property: if the frequencies of perfect transmission in the passband are specified (or obtained), than, in the Omega -domain, the method results automatically in an equal number of zeros of transmission in the stop band, whose values are the inverses of those at which perfect transmission occurs. This property is akin to that of elliptic filters and is inherent in this special case of the design method.< >

关键词： Finite impulse response filter Data communication Band pass filters Nonlinear filters Intersymbol interference Attenuation Frequency domain analysis Optimization methods Passband Filtering theory

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On exponential fitting for circuit simulation

On exponential fitting for circuit simulation

引用

ieee International symposium on circuits and systems (ISCAS)

作者： H.C. Neto L.M. Silveira J.K. White L.M. Vidigal Dept. of Electr. Eng. & Comput. Sci. MIT Cambridge MA USA Research Laboratory of Electronics Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology Cambridge MA USA INESC-Instituto de Engenharis de Sistemas e Computadores Lisboa Portugal

Some of the theoretical and practical aspects of using exponential fitting for MOS digital circuit timing analysis are described. The multivariate test problem x=-Ax where A in R/sup n*n/ and is assumed to be irreducibly diagonally dominant with positive diagonals is considered, as this models the equations resulting from the way MOS circuits are treated in timing simulation programs. It is shown that for these problems, the Cinnamon exponentially fit algorithm is A-stable, and an example is given where the algorithm is XPSim is unstable. A semi-implicit version of the XPSim algorithm is described, and it is shown that this semi-implicit algorithm is A-stable. Examination of examples demonstrates that neither the stabilized XPSim algorithm nor the Cinnamon algorithm produces satisfactory results for very large timesteps. The effect of ordering on the accuracy and stability of the integration methods is also examined, and it is shown that ordering always enhances accuracy, though not significantly for large timesteps, and that the XPSim algorithm can be made more stable with a carefully chosen ordering.< >

关键词： Circuit simulation Circuit testing Timing Computational modeling Circuit stability electronic equipment testing Algorithm design and analysis Differential equations Steady-state Jacobian matrices

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