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检索条件"任意字段=IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"
4789 条 记 录,以下是4671-4680 订阅
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Parasitic Circus: On the Feasibility of Golden-Free PCB Verification
Parasitic Circus: On the Feasibility of Golden-Free PCB Veri...
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International symposium on Physical & Failure Analysis of Integrated circuits
作者: Maryam Saadat Safa Patrick Schaumont Shahin Tajik Department of Electrical and Computer Engineering Worcester Polytechnic Institute Worcester MA USA
Printed circuit boards (PCBs) are an integral part of electronic systems. Hence, verifying their physical integrity in the presence of supply chain attacks (e.g., tampering and counterfeiting) is of utmost importance.... 详细信息
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Three Subthreshold Flip-Flop Cells Characterized in 90 nm and 65 nm CMOS Technology
Three Subthreshold Flip-Flop Cells Characterized in 90 nm an...
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11th International Workshop on design and diagnostics of electronic circuits and systems (DDECS)
作者: Havard Pedersen Alstad Snorre Aunet Department of Informatics University of Oslo Oslo Norway
This paper examines three different flip-flop designs in subthreshold operation. All flip-flops are simulated in a 65 nm and 90 nm process with a supply voltage ranging from 125 mV to 1 V. Process variations are exami... 详细信息
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Development of Fast 3D Parasitic Extraction using Hierarchical Method for Integrated circuits and Packages
Development of Fast 3D Parasitic Extraction using Hierarchic...
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2008 ieee Antennas and Propagation Society International symposium (APSURSI 2008), vol.1
作者: Yang Yi Shu Yan Vivek Sarin Weiping Shi Texas A and M University College Station TX USA Synopsys Inc. Mountain View CA USA
Fast and accurate 3D parasitic extraction is very important in design and verification of very large scale integration (VLSI) circuits and electronic packages. In this paper, we review our research in the parasitic ex... 详细信息
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First tests and MonteCarlo simulations of a compton camera with Si-pad detectors and highly-segmented HPGe detectors
First tests and MonteCarlo simulations of a compton camera w...
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ieee symposium on Nuclear Science (NSS/MIC)
作者: D. Mengoni C.M. Petrache M. Fantuzi G. Ambrosi E. Fiandrini N. Dinu M. Ionica G. Prete R. Ponchia G. Bassato INFN Sezione di Perugia Perugia Italy Dipartimento di Fisica Università degli Studi di Camerino Perugia Italy INFN Sezione di Perugia Perugia Italy INFN Sezione di Perugia Università degli Studi di Perugia Perugia Italy INFN Sezione di Peugia Università degli Studi di Perugia Perugia Italy Laboratori Nazionali di Legnaro I.N.F.N. Legnaro Italy INFN Laboratori Nazionali di Legnaro Legnaro Italy
The impetuous progress of the detection systems in nuclear medicine are based on major improvements of the sensitivity of the new detector systems and on the highly-integrated low-noise associated electronics, offerin... 详细信息
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An Integrated Input Encoding and Symbolic Functional Decomposition for LUT-Based FPGAs
An Integrated Input Encoding and Symbolic Functional Decompo...
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11th International Workshop on design and diagnostics of electronic circuits and systems (DDECS)
作者: Stanislaw Deniziak Mariusz Wisniewski Department of Computer Engineering Cracow University of Technology Cracow Poland Department of Computer Science Kielce University of Technology Kielce Poland
In this paper a method for decomposition of functions with multi-valued inputs is presented. Decomposition is performed simultaneously with encoding of symbolic values. In this way an impact of input encoding on decom... 详细信息
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FS2K: A Forksheet FET Technology Library and a Study of VLSI Prediction for 2nm and Beyond
FS2K: A Forksheet FET Technology Library and a Study of VLSI...
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ieee International symposium on circuits and systems (ISCAS)
作者: Yunjeong Shin Daehyeok Park Dohun Koh Dongryul Heo Jieun Park Hyundong Lee Jongbeom Kim Hyunsoo Lee Taigon Song School of Electronic and Electrical Engineering Kyungpook National University (KNU) Daegu South Korea School of Electronics Engineering Kyungpook National University (KNU) Daegu South Korea
The semiconductor foundries are now mass-producing 3nm transistors. In this trend, many studies on 2nm node report the potential of future transistors such as forksheet FET (FSFET) from the device perspective. However... 详细信息
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A Trim-Free PVT Invariant Current Reference with 0.48% Process Inaccuracy Using VTH Tracking Approach
A Trim-Free PVT Invariant Current Reference with 0.48% Proce...
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Midwest symposium on circuits and systems (MWSCAS)
作者: Vishnu Kuncham Jalluri Ram Gopal V.S.S. Pradhith Aniketh Atmakuri Chetan Mittal Khanh M Le Zia Abbas International Institute of Information Technology Hyderabad India Analog Intelligent Design Inc. CA USA
The prevalence of MOSFETs in diverse electronic applications highlights their significance. However, the sensitivity of MOSFET threshold voltage to process variation poses a substantial challenge in achieving consiste... 详细信息
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Application-aware LCA of semiconductors: Life-cycle energy of microprocessors from high-performance 32nm CPU to ultra-low-power 130nm MCU
Application-aware LCA of semiconductors: Life-cycle energy o...
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ieee International symposium on electronics and the Environment
作者: David Bol Sarah Boyd David Dornfeld ICTEAM Institute Université catholique de Louvain Louvain-la-Neuve Belgium Laboratory for Manufacturing and Sustainability University of California Berkeley USA
The exponential growth of the semiconductor industry raises serious environmental concerns. Accurate life-cycle data are critical for both appropriate product eco-design and life-cycle analysis (LCA) of new electronic... 详细信息
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Thermal management of harsh-environment electronics
Thermal management of harsh-environment electronics
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ieee symposium on Semiconductor Thermal Measurement and Management (SEMI-THERM)
作者: M. Ohadi Jianwei Qi Smart and Small Thermal Systems Laboratory CALCE Electronics Systems and Products Center Mechanical Engineering Department University of Maryland College Park College Park MD USA
As the trend of highly integrated electronics and simultaneous miniaturization escalates to include faster processors, more functions, and higher bandwidths, electronics continue to become more compact in response to ... 详细信息
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Code Coverage Analysis using High-Level Decision Diagrams
Code Coverage Analysis using High-Level Decision Diagrams
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11th International Workshop on design and diagnostics of electronic circuits and systems (DDECS)
作者: Jaan Raik Uljana Reinsalu Raimund Ubar Maksim Jenihhin Peeter Ellervee Department of Computer Engineering Tallinn University of Technology Tallinn Estonia
The paper proposes a novel method of analyzing code coverage metrics on a system representation called High-Level Decision Diagrams (HLDD). Previous works have shown that HLDDs are an efficient model for simulation an... 详细信息
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