An interval algebraic method which can be used to solve the worst-case tolerance design problems of the electroniccircuits are presented. Since it utilizes the linear relation between the variations of branch admitta...
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An interval algebraic method which can be used to solve the worst-case tolerance design problems of the electroniccircuits are presented. Since it utilizes the linear relation between the variations of branch admittance and port voltage in current, so it can avoid the critical ″sharp″ problem of the interval arithmetic and get a simpler design formula.
An attempt is made to combine a couple of well-known concepts into a new approach to solve the biasing problem in electronic nonlinear circuitsdesign. Assume that for a particular circuit various large- and small-sig...
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An attempt is made to combine a couple of well-known concepts into a new approach to solve the biasing problem in electronic nonlinear circuitsdesign. Assume that for a particular circuit various large- and small-signal DC-requirements are specified. At the same time let there be a set of designable parameters. A description is provided of a way to obtain diagnostic information about the feasibility of the design problem as well as a procedure to compute the values of the parameter if such scheme exists.
A new algorithm for minimizing a function subject to box constraints is described. The algorithm is intended for use in a set of programs for automated and interactive design of electroniccircuits. The constrained op...
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A new algorithm for minimizing a function subject to box constraints is described. The algorithm is intended for use in a set of programs for automated and interactive design of electroniccircuits. The constrained optimization problem is treated through an active set strategy and the particular form of the constraints is exploited to simplify the manipulation of the various matrix operators. Numerical evidence is reported showing the efficiency of the algorithm in the number of function evaluations required to solve well known test problems. Finally, the user-assisted optimization of a current amplifier is presented to illustrate the capabilities of the new algorithm for interactive design.
Proceedings includes 165 papers dealing with mm-wave IC's, microwave FET's, computer-aided design and measurements, printed circuits, FET applications, six-ports, dielectric resonators, passive components and ...
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Proceedings includes 165 papers dealing with mm-wave IC's, microwave FET's, computer-aided design and measurements, printed circuits, FET applications, six-ports, dielectric resonators, passive components and networks, solid-state circuits and devices, high-power circuits and systems, ferrite applications, mm-wave solid-state devices, GaAs monolithic circuits, microwave acoustics, phased and active array techniques, low-noise techniques, biological effects and medical application, microwave field and network theory as well as guided wave optics and signal processing. Topics covered include: waveguides, antennas, amplifiers, oscillators, microstrip devices, filters, electroniccircuits including mixers and phase shifters, telecommunication lines, semiconductor devices and diodes, radar circuits, acoustic surface wave devices, radio systems, laser applications, integrated optics and spectrum analyzers. 161 papers are abstracted and indexed separately.
Consideration is given to fault isolation of linear analog circuits taking the design tolerances on the nonfaulty elements into consideration. A two-step algorithm is proposed. First, an approximate method is used whe...
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Consideration is given to fault isolation of linear analog circuits taking the design tolerances on the nonfaulty elements into consideration. A two-step algorithm is proposed. First, an approximate method is used where a linear programming technique for isolating the elements most likely to be faulty is presented. Second, a verifying method for the faulty set is presented where the algebraic invariants associated with the faulty set are constructed. Both methods can also be used individually as independent methods for fault isolation.
A new class of Monte Carlo (MC) methods for yield estimation and optimization is proposed and applied to practical problems of statistical design centering and tolerancing in nonconvex acceptability regions. The appro...
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A new class of Monte Carlo (MC) methods for yield estimation and optimization is proposed and applied to practical problems of statistical design centering and tolerancing in nonconvex acceptability regions. The approach is based on a point, segment, plane, etc. approximations to R//a. General formulae for estimators of yield and its derivatives are developed, based on the MC sampling in subspaces of R**n, and analytical or numerical integral calculations. Four algorithms utilizing the proposed approach were realized and tested on practical problems.
Authors describe a method which under reasonable assumptions can provide an efficient algorithm for design centering and yield maximization of electroniccircuits. The main restriction concerns the performance functio...
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Authors describe a method which under reasonable assumptions can provide an efficient algorithm for design centering and yield maximization of electroniccircuits. The main restriction concerns the performance functions of the circuit which is assumed to be either quasi-convex or quasi-concave functions. For this case the region of acceptability can be viewed as being the intersection of convex sets with sets whose complements are convex. The proposed algorithm replaces at each iteration these complementary convex sets by half spaces to obtain convex regions of acceptability. The feasibility of the method is illustrated in two examples.
This paper outlines a uniform approach to a broad class of layout design problems namely those in which components of subsystems have to be arranged within a rectangle and to be interconnected by conducting paths in o...
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This paper outlines a uniform approach to a broad class of layout design problems namely those in which components of subsystems have to be arranged within a rectangle and to be interconnected by conducting paths in one or more layers. Besides the concept must be amenable to constraints derived from technological, electronic or economic considerations. The ideas are fully worked out for single layer technologies.
Authors describe a method which under reasonable assumptions can provide an efficient algorithm for design centering and yield maximization of electroniccircuits. The main restriction concerns the performance functio...
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Authors describe a method which under reasonable assumptions can provide an efficient algorithm for design centering and yield maximization of electroniccircuits. The main restriction concerns the performance functions of the circuit which is assumed to be either quasi-convex or quasi-concave functions. For this case the region of acceptability can be viewed as being the intersection of convex sets with sets whose complements are convex. The proposed algorithm replaces at each iteration these complementary convex sets by half spaces to obtain convex regions of acceptability. The feasibility of the method is illustrated in two examples.
This paper outlines a uniform approach to a broad class of layout design problems namely those in which components of subsystems have to be arranged within a rectangle and to be interconnected by conducting paths in o...
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This paper outlines a uniform approach to a broad class of layout design problems namely those in which components of subsystems have to be arranged within a rectangle and to be interconnected by conducting paths in one or more layers. Besides the concept must be amenable to constraints derived from technological, electronic or economic considerations. The ideas are fully worked out for single layer technologies.
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