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检索条件"任意字段=IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"
4789 条 记 录,以下是81-90 订阅
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Establishing a new course in reconfigurable logic system design
Establishing a new course in reconfigurable logic system des...
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10th ieee International Workshop on design and diagnostics of electronic circuits and systems
作者: Torresen, Jim Norendal, Jorgen Glette, Kyrre Univ Oslo Dept Informat POB 1080 N-0316 Oslo Norway
Reconfigurable computing has grown to become important in hardware design. In autumn 2005, we taught for the first time a new course in digital system design with its main focus on FPGA technology and design using VHD... 详细信息
来源: 评论
Verifying Bio-electronic systems  26
Verifying Bio-Electronic Systems
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26th International symposium on design and diagnostics of electronic circuits and systems (DDECS)
作者: Heuer, Joseline Krenz-Baath, Rene Obermaisser, Roman Hsch Hamm Lippstadt Hamm Germany Univ Siegen Inst Embedded Syst Siegen Germany
The functional safety of implanted medical devices is of high importance. This works presents a novel concept to verify bio-electronic systems modeling the medical device in connection with the interacting biological ... 详细信息
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On Analysis of Fabricated Polymorphic circuits
On Analysis of Fabricated Polymorphic Circuits
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13th ieee symposium on design and diagnostics of electronic circuits and systems
作者: Simek, Vaclav Ruzicka, Richard Sekanina, Lukas Brno Univ Technol Fac Informat Technol Brno Czech Republic
The paper describes a reconfigurable polymorphic chip REPOMO32, experiments carried out with this chip and provides report on important experiences with regard to practical applications of digital polymorphic circuits... 详细信息
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Mixed-signal DFT for fully testable ASIC
Mixed-signal DFT for fully testable ASIC
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11th ieee International Workshop on design and diagnostics of electronic circuits and systems
作者: Reznicek, Frantisek AMI Semicond Czech SRO Brno 61900 Czech Republic
An efficient mixed-signal design strategy for test insertion standardization. The mixed-signal DFT (design For Test) strategy is built on three main linchpins: DFT and other design rules, DFT design structures and fin... 详细信息
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A leakage-based random bit generator with on-line fault detection
A leakage-based random bit generator with on-line fault dete...
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9th ieee Workshop on design and diagnostics of electronic circuits and systems
作者: Bucci, Marco Luzzi, Raimondo Infineon Technologies AG Germany
This paper presents a new, patent pending, random bit generator whose noise source exploits the leakage current in a reverse biased p-n junction. The circuit is described and a model is provided to estimate data-rate ... 详细信息
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Window Optimization of Reversible and Quantum circuits
Window Optimization of Reversible and Quantum Circuits
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13th ieee symposium on design and diagnostics of electronic circuits and systems
作者: Soeken, Mathias Wille, Robert Dueck, Gerhard W. Drechsler, Rolf Univ Bremen Inst Comp Sci D-28359 Bremen Germany Univ New Brunswick Fac Comp Sci Fredericton NB Canada
This paper considers the optimization of reversible and quantum circuits. Both represent the basis for emerging technologies e.g. in the area of quantum computation and low power design. An approach called window opti... 详细信息
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The design of Dependable Flexible Multi-Sensory System-on-Chips for Security Applications
The Design of Dependable Flexible Multi-Sensory System-on-Ch...
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ieee 15th International symposium on design and diagnostics of electronic circuits and systems (DDECS)
作者: Kerkhoff, Hans G. Zhao, Yong Univ Twente Ctr Telemat & Informat Technol CTIT Testable Design & Test Integrated Syst TDT Grp NL-7500 AE Enschede Netherlands
a new approach towards highly reconfigurable SoCs for data-streaming multi-sensory systems is presented. As the applications are in the security arena, a very high degree of dependability should be guaranteed. For thi... 详细信息
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Proton Beam Characterization at Oslo Cyclotron Laboratory for Radiation Testing of electronic Devices
Proton Beam Characterization at Oslo Cyclotron Laboratory fo...
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ieee 16th International symposium on design and diagnostics of electronic circuits and systems (DDECS)
作者: Hasanbegovic, Amir Aunet, Snorre Univ Oslo Dept Informat PB 1080 Blindern N-0316 Oslo Norway Dept Elect & Telecommun N-7491 Trondheim Norway
Proton beam characterization was performed at the Oslo Cyclotron Laboratory (OCL) in order to evaluate the beam properties and asses its usability for radiation testing of electronic devices. The characterization was ... 详细信息
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Architecture design for the Context Formatter in the H.264/AVC Encoder
Architecture Design for the Context Formatter in the H.264/A...
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9th ieee Workshop on design and diagnostics of electronic circuits and systems
作者: Pastuszak, Grzegorz Warsaw Univ Technol Inst Radioelect Warsaw Poland
Hardware accelerators for H.264/AVC using arithmetic coding require special approaches to achieve high throughputs. This paper proposes an efficient architecture for the context formatter that is a part of the H.264/A... 详细信息
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Automated Debugging from Pre-Silicon to Post-Silicon
Automated Debugging from Pre-Silicon to Post-Silicon
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ieee 15th International symposium on design and diagnostics of electronic circuits and systems (DDECS)
作者: Dehbashi, Mehdi Fey, Goerschwin Univ Bremen Inst Comp Sci D-28359 Bremen Germany
Due to the increasing design size and complexity of modern Integrated circuits (IC) and the decreasing time-to-market, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a gener... 详细信息
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