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High-speed VLSI design of the LZ-based data compression

High-speed VLSI design of the LZ-based data compression

引用

ieee International symposium on Circuits and Systems (ISCAS)

作者： Chun-Te Chen Liang-Gee Cheni Ta-Hwa College of Commerce and Technology Hsinchu Taiwan National Taiwan University Taipei Taiwan

In this paper, a high-speed VLSI design of the LZ-based data compression is presented. The proposed block processing architecture provides 100 percent hardware utilization and a shorter cycle time for searching the maximum matching strings. A systematic method to find the sharing substructure among the block structures is also proposed. With this systematic method, it can shrink the final area requirement on a single chip for on-line data compression. Hence, the proposed design is more area-efficient than the previous systolic designs.

关键词： Very large scale integration data compression Dictionaries Hardware Signal design Pipelines Encoding Algorithm design and analysis Buffer storage

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Parallel implementation of a fast third-order Volterra digital filter

Parallel implementation of a fast third-order Volterra digit...

引用

ieee International symposium on Circuits and Systems (ISCAS)

作者： H. Kwan Sungbin Im E.J. Powers E.E. Swartzlander Trimble Navigation System Austin TX USA Departmentartment of Information and Telecommunications Engineering Soongsil University Seoul South Korea Department of Electrical & Computer Engineering University of Texas Austin Austin TX USA

This paper presents the parallel implementation of a fast third-order Volterra digital filtering algorithm. Our platform is an ATT DSP-3 parallel processor. Speed-up results indicate that our implementation exhibits high performance and suitability for large data sizes. An application to nonlinear communication channel equalization is presented.

关键词： Digital filters Convolution Kernel Frequency domain analysis Multidimensional systems Nonlinear filters Filtering Digital signal processing chips Very large scale integration Power engineering and energy

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Microsystems for multi-sensory data-acquisition

Microsystems for multi-sensory data-acquisition

引用

ieee International symposium on Industrial Electronics (ISIE)

作者： R.F. Wolffenbuttel Department of Electrical Engineering Laboratory for Electronic Instrumentation Delft University of Technnology Delft Netherlands

data acquisition systems containing transducers, analog readout circuits and digital data processing capability having dimensions comparable to conventional silicon VLSI are feasible in silicon. The on-chip integration of these functions has been demonstrated and is a sound concept for the fabrication of an integrated silicon smart sensor for a single parameter. However, the complexity and data processing required in a data acquisition system for several quantities makes the concept, although technologically feasible, not economically viable. Partitioning of the various system functions over several dies and applying wafer-to-wafer bonding or using the multi-chip module is a more economically viable approach. Enhanced functionality can be obtained by using an active silicon platform as the substrate that contains all the infrastructural functions common to any instrument, such as power/thermal management, self-test and self-calibration and a local bus. In integrated chemical analysis systems, the additional advantage would be the slightly reduced packaging problem.

关键词： Silicon data acquisition data processing Power generation economics Thermal management Acoustic transducers Circuits Very large scale integration Fabrication Intelligent sensors

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analysis of defect to yield correlation on memories: method, algorithms and limits

Analysis of defect to yield correlation on memories: method,...

引用

ieee International symposium on Defect and Fault Tolerance in VLSI Systems

作者： P. Bichebois P. Mathery Centre Commun CNET-SGS-Thomson Crolles France

Memory circuits are excellent vehicles for yield enhancement of a process technology for VLSI products. A method was developed which consists of correlating the physical defects detected by in-line inspections with the electrical failures. In this method, two types of errors can affect results. A model is proposed in order to estimate and minimize the number of errors. The defect-yield correlation on memories indicates the priority problems responsible for yield loss. Nevertheless, the contribution of the killer defects detected by in-line inspections to yield loss has to be verified. New algorithms are proposed to provide this data that is often missing in yield management systems.

关键词： Algorithm design and analysis Circuits Vehicles Very large scale integration Optical feedback Optical microscopy Testing Random access memory Automatic optical inspection Electron optics

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Non-uniform beam filling correction for spaceborne rain radar measurement: a simulation study using shipborne radar data over tropical Pacific

Non-uniform beam filling correction for spaceborne rain rada...

引用

ieee International symposium on Geoscience and Remote Sensing (IGARSS)

作者： T. Kozu T. Iguchi Communications Research Laboratories Koganei Tokyo Japan

A method to correct spaceborne rain radar measurement for non-uniform beam filling (NUBF) is studied using a shipborne radar data set over the tropical Pacific. Statistical analyses are made on spatial variabilities of rain rate. The result is reflected in estimating the variability in a radar IFOV which is then used to obtain a NUBF correction factor. Results indicate the usefulness of this method for reducing bias error in rain rate estimation.

关键词： Filling Spaceborne radar Rain Radar measurements Autocorrelation large-scale systems Frequency Regression analysis Attenuation Directive antennas

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Elecdra: a rule-based circuit analyzer for custom VLSI design

Elecdra: a rule-based circuit analyzer for custom VLSI desig...

引用

ieee International symposium on Circuits and Systems (ISCAS)

作者： K.N. Lam L-Logic Design Group Sunnyvale CA USA

This paper presents procedures that verify custom CMOS/BiCMOS VLSI circuits for their compliance to a given set of pre-defined rules or design styles. Predefined rules range from simple connectivity and sizing rules to specific circuit topologies ensuring acceptable circuit speed, reliability, and signal integrity. Our compliance checker, Elecdra, operates on transistor-level circuit netlists, which may contain back-annotated parasitics. Custom VLSI microprocessors with over 3 million devices have been successfully verified by Elecdra at the full-chip level.

关键词： Circuit analysis Very large scale integration BiCMOS integrated circuits Microprocessors Design methodology Runtime Circuit topology Coupling circuits Calculus data structures

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Antarctic surface temperatures using satellite infrared data from 1979 through 1995

Antarctic surface temperatures using satellite infrared data...

引用

ieee International symposium on Geoscience and Remote Sensing (IGARSS)

作者： J.C. Comiso L. Stock Laboratory for Hydrospheric Processes NASA Goddard Space Flight Center Greenbelt MD USA

The large scale spatial and temporal variations of surface ice temperature over the Antarctic region are studied using infrared data derived from the Nimbus-7 Temperature Humidity Infrared Radiometer (THIR) from 1979 through 1985 and from the NOAA Advanced Very High Resolution Radiometer (AVHRR) from 1984 through 1995. Enhanced techniques suitable for the polar regions for cloud masking and atmospheric correction were used before converting radiances to surface temperatures. The observed spatial distribution of surface temperature is highly correlated with surface ice sheet topography and agrees well with ice station temperatures with 2 K to 4 K standard deviations. The average surface ice temperature over the entire continent fluctuates by about 30 K from summer to winter while that over the Antarctic Plateau varies by about 45 K. Interannual fluctuations of the coldest temperatures are observed to be as large as 15 K. Also, the interannual variations in surface temperatures are highest at the Antarctic Plateau and the ice shelves (e.g., Ross and Ronne) with a periodic cycle of about 5 years and standard deviations of about 11 K and 9 K, respectively. Despite large temporal variability, however, especially in some regions, a regression analysis that includes removal of the seasonal cycle shows no apparent trend in temperature during the period 1979 through 1995.

关键词： Antarctica Surface topography Ice surface Radiometry Temperature distribution Satellite broadcasting large-scale systems Humidity Spatial resolution Clouds

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Test program development in VLSI testing

Test program development in VLSI testing

引用

ieee International symposium on Circuits and Systems (ISCAS)

作者： M.W.T. Wong K.T. Cheung Department of Electronic Engineering Hong Kong Polytechnic University Kowloon Hong Kong China Motorola Semiconductors Hong Kong Limited

This paper describes how an automatic test program generation environment is developed by making use of the Summit Design's TDS software modules as the basic building blocks. A new design-to-test process flow is defined. A solution of eliminating conversion errors of simulation post-processing is also proposed. In this approach, a functional test program can be generated within minutes, which dramatically shortens the test program development time and gets a new product faster to market.

关键词： Very large scale integration Automatic testing Automatic test pattern generation Analytical models databases data analysis Software testing Software design Intrusion detection Process design

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DVD players using a Viterbi decoding circuit

DVD players using a Viterbi decoding circuit

引用

ieee International symposium on Consumer Electronics (ISCE)

作者： H. Hayashi H. Kobayashi M. Umezawa S. Hosaka H. Hirano Optical Disc Systems Department Corporate Research and Development Laboratories Pioneer Electronic Corporation Tsurugashima Saitama Japan Development Department ll Tokorozawa Plant Pioneer Electronic Corporation Tokorozawa Saitama Japan

We have developed a Viterbi decoding circuit which is suitable for DVD players. We designed it to be compact and efficient by utilizing the rule of the DVD recording code. By experiment, we confirmed that the Viterbi decoder reproduced digital data more precisely than a conventional bit-by-bit decoder. Thereby it improves the reliability of the DVD players. It was integrated into a data processing LSI which restores digital data streams recorded on the DVD. By employing this LSI, we have developed DVD video players, DVD-ROM drives, DVD-recordable drives, and DVD car navigation systems. We applied the Viterbi decoding to home-use optical disc players for the first time.

关键词： DVD Viterbi algorithm Decoding Circuits Optical recording Optical crosstalk large scale integration data processing Signal restoration Error analysis

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Experimental fault analysis of 1 Mb SRAM chips

Experimental fault analysis of 1 Mb SRAM chips

引用

VLSI Test symposium

作者： H. Goto S. Nakamura K. Iwasaki Faculty of Engineering Chiba University Japan Faculty of Engineering Tokyo Metropolitan University Japan

Analyzing 1,000 faulty 1 Mb SRAM chips that were randomly selected from a single manufacture, we found 251 stuck-at cell faults, 5 stuck-at bit-line faults, 1 stuck-at word-line fault, 46 neighborhood-pattern-sensitive faults, and other kinds of faults. Under the condition that I/sub dd/=4.5 I; temperature=70/spl deg/C, and load capacity C/sub L/=30 pF, we detected margin faults in 460 chips. Because the actual fault data for SRAM chips is rarely reported, the data in this manuscript are very useful and should be of practical importance.

关键词： SRAM chips Testing Random access memory Decoding Fault detection data engineering Application specific integrated circuits Temperature Very large scale integration Cache memory

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