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检索条件"任意字段=IEEE-Computer-Society Conference on Computer Vision and Pattern Recognition Workshops"
8963 条 记 录,以下是1541-1550 订阅
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Spatial-Angular Multi-Scale Mechanism for Light Field Spatial Super-Resolution
Spatial-Angular Multi-Scale Mechanism for Light Field Spatia...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Chen Gao Youfang Lin Song Chang Shuo Zhang Beijing Key Lab of Traffic Data Analysis and Mining School of Computer and Information Technology Beijing Jiaotong University
Light Field (LF) cameras are promising due to their ability to capture both spatial and angular information of scenes. However, the trade-off between spatial and angular resolution significantly limits the real-world ...
来源: 评论
An Effective Ensemble Learning Framework for Affective Behaviour Analysis
An Effective Ensemble Learning Framework for Affective Behav...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Wei Zhang Feng Qiu Chen Liu Lincheng Li Heming Du Tianchen Guo Xin Yu Netease Fuxi AI Lab The University of Queensland
Affective Behavior Analysis aims to facilitate technology emotionally smart, creating a world where devices can understand and react to our emotions as humans do. To comprehensively evaluate the authenticity and appli... 详细信息
来源: 评论
Back to the Feature: Classical 3D Features are (Almost) All You Need for 3D Anomaly Detection
Back to the Feature: Classical 3D Features are (Almost) All ...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Eliahu Horwitz Yedid Hoshen School of Computer Science and Engineering The Hebrew University of Jerusalem Israel
Despite significant advances in image anomaly detection and segmentation, few methods use 3D information. We utilize a recently introduced 3D anomaly detection dataset to evaluate whether or not using 3D information i...
来源: 评论
Calibrating Higher-Order Statistics for Few-Shot Class-Incremental Learning with Pre-trained vision Transformers
Calibrating Higher-Order Statistics for Few-Shot Class-Incre...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Dipam Goswami Bartłomiej Twardowski Joost Van de Weijer Department of Computer Science Universitat Autònoma de Barcelona Computer Vision Center Barcelona IDEAS-NCBR
Few-shot class-incremental learning (FSCIL) aims to adapt the model to new classes from very few data (5 samples) without forgetting the previously learned classes. Recent works in many-shot CIL (MSCIL) (using all ava... 详细信息
来源: 评论
DiffLight: Integrating Content and Detail for Low-light Image Enhancement
DiffLight: Integrating Content and Detail for Low-light Imag...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Yixu Feng Shuo Hou Haotian Lin Yu Zhu Peng Wu Wei Dong Jinqiu Sun Qingsen Yan Yanning Zhang Northwestern Polytechnical University Xi’an University of Architecture and Technology
The Low Light Image Enhancement (LLIE) task has been a hotspot in low-level computer vision research. The camera sensor can only capture a small amount of ambient light signal in low-light condition, resulting in sign... 详细信息
来源: 评论
Virtually Enriched NYU Depth V2 Dataset for Monocular Depth Estimation: Do We Need Artificial Augmentation?
Virtually Enriched NYU Depth V2 Dataset for Monocular Depth ...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Dmitry Ignatov Andrey Ignatov Radu Timofte Computer Vision Lab CAIDAS & IFI University of Wurzburg Germany Computer Vision Lab ETH Zurich Switzerland
We present ANYU, a new virtually augmented version of the NYU depth v2 dataset, designed for monocular depth estimation. In contrast to the well-known approach where full 3D scenes of a virtual world are utilized to g... 详细信息
来源: 评论
Uncovering the Hidden Cost of Model Compression
Uncovering the Hidden Cost of Model Compression
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Diganta Misra Muawiz Chaudhary Agam Goyal Bharat Runwal Pin Yu Chen Carnegie Mellon University Landskape AI Mila - Quebec AI Institute Concordia University University of Wisconsin-Madison Mila - Quebec AI Institute IBM Research
In an age dominated by resource-intensive foundation models, the ability to efficiently adapt to downstream tasks is crucial. Visual Prompting (VP), drawing inspiration from the prompting techniques employed in Large ... 详细信息
来源: 评论
HyperStyle: StyleGAN Inversion with HyperNetworks for Real Image Editing
HyperStyle: StyleGAN Inversion with HyperNetworks for Real I...
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2022 ieee/CVF conference on computer vision and pattern recognition, CVPR 2022
作者: Alaluf, Yuval Tov, Omer Mokady, Ron Gal, Rinon Bermano, Amit Blavatnik School of Computer Science Tel Aviv University Israel
The inversion of real images into StyleGAN's latent space is a well-studied problem. Nevertheless, applying existing approaches to real-world scenarios remains an open challenge, due to an inherent trade-off betwe... 详细信息
来源: 评论
BeCAPTCHA-Type: Biometric Keystroke Data Generation for Improved Bot Detection
BeCAPTCHA-Type: Biometric Keystroke Data Generation for Impr...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Daniel DeAlcala Aythami Morales Ruben Tolosana Alejandro Acien Julian Fierrez Santiago Hernandez Miguel A. Ferrer Moises Diaz Biometrics and Data Pattern Analytics Lab Universidad Autonoma de Madrid Spain University Las Palmas Gran Canaria Spain
This work proposes a data driven learning model for the synthesis of keystroke biometric data. The proposed method is compared with two statistical approaches based on Universal and User-dependent models. These approa...
来源: 评论
Unsupervised Automatic Defect Inspection based on Image Matching and Local One-class Classification
Unsupervised Automatic Defect Inspection based on Image Matc...
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ieee computer society conference on computer vision and pattern recognition workshops (CVPRW)
作者: Chengkan Lv Zhengtao Zhang Fei Shen Feng Zhang Institute of Automation Chinese Academy of Sciences Beijing China The School of Artificial Intelligence University of Chinese Academy of Sciences Beijing China CASI Vision Technology Co. Ltd. Luoyang China
In this paper, an unsupervised defect inspection method based on anomaly detection is proposed to inspect various kinds of surface defects in the field of industrial production. This method consists of two modules: (i...
来源: 评论