This paper presents a versatile chip set that can realize signal/imageprocessingalgorithms used in several important imageprocessing applications, including template-processing, spatial filtering and image scaling....
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A large number of remote sensing studies in the Netherlands are performed using airborne sensors. At the present moment, a multitude of different sensors are available, covering a wide variety of application purposes....
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In state-of-the-art research, the difficult task of image understanding by computer can be organized as a hierarchy of algorithms applied to image data at low, mid, and high levels of processing. This paper discusses ...
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In numerous computer vision applications, there is both the need and the ability to access multiple types of information about the three dimensional aspects of objects or surfaces. When this information comes from dif...
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Some problems of digital imageprocessing are considered in the paper. Main attention is paid to effective statistical processing of observations obtained thereby. Statistical invariant coupling method which is the ba...
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ISBN:
(纸本)0892524677
Some problems of digital imageprocessing are considered in the paper. Main attention is paid to effective statistical processing of observations obtained thereby. Statistical invariant coupling method which is the basis for constructing synthesis of effective decision algorithms is used for the purpose. Optimum sampling procedures are also discussed. The results are presented as components of the single algorithm for determining homogeneous regions boundaries in the composite picture which provides determination of the closed boundaries.
The authors have developed pattern inspection techniques for Integrated Circuit elements which use an SEM (Scanning Electron Microscope). In this paper we discuss the transformation of low S/N ratio SEM image signals ...
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ISBN:
(纸本)0892524677
The authors have developed pattern inspection techniques for Integrated Circuit elements which use an SEM (Scanning Electron Microscope). In this paper we discuss the transformation of low S/N ratio SEM image signals into binary values, detection techniques using the SEM to detect patterns on insulating materials, and detection algorithms for defects.
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