检索结果-内蒙古大学图书馆

您好，读者！请登录

内蒙古大学图书馆

首页
概况
党建
资源
服务
科研支持
- 论文收录引用证明
- 科技查新
知识产权
档案馆
帮助

咨询与建议

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

您的常用邮箱：*

您的手机号码：*

问题描述：

当前已输入0个字，您还可以输入200个字

全部搜索
期刊论文
图书
学位论文
标准
纸本馆藏
外文资源发现
数据库导航
超星发现

高级检索

时间限定

出版年份：

文献类型

图书期刊文献学位论文多媒体

馆藏选择

电子馆藏纸本馆藏

核心期刊

全部期刊 SCI 收录期刊 SSCI 收录期刊 EI 收录期刊 CSCD 收录期刊 CSSCI 收录期刊

语言

中文英文

文献类型

期刊文献图书学位论文标准纸本馆藏

帮助

文字说明：

T=题名（书名、题名），A=作者（责任者），K=主题词，P=出版物名称，PU=出版社名称，O=机构（作者单位、学位授予单位、专利申请人），L=中图分类号，C=学科分类号，U=全部字段，Y=年（出版发行年、学位年度、标准发布年）

检索规则说明：

AND代表“并且”；OR代表“或者”；NOT代表“不包含”；(注意必须大写,运算符两边需空一格)

检索范例：

范例一：(K=图书馆学 OR K=情报学) AND A=范并思 AND Y=1982-2016
范例二：P=计算机应用与软件 AND (U=C++ OR U=Basic) NOT K=Visual AND Y=2011-2016

分类表

所选分类

>> <<

限定检索结果

文献类型

261 篇 会议
11 篇 期刊文献

馆藏范围

272 篇 电子文献
0 种 纸本馆藏

日期分布

学科分类号

180 篇 工学
- 76 篇 电气工程
- 68 篇 计算机科学与技术...
- 40 篇 软件工程
- 29 篇 电子科学与技术（可...
- 28 篇 控制科学与工程
- 22 篇 机械工程
- 19 篇 动力工程及工程热...
- 18 篇 材料科学与工程（可...
- 17 篇 化学工程与技术
- 15 篇 信息与通信工程
- 14 篇 仪器科学与技术
- 12 篇 力学（可授工学、理...
- 12 篇 核科学与技术
- 10 篇 土木工程
- 10 篇 石油与天然气工程
- 7 篇 冶金工程
- 7 篇 安全科学与工程
- 6 篇 航空宇航科学与技...
- 5 篇 交通运输工程
- 4 篇 建筑学
61 篇 理学
- 29 篇 物理学
- 24 篇 数学
- 14 篇 化学
- 12 篇 统计学（可授理学、...
- 4 篇 生物学
16 篇 管理学
- 16 篇 管理科学与工程(可...
- 11 篇 工商管理
7 篇 医学
- 7 篇 临床医学
6 篇 经济学
- 6 篇 应用经济学
3 篇 教育学
2 篇 法学
1 篇 农学

主题

14 篇 circuit testing
12 篇 circuit faults
11 篇 europe
8 篇 software testing
8 篇 system testing
8 篇 built-in self-te...
7 篇 automatic test p...
6 篇 automation
6 篇 automatic testin...
6 篇 testing
5 篇 test pattern gen...
5 篇 computational mo...
5 篇 fault detection
4 篇 registers
4 篇 very large scale...
4 篇 design engineeri...
4 篇 control systems
4 篇 clocks
4 篇 built-in self te...
4 篇 hardware

机构

2 篇 nanjing universi...
2 篇 univ edinburgh i...
2 篇 inria lille - no...
2 篇 warsaw universit...
2 篇 siemens gamesa r...
2 篇 politecnico di t...
2 篇 siemens gamesa r...
2 篇 dtu wind and ene...
2 篇 vekia lille
2 篇 univ elect sci &...
2 篇 school of reliab...
2 篇 oarai higashi-ib...
2 篇 royal inst techn...
1 篇 mentor poznan
1 篇 dfki gmbh cyber ...
1 篇 toshiba europe l...
1 篇 univ tubingen re...
1 篇 kyoto univ sakyo...
1 篇 department of co...
1 篇 ehime univ dept ...

作者

3 篇 walton a. j.
3 篇 stevenson j. t. ...
3 篇 smith s.
2 篇 umehara m.
2 篇 kubota masanori
2 篇 wang junshi
2 篇 takada shoji
2 篇 jiang shuyan
2 篇 dreyer thomas
2 篇 ebrahimi masoume...
2 篇 qiu qinru
2 篇 s. ishiyama
2 篇 chittimalli pava...
2 篇 ling xieting
2 篇 atienza david
2 篇 yamaguchi t.
2 篇 mita yoshio
2 篇 neshati mohsen
2 篇 k. kishida
2 篇 t. hayashi

语言

270 篇 英文
2 篇 其他

检索条件"任意字段=Proceedings of the 23rd Conference on Design, Automation and Test in Europe"

共 272 条记录，以下是21-30 订阅

全选清除本页清除全部题录导出标记到"检索档案"

详细简洁

排序：

An Embedded Process Monitor test Chip Architecture

An Embedded Process Monitor Test Chip Architecture

引用

IEEE 23rd International conference on Microelectronic test Structures (ICMTS)

作者： Idgunji, Sachin Chandra, Vikas Pietrzyk, Cezary Iqbal, Imran Aitken, Rob Yeric, Greg ARM Res & Dev San Jose CA USA ARM Res & Dev Austin TX USA

We present a test chip architecture which embeds a thorough set of process characterization ring oscillators into a synthesized digital circuit, such as a processor core. We discuss the motivation, implementation, and... 详细信息

ISBN: (纸本)9781424469154

关键词： Semiconductor Device Measurements Semiconductor Device testing design for testability Yield Optimization

来源：评论

学校读者我要写书评

暂无评论

Towards Flexible and Automated testing in Production Systems Engineering Projects 23

Towards Flexible and Automated Testing in Production Systems...

引用

23rd IEEE International conference on Emerging Technologies and Factory automation (ETFA)

作者： Winkler, Dietmar Meixner, Kristof Biffl, Stefan Tech Univ Wien Christian Doppler Lab Secur & Qual Improvement Pr Vienna Austria Tech Univ Wien Inst Informat Syst Engn Informat & Software Engn Vienna Austria

ISBN: (纸本)9781538671085

Automated and systematic testing of automation systems (AS) and production systems (PS) require an integrated testing tool chain for test case development, execution and reporting. In practice, the test automation tool chain cannot be fully automated because of missing links between different tools used in the test automation process. Closing these gaps typically require (high) human effort. Furthermore, domain and software testing expertise is often bundled by one (expensive) engineer who is responsible for the application domain (reflected in use cases and test cases) and software tests (software test code). This paper presents a flexible testing automation Framework (TAF) that enables the configuration of test processes involving different tools and various layers for test automation and enables separated roles for the application domain and software tests. We build on best-practice test automation from Software Engineering and design a test automation process for the automation systems domain. We demonstrate the feasibility with a use case, derived from production systems automation, with selected tools covering all test automation layers. First results showed the feasibility of the framework in the evaluation use case making test processes more flexible and automated. Although the successful implementation of the TAF can support the efficient configuration and execution of test processes, there is additional effort for preparing the flexible and automated tool chain.

关键词： software and system testing test automation framework automation systems production systems test configuration feasibility study

来源：评论

学校读者我要写书评

暂无评论

X -Tolerant Logic BIST for Automotive designs using Observation Scan Technology 37

X -Tolerant Logic BIST for Automotive Designs using Observat...

引用

37th International conference on VLSI design (VLSID) / 23rd International conference on Embedded Systems (ES)

作者： Harith, Ashrith S. Liu, Yingdi Mukherjee, Nilanjan Mayer, Jeff Siemens Digital Ind Software Wilsonville OR 97070 USA

ISBN: (纸本)9798350384406

Due to recent trends and rapid automation, the percentage of electronics in automobiles has grown at a rapid pace. This includes complex safety critical components, such as Advanced Driver Assistance Systems (ADAS) and Autonomous Driving Systems. Functional safety standards are designed to assure high quality and long-term reliability of electronic components that are deployed in automobiles. There exist numerous industry solutions for automotive testing involving both functional and structural techniques Logic BIST (LBIST) being a popular one. However, LBIST is sensitive to unknown states (X), which predominantly arise due to uninitialized sequential elements in the design or paths failing timing closure. This paper proposes a scheme for X tolerance based on static chain masking. The objective of this paper is to describe a methodology to optimize pattern count (test time) by integrating LBIST Observation Scan Technology (OST) with traditional static chain masking. OST test points are special type of observe points that capture circuit responses during the shift cycles. The proposed solution involves running LBIST in two phases exploiting OST for pattern reduction and static chain masking for containing unknowns. Experiments run on contemporary automotive designs and results reported herein show remarkable improvement in test time when compared to traditional X tolerance schemes for LBIST based designs.

关键词： built-in self-test (BIST) Observation Scan Technology (OST) embedded-test functional safety scan -bused testing test application time test points

来源：评论

学校读者我要写书评

暂无评论

Genetic Algorithm Based Efficient Grouping Technique for Post Bond test and Crosstalk Faults Among TSVs 37

Genetic Algorithm Based Efficient Grouping Technique for Pos...

引用

37th International conference on VLSI design (VLSID) / 23rd International conference on Embedded Systems (ES)

作者： Kaibartta, Tanusree Arora, Hitarth Das, Debesh Kumar IITISM Comp Sci & Engn Dhanbad Bihar India Jadavpur Univ Comp Sci & Engn Kolkata India

ISBN: (纸本)9798350384406

Through-silicon-via (TSV) is considered as a critical component in 3D integration that extends Moore's Law. Efficient testing for correct operation of TSVs is essential for 3D integrated circuit design. In this paper we address the post bond test and diagnosis of crosstalk faults among TSVs considering different impact ranges, and propose Genetic Algorithm based TSV grouping method for TSV placements such that as many TSVs as possible are tested simultaneously.

关键词： TSV 3D Genetic Algorithm Crosstalk faults

来源：评论

学校读者我要写书评

暂无评论

ADC test Methods using an impure Stimulus: a Survey 23

ADC Test Methods using an impure Stimulus: a Survey

引用

23rd IEEE european test Symposium (ETS)

作者： Schat, Jan NXP Semicond Hamburg Germany

ISBN: (纸本)9781538637289

testing high-resolution ADCs with impure test signals can be done by applying first the original test signal to the ADC, and then the same signal with a DC offset. The two output data sets then have a lot of redundancy that can be used to calculate the ADC's performance parameters, e.g. INL and DNL. While there are a number of algorithms and proposals to perform such tests, they are until now only very rarely used by ATE vendors or ADC IP suppliers. This is astonishing since they can substantially reduce production test costs with little effort. This paper summarizes the state-of-the-art of the different methods, depicts their possibilities and drawbacks, and tries to answer why all of these methods are so far from being widely used.

关键词： ADC test integral non-linearity (INL) linearity test stimulus error identification and removal (SEIR)

来源：评论

学校读者我要写书评

暂无评论

A method of optimization selecting test points by inverse process 23

A method of optimization selecting test points by inverse pr...

引用

23rd ISSAT International conference on Reliability and Quality in design 2017

作者： Hou, Wenkui Zhang, Zhiming School of Reliability and System Engineering Beihang University Beijing China

ISBN: (纸本)9780991057641

With the complexity of the structure of electronic products, testability design has been widely concerned. In the testability design, the selection of test points is an important part of the testability design. Based on the in-depth study of selecting of test points, a method of test points optimization based on D matrix analysis by inverse process is proposed. In this method, the relationship between the number of isolated faults and the number of test points and the correlation matrix of fault and testability is deduced, inverse process selection method is proposed. The usability of the method is proved by comparing with the application of other intelligent algorithm at the test point selection.

关键词： Product design

来源：评论

学校读者我要写书评

暂无评论

Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for test Data Compression with Run Length Based Codes

Hamming Distance Based Reordering and Columnwise Bit Stuffin...

引用

23rd International conference on VLSI design/9th International conference on Embedded Systems

作者： Mehta, Usha S. Dasgupta, Kankar S. Devashrayee, Niranjan M. Nirma Univ Ahmedabad Inst Technol Ahmadabad Gujarat India ISRO Space Applicat Ctr Ahmadabad Gujarat India

ISBN: (纸本)9781424455416

Because of increased design complexity and advanced fabrication technologies, the number of tests and corresponding data volume increases rapidly As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed in past. Run Length Coding is one of the most familiar coding methodologies for compression In this paper, we present a new scheme named Hamming Distance Based Reordering and Column wise Bit Stuffing with Difference Vector (HDR-CBS-DV), which can be used with any run length based code technique for better compression ratio Four techniques have been applied in this scheme Selection of first vector, Hamming Distance Based Reordering, Columnwise Bit Stuffing and Difference Vector Instead of directly applying any known run length code like Golomb, Frequency Directed Run Length (FDR), Extended FDR (EFDR), Modified FDR (MDFR) or Shifted Alternate FDR (SAFDR) to given test set, if we apply the proposed scheme to test set prior to applying the run length base code, the compression obtained is improved drastically The experimental results on ISCAS89 Benchmark circuits shows that the test data compression ratio improves significantly for each case It is also noteworthy that in most of the case, this scheme does not involve any extra silicon area over-head compared to the base code with which it used For few cases, it requires an extra XOR gate and feedback path only The proposed scheme can be easily integrated into the existing industrial flow

关键词： test Data Compression Run Length Codes Golomb Codes Hamming Distance Bit Stuffing Difference Vector

来源：评论

学校读者我要写书评

暂无评论

Sense Amplifier Offset Characterisation and test Implications for Low-Voltage SRAMs in 65 nm 23

Sense Amplifier Offset Characterisation and Test Implication...

引用

23rd IEEE european test Symposium (ETS)

作者： Patel, Dhruv Wright, Derek Sachdev, Manoj Univ Waterloo Dept Elect & Comp Engn Waterloo ON N2L 3G1 Canada Univ Toronto Dept Elect & Comp Engn Toronto ON M5S 3G4 Canada

ISBN: (纸本)9781538637289

Variability in offset voltage, bitcell transistor conductance, and leakage currents can lead to marginal and intermittent failures in low-voltage SRAMs. In this paper, we develop a model of these marginal faults that includes such sense amplifier and bitcell variability. Using simulations and measurement data from a 65 nm test chip, we investigate the likelihood of these failures and propose how to stimulate their occurrence during testing.

关键词： SRAM Sense Amplifier Offset Voltage test Algorithms Threshold Voltage Mismatch Weak Cell Fault

来源：评论

学校读者我要写书评

暂无评论

Recap of the 23rd Asia and South Pacific design automation conference (ASP-DAC)

Recap of the 23rd Asia and South Pacific Design Automation C...

引用

作者： Shin, Youngsoo KAIST Korea Republic of

The 23rd Asia and South Pacific design automation conference (ASP-DAC) was held at the International Convention Center, Jeju Island, South Korea, on 22-25 January 2018. ASP-DAC was founded in 1995 and has continuously offered opportunity for the researchers around Asia and South Pacific regions to communicate with each other and to get exposed to the advanced and recent technologies. This year's event was sponsored by ACM Special Interest Group on design automation (SIGDA), the IEEE Circuits and Systems Society, and the IEEE Council on Electronic design automation. We also had two Japanese organizations, Institute of Electronics, Information and Communication Engineers and Information Processing Society of Japan, which supported the conference. We were very fortunate to have a number of corporate sponsors including Cadence, SK Hynix, Mentor, Synopsys, Entasys, Baum, and Silvaco. The conference was attended by 373 people, which is similar to when the conference was held in Chiba, Japan, last year;the largest number of attendees was from South Korea, followed by the United States, Taiwan, China, Japan, Hong Kong, and Germany. © 2013 IEEE.

关键词： automation

来源：评论

学校读者我要写书评

暂无评论

Efficient test-data compression for IP cores using multilevel Huffman coding

Efficient test-data compression for IP cores using multileve...

引用

design, automation and test in europe conference and Exhibition (DATE 06)

作者： Kavousianos, X. Kalligeros, E. Nikolos, D. Univ Ioannina Dept Comp Sci GR-45110 Ioannina Greece Univ Patras Dept Comp Engn & Informat Patras GR- 26500 Greece Res Acad Comp Tech Inst Patras GR- 26500 Greece

ISBN: (纸本)9783981080117

In this paper we introduce a new test-data compression method for IP cores with unknown structure. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Specifically, three different kinds of information are compressed using the same Huffman code, and thus significant test data reductions are achieved A simple architecture is proposed for decoding on-chip the compressed data. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test set are replaced by pseudorandom data generated by an LFSR.

关键词： Data compression

来源：评论

学校读者我要写书评

暂无评论

没有更多数据了...

全选清除本页清除全部题录导出标记到“检索档案”

共28页 << < 1 2 3 4 5 6 7 8 9 10 > >>

检索报告对象比较合并检索0

隐藏清空

合并搜索

回到顶部

执行限定条件

内容：

评分：

请选择保存的检索档案：

请选择收藏分类：

订阅名称：

通借通还

温馨提示：

图书名称：

借书校区：

取书校区：

手机号码：

邮箱地址：

一卡通帐号：

电话和邮箱必须正确填写，我们会与您联系确认。

联系人：

所在院系：

联系邮箱：

联系电话：

内蒙古自治区呼和浩特市赛罕区大学西街235号邮编: 010021

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：