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检索条件"任意字段=Proceedings of the 23rd Conference on Design, Automation and Test in Europe"

共 272 条记录，以下是31-40 订阅

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Covering Undetected Transition Fault Sites with Optimistic Unspecified Transition Faults under Multicycle tests 23

Covering Undetected Transition Fault Sites with Optimistic U...

引用

23rd IEEE european test Symposium (ETS)

作者： Pomeranz, Irith Purdue Univ Sch Elect & Comp Engn W Lafayette IN 47907 USA

ISBN: (纸本)9781538637289

Transition faults require scan tests with two functional clock cycles between a scan-in and a scan-out operation to activate the faults and propagate their effects to observable outputs. Multicycle tests, with two or more functional clock cycles between scan operations, provide the following advantages. (1) They potentially increase the defect coverage by exercising the circuit at-speed for several functional clock cycles. (2) They allow test compaction to be achieved. (3) Multicycle tests can address features such as multiple clock domains and partial scan. (4) They create closer-to-functional operation conditions that are important for avoiding overtesting of delay faults.

关键词： Circuit faults Clocks Standards Compaction Delays Computational modeling test pattern generators

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design and Implementation of a test Tool for PSD2 Compliant Interfaces 23

Design and Implementation of a Test Tool for PSD2 Compliant ...

引用

23rd International conference on Enterprise Information Systems (ICEIS)

作者： Bondel, Gloria Kamysek, Josef Kraft, Markus Matthes, Florian Tech Univ Munich Fac Informat Garching Germany msgGillardon AG Munich Germany

ISBN: (纸本)9789897585098

The Revised Payment Services Directive (PSD2) forces retail banks to make customer accounts accessible to TPPs via standardized and secure "Access to Account" (XS2A) interfaces. Furthermore, banks have to ensure that these interfaces continuously meet functional and performance requirements, hence testing is very important. A known challenge in software testing is the design of test cases. While standardized specifications and derived test cases exist, the actual implementations of XS2A interfaces often deviate, leading to the need to adapt existing or create new test cases. We apply a design science approach, including five expert interviews, to iteratively generate a concept of a test tool that enables testing of several XS2A interface implementations with the same set of test cases. The concept makes use of files mapping deviations between the standardized specification and the implemented interfaces. We demonstrate the concept's feasibility by implementing a prototype and testing its functionality in a sandbox setting.

关键词： PSD2 XS2A test Tool

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Psychometric Computational Thinking test 2018

Psychometric Computational Thinking Test

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23rd Annual ACM conference on Innovation and Technology in Computer Science Education (ITiCSE)

作者： Santisteban, Julio Santisteban-Munoz, Jennifer Univ Catolica San Pablo Arequipa Peru

ISBN: (纸本)9781450357074

The recent widespread popularity of computational thinking (CT) has raised the need for a reliable method for assessing it. Recent CT tests focus on programming skills rather than the analytical ability and problem-solving processes in science, philosophy and other areas of knowledge. This poster presents the results (test design) of an ongoing project that has developed a Psychometric Computational Thinking test (PCTT) which has three phases: test design, test implementation and applying the test. In regards to the PCTT design, the reliability and validity of the test were based on content and construct validity which also includes its rating scales for its application. This work makes two contributions: (1) a standardized CT test design incorporating psychometric techniques as well as computational techniques and (2) the inclusion of open-ended questions and their assessment with V of Aiken in order to validate responses.

关键词： Computational Thinking metric Psychometric

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testing configurable component-based software - Configuration test modeling and complexity analysis

Testing configurable component-based software - Configuratio...

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SEKE 2011 - proceedings of the 23rd International conference on Software Engineering and Knowledge Engineering

作者： Gao, Jerry Guan, Jing Ma, Alex Tao, Chuanqi Bai, Xiaoying Kung, David C. San Jose State University United States Tsinghua University China University of Texas Arlington United States

ISBN: (纸本)1891706292

As the advance of software component technology, engineers encountered different issues and challenges in testing and automation of configurable components and component-based programs. One of them is how to validate configurable components and programs to achieve adequate test criteria and support test automation. This paper uses a test model, known as a semantic tree, to assist engineers to model and analyze diverse composite components and configurable software in terms of configurable environments, organization structures and functions. Based on this model, well-defined test criteria are presented to address the adequate testing issues. In addition, the paper discusses two test complexity evaluation methods for configurable components and software. Furthermore, some case study results are reported to demonstrate the testing complexity of diverse configurations.

关键词： Software testing

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STL - A high level language for simulation and test

STL - A high level language for simulation and test

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23rd ACM/IEEE design automation conference, DAC 1986

作者： Ivie, John Lai, Kwok-Woon Larry SDA Systems 2461 Mission College Boulevard Santa ClaraCA95054 United States

ISBN: (纸本)0818607025

A high-level language for the description of functional tests is described. This language integrates simulation and test by providing a common source language and programming environment. Through the use of individual code generation modules, this high-level language can be compiled into input for various simulators and testers. "Expert knowledge" contained within each code generation module allows optimal test programs to be generated. In particular, the hardware architecture of the target tester is directly supported. The Simulation and test Language (STL) programming environment also supports behavioral modeling of the device being designed. The outputs predicted by this behavioral model can then be automatically compared with the results produced by simulation. © 1986 IEEE.

关键词： Behavioral research

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On the use of term trees for effective and efficient test pattern generation

On the use of term trees for effective and efficient test pa...

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23rd Euromicro conference on New Frontiers of Information Technology

作者： Jozwiak, L Eindhoven University of Technology Faculty of Electrical Engineering 5600 MB Eindhoven P.O. Box 513 Netherlands

ISBN: (纸本)0818681306

The aim of the structural automatic test pattern generation (ATPG) is to efficiently construct a compact set of test patterns that are able do discover faults from a given structural fault model. This paper focuses on the usage for ATPG of a new data representation, called term trees. We designed and implemented a new term tree based ATPG algorithm with the following features: 1) 100% coverage of all nonredundant faults of the fault model, 2) a (near) minimal test set, 3) detection of circuit redundancy that disables testing for some faults, 4) a practical ATPG time and memory usage. In the paper we introduce the term trees and their structural fault model, show how to use them for effective and efficient test pattern generation and discuss some ATPG results. We also propose an effective, efficient and flexible term tree minimization algorithm and discuss some benchmark results. The term trees can be applied for many other purposes in logic design and other areas.

关键词： Semiconductor device testing

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Simulation test beds for the space station electrical power system

Simulation test beds for the space station electrical power ...

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proceedings of the 23rd Intersociety Energy Conversion Engineering conference

作者： Sadler, Gerald G. Natl Aeronaut & Space Adm Cleveland OH USA

The space station electrical power system will be controlled by a network of distributed processors. Control software will be verified, validated, and tested in hardware and software test beds. Software test bed verification and validation will reduce the risk of costly hardware failures. Current plans for the software test bed involve using real-time and non-real-time simulations of the power system. These simulations will address specific aspects of testing. The author discusses the current space station power system design, next-generation test bed configuration, simulations in support of the test bed, and the configuration of the simulation facility (EPS automation Lab).

关键词： Electric Power Systems

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Structural testing: Vmin Silicon Issues and Solutions 37

Structural Testing: Vmin Silicon Issues and Solutions

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37th International conference on VLSI design (VLSID) / 23rd International conference on Embedded Systems (ES)

作者： Sonone, Prashant Pradeep, R. Intel Technol India Pvt Ltd Bangalore Karnataka India

ISBN: (纸本)9798350384406

Semiconductor device manufacturing depends on Structural tests to work across voltage and temperature to achieve product qualification. This paper details Vmin issues encountered on system-on-chip (SoC) for Scan and Array testing, how these Vmin issues were root-caused, analyzed, and resolved. This methodology is currently proven to achieve Vmin improvement in the range of 10% to 20% for structural tests and deployed on various SoC. and can be used to help other designs identify and implement these !earnings to achieve product qualification within predictable schedule.

关键词： At-speed Scan Memory Built-in self (MBIST) Vmin Automated test Equipment (ATE) Post-Silicon testing

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The Impact of Production Defects on the Soft-Error Tolerance of Hardened Latches 23

The Impact of Production Defects on the Soft-Error Tolerance...

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23rd IEEE european test Symposium (ETS)

作者： Holst, Stefan Ma, Ruijun Wen, Xiaoqing Kyushu Inst Technol Iizuka Fukuoka 8208502 Japan

ISBN: (纸本)9781538637289

As modern technology nodes get more and more susceptible to soft-errors, various hardened latch cells have been proposed. The added redundancy used to tolerate transient faults in the field at the same time reduces the test coverage of cell-internal production defects. Moreover, the test escapes reduce the soft-error tolerance of the defective latches. This work introduces a new soft-error vulnerability metric called Post test Vulnerability Factor that correctly measures the added vulnerability to transient faults such as particle strikes caused by undiscovered production defects within hardened latches.

关键词： soft-error vulnerability test escapes latent defects

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On Managing test-Time, Power, and Layer Assignment in 3D SoCs with Built-In-Self-Repair Modules 37

On Managing Test-Time, Power, and Layer Assignment in 3D SoC...

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37th International conference on VLSI design (VLSID) / 23rd International conference on Embedded Systems (ES)

作者： Banerjee, Sabyasachee Majumder, Subhashis Bhattacharya, Bhargab B. Heritage Inst Technol Dept Comp Sci & Engn Kolkata India Indian Inst Technol Kharagpur Dept Comp Sci & Engn Kharagpur W Bengal India

ISBN: (纸本)9798350384406

Although built-in self-repair (BISR) techniques have been widely used to improve memory yield, their applications to the testing of 3D systems-on-chip (SoC) remained primarily unexplored. In this manuscript, we present a multi-stage approach to implement BISR in 3D SoCs with an aim to (i) reduce test time by proposing a test scheduling technique satisfying given power constraints, (ii) reduce the number of BISR modules, and (iii) to place BISR circuitry in suitable layers for facilitating thermal dissipation. Experimental results on several SoC benchmarks show that our approach reduces both test time as well as the cost of BISR architecture in most cases.

关键词： Built-in self-repair (BISR) Core Wrapper SoC testing ReBISR

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