检索结果-内蒙古大学图书馆

您好，读者！请登录

内蒙古大学图书馆

首页
概况
党建
资源
服务
科研支持
- 论文收录引用证明
- 科技查新
知识产权
档案馆
帮助

咨询与建议

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

您的常用邮箱：*

您的手机号码：*

问题描述：

当前已输入0个字，您还可以输入200个字

全部搜索
期刊论文
图书
学位论文
标准
纸本馆藏
外文资源发现
数据库导航
超星发现

高级检索

时间限定

出版年份：

文献类型

图书期刊文献学位论文多媒体

馆藏选择

电子馆藏纸本馆藏

核心期刊

全部期刊 SCI 收录期刊 SSCI 收录期刊 EI 收录期刊 CSCD 收录期刊 CSSCI 收录期刊

语言

中文英文

文献类型

期刊文献图书学位论文标准纸本馆藏

帮助

文字说明：

T=题名（书名、题名），A=作者（责任者），K=主题词，P=出版物名称，PU=出版社名称，O=机构（作者单位、学位授予单位、专利申请人），L=中图分类号，C=学科分类号，U=全部字段，Y=年（出版发行年、学位年度、标准发布年）

检索规则说明：

AND代表“并且”；OR代表“或者”；NOT代表“不包含”；(注意必须大写,运算符两边需空一格)

检索范例：

范例一：(K=图书馆学 OR K=情报学) AND A=范并思 AND Y=1982-2016
范例二：P=计算机应用与软件 AND (U=C++ OR U=Basic) NOT K=Visual AND Y=2011-2016

分类表

所选分类

>> <<

限定检索结果

文献类型

3,734 篇 会议
65 篇 期刊文献
9 册 图书

馆藏范围

3,808 篇 电子文献
0 种 纸本馆藏

日期分布

学科分类号

2,039 篇 工学
- 1,236 篇 计算机科学与技术...
- 811 篇 电气工程
- 731 篇 控制科学与工程
- 679 篇 软件工程
- 478 篇 电子科学与技术（可...
- 293 篇 机械工程
- 108 篇 信息与通信工程
- 75 篇 材料科学与工程（可...
- 67 篇 仪器科学与技术
- 59 篇 航空宇航科学与技...
- 52 篇 动力工程及工程热...
- 46 篇 力学（可授工学、理...
- 45 篇 土木工程
- 33 篇 建筑学
- 32 篇 交通运输工程
- 31 篇 化学工程与技术
- 29 篇 安全科学与工程
- 25 篇 石油与天然气工程
- 22 篇 冶金工程
- 17 篇 光学工程
546 篇 理学
- 208 篇 数学
- 204 篇 系统科学
- 150 篇 物理学
- 41 篇 统计学（可授理学、...
- 23 篇 化学
- 20 篇 天文学
253 篇 管理学
- 241 篇 管理科学与工程(可...
- 47 篇 工商管理
- 16 篇 图书情报与档案管...
22 篇 经济学
- 22 篇 应用经济学
12 篇 法学
11 篇 教育学
9 篇 医学
8 篇 军事学
2 篇 农学

主题

543 篇 circuit testing
425 篇 europe
373 篇 automatic testin...
368 篇 circuit faults
288 篇 system testing
253 篇 built-in self-te...
247 篇 automatic test p...
223 篇 hardware
214 篇 logic testing
186 篇 test pattern gen...
185 篇 design automatio...
173 篇 costs
137 篇 testing
135 篇 integrated circu...
126 篇 automation
125 篇 fault detection
117 篇 software testing
115 篇 design for testa...
103 篇 sequential circu...
101 篇 circuit simulati...

机构

14 篇 purdue univ sch ...
12 篇 duke univ dept e...
12 篇 electrical and c...
12 篇 electrical & com...
11 篇 synopsys inc.
11 篇 stmicroelectroni...
11 篇 imec leuven
11 篇 mentor graphics ...
11 篇 school of electr...
10 篇 politecnico di t...
10 篇 logic vision inc...
9 篇 dipartimento di ...
9 篇 philips research...
9 篇 dipartimento di ...
9 篇 univ florida dep...
8 篇 technical univer...
8 篇 department of el...
8 篇 at and t bell la...
8 篇 school of electr...
7 篇 computer enginee...

作者

33 篇 kwang-ting cheng
32 篇 reddy sudhakar m...
31 篇 pomeranz irith
25 篇 s.m. reddy
23 篇 m. sonza reorda
23 篇 chakrabarty kris...
22 篇 i. pomeranz
20 篇 sudhakar m. redd...
19 篇 irith pomeranz
18 篇 y. zorian
18 篇 p. prinetto
17 篇 krishnendu chakr...
17 篇 anon
17 篇 cheng kwang-ting
16 篇 a. orailoglu
16 篇 f. corno
14 篇 marinissen erik ...
13 篇 wunderlich hans-...
13 篇 s. dey
13 篇 d. sciuto

语言

3,733 篇 英文
42 篇 其他
32 篇 中文
1 篇 德文
1 篇 土耳其文

检索条件"任意字段=Proceedings of the Conference on Design, Automation and Test in Europe"

共 3808 条记录，以下是61-70 订阅

全选清除本页清除全部题录导出标记到"检索档案"

详细简洁

排序：

Structure design and manufacture of 19in radio frequency instrument chassis 10

Structure design and manufacture of 19in radio frequency ins...

引用

10th International conference on Mechanical Engineering, Materials, and automation Technology, MMEAT 2024

作者： Liu, Yan Zhang, Na Pan, Jianli Zhou, Nan Zhang, Zhenhai Song, Hailong Beijing Orient Institute of Measurement & Test Beijing100086 China

ISBN: (纸本)9781510682634

To meet the demand of 19in radio frequency instruments for high reliability chassis, the chassis structure design and manufacturing was carried out focusing on the chassis components, mainly including chassis structure design, semi-rigid cable module design, metal parts processing, semi-rigid cable module processing and chassis assembly. The final equipment passed the environmental adaptability test assessment, and its performance met the requirements for the use of the four-level equipment in GJB3947A-2009. demonstrates the feasibility of the chassis structure design and manufacturing, and providing a reference for the design and manufacturing of the same type of 19in radio frequency chassis. © 2024 SPIE.

关键词： Instrument components

来源：评论

学校读者我要写书评

暂无评论

BMC+Fuzz: Efficient and Effective test Generation

BMC+Fuzz: Efficient and Effective Test Generation

引用

2022 design, automation and test in europe conference and Exhibition, DATE 2022

作者： Metta, Ravindra Medicherla, Raveendra Kumar Chakraborty, Samarjit Tcs Research Pune India University of North Carolina Department of Computer Science Chapel Hill United States

ISBN: (纸本)9783981926361

Coverage Guided Fuzzing (CGF) is a greybox test generation technique. Bounded Model Checking (BMC) is a whitebox test generation technique. Both these have been highly successful at program coverage as well as error detection. It is well known that CGF fails to cover complex conditionals and deeply nested program points. BMC, on the other hand, fails to scale for programming features such as large loops and arrays. To alleviate the above problems, we propose (1) to combine BMC and CGF by using BMC for a short and potentially incomplete unwinding of a given program to generate effective initial test prefixes, which are then extended into complete test inputs for CGF to fuzz, and (2) in case BMC gets stuck even for the short unwinding, we automatically identify the reason, and rerun BMC with a corresponding remedial strategy. We call this approach as BMCFuzz and implemented it in the VeriFuzz framework. This implementation was experimentally evaluated by participating in test-Comp 2021 and the results show that BMCFuzz is both effective and efficient at covering branches as well as exposing errors. In this paper, we present the details of BMCFuzz and our analysis of the experimental results. © 2022 EDAA.

关键词： Software testing

来源：评论

学校读者我要写书评

暂无评论

Device-Aware test for Anomalous Charge Trapping in FeFETs 25

Device-Aware Test for Anomalous Charge Trapping in FeFETs

引用

30th Asia and South Pacific design automation conference, ASP-DAC 2025

作者： Yuan, Sicong Wang, Changhao Fieback, Moritz Xun, Hanzhi Taouil, Mottaqiallah Li, Xiuyan Chen, Danyang Wang, Lin Bellarmino, Nicolo Cantoro, Riccardo Hamdioui, Said Technische Univ. Delft Delft Netherlands Politecnico di Torino Turin Italy Shanghai Jiao Tong Univ. Shanghai China

ISBN: (纸本)9798400706356

The development of Ferroelectric Field-Effect Transistor (FeFET) manufacturing requires high-quality test solutions, yet research on FeFET testing is still in a nascent stage. To generate a dedicated test method for FeFETs, it is critical to have a deep understanding of manufacturing defects and accurately model them. In this work, we introduce the unique defect, Anomalous Charge Trapping (ACT), in FeFETs. The ACT-defective FeFET is characterized, and the physical mechanism of the defect is explained. Then, we apply the Deviceaware test (DAT) method to design a specific ACT-defective FeFET model, which includes the physical impact of the defect on the electrical parameters of defect-free models, and calibrate the model with measurement data. Fault modeling is performed based on circuit-level simulations, and dedicated test solutions are proposed. © 2025 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

关键词： Charge trapping

来源：评论

学校读者我要写书评

暂无评论

X -Tolerant Logic BIST for Automotive designs using Observation Scan Technology 37

X -Tolerant Logic BIST for Automotive Designs using Observat...

引用

37th International conference on VLSI design (VLSID) / 23rd International conference on Embedded Systems (ES)

作者： Harith, Ashrith S. Liu, Yingdi Mukherjee, Nilanjan Mayer, Jeff Siemens Digital Ind Software Wilsonville OR 97070 USA

ISBN: (纸本)9798350384406

Due to recent trends and rapid automation, the percentage of electronics in automobiles has grown at a rapid pace. This includes complex safety critical components, such as Advanced Driver Assistance Systems (ADAS) and Autonomous Driving Systems. Functional safety standards are designed to assure high quality and long-term reliability of electronic components that are deployed in automobiles. There exist numerous industry solutions for automotive testing involving both functional and structural techniques Logic BIST (LBIST) being a popular one. However, LBIST is sensitive to unknown states (X), which predominantly arise due to uninitialized sequential elements in the design or paths failing timing closure. This paper proposes a scheme for X tolerance based on static chain masking. The objective of this paper is to describe a methodology to optimize pattern count (test time) by integrating LBIST Observation Scan Technology (OST) with traditional static chain masking. OST test points are special type of observe points that capture circuit responses during the shift cycles. The proposed solution involves running LBIST in two phases exploiting OST for pattern reduction and static chain masking for containing unknowns. Experiments run on contemporary automotive designs and results reported herein show remarkable improvement in test time when compared to traditional X tolerance schemes for LBIST based designs.

关键词： built-in self-test (BIST) Observation Scan Technology (OST) embedded-test functional safety scan -bused testing test application time test points

来源：评论

学校读者我要写书评

暂无评论

SmartATPG: Learning-based Automatic test Pattern Generation with Graph Convolutional Network and Reinforcement Learning 24

SmartATPG: Learning-based Automatic Test Pattern Generation ...

引用

61st ACM/IEEE design automation conference, DAC 2024

作者： Li, Wenxing Lyu, Hongqin Liang, Shengwen Wang, Tiancheng Li, Huawei State Key Lab of Processors Institute of Computing Technology Cas Beijing China University of Chinese Academy of Sciences Beijing China Castest Beijing China

ISBN: (纸本)9798400706011

Automatic test pattern generation (ATPG) is a critical technology in integrated circuit testing. It searches for effective test vectors to detect all possible faults in the circuit as entirely as possible, thereby ensuring chip yield and improving chip quality. However, the process of searching for test vectors is NP-complete. At the same time, the large amount of backtracking generated during the search for test vectors can directly affect the performance of ATPG. In this paper, a learning-based ATPG framework, SmartATPG, is proposed to search for high-quality test vectors, reduce the number of backtracking during the search process, and thereby improve the performance of ATPG. SmartATPG utilizes graph convolutional network (GCN) to fully extract circuit feature information and efficiently explore the ATPG search space through reinforcement learning (RL). Experimental results indicate that the proposed SmartATPG outperforms traditional and artificial neural network (ANN)-based heuristic strategies on most benchmark circuits. © 2024 Copyright is held by the owner/author(s). Publication rights licensed to ACM.

关键词： Integrated circuit testing

来源：评论

学校读者我要写书评

暂无评论

NNtesting: Neural Network Fault Attacks Detection Using Gradient-Based test Vector Generation 60

NNTesting: Neural Network Fault Attacks Detection Using Grad...

引用

60th ACM/IEEE design automation conference (DAC)

作者： Wang, Antian Zhao, Bingyin Tan, Weihang Lao, Yingjie Clemson Univ Dept Elect & Comp Engn Clemson SC 29634 USA

ISBN: (纸本)9798350323481

Recent studies have shown Neural Networks (NNs) are highly vulnerable to fault attacks. This work proposes a novel defensive framework, NNtesting, for detecting the fault attack and recovering the model. We first leverage gradient-based optimization to generate a set of high-quality test Vectors (TVs) that effectively differentiate faulty profile models and further optimize the TV set by reducing the TVs through compression. The selected final TV set is then used to recover the model. The effectiveness of the proposed method is comprehensively evaluated on a wide range of models across various benchmark datasets. For instance, we successfully generate more than thousands of TV candidates using a gradient-based generation method. After compression, we achieve up to 94.76% detection success rate with only 140 TVs on the CIFAR-10 dataset.

关键词： Neural Network Fault Attack Defense test Vector Generation Model Repairing

来源：评论

学校读者我要写书评

暂无评论

design and research of non-contact measurement system for aircraft liquid flow 4

Design and research of non-contact measurement system for ai...

引用

4th International conference on Mechanical Engineering, Intelligent Manufacturing, and automation Technology, MEMAT 2023

作者： Huang, Gang Gao, Zhiyuan Chinese Flight Test Establishment Xi'an China

ISBN: (纸本)9781510674820

Aircraft liquid flow test is very important to evaluate the performance and state of aircraft systems, and reasonable liquid flow is the guarantee that aircraft can fly normally. Traditional flow measurement is mostly used by turbine flow meters, while ultrasonic flow measurement has the advantages of non-contact and convenient installation, which is an innovation and progress for aircraft liquid flow measurement. In the article, a time-difference ultrasonic flow measurement system based on high-precision time-to-digital conversion chip TDC-GP2 is designed, the basic principle of improved time-difference measurement is introduced, the hardware and software design of the system are discussed, and the preliminary test of ultrasonic flow measurement system is completed. The test results show that the designed ultrasonic flow measurement system has high time measurement accuracy and good stability, which provides great guidance for the test of aircraft liquid flow. © 2024 SPIE.

关键词： Aircraft

来源：评论

学校读者我要写书评

暂无评论

Research progress and development considerations on load flight test of transport aircraft 10

Research progress and development considerations on load fli...

引用

10th International conference on Mechanical Engineering, Materials, and automation Technology, MMEAT 2024

作者： Cao, Liangqiu Chinese Flight Test Establishment Xi’an710089 China

ISBN: (纸本)9781510682634

Load flight test is one of the important projects for the approval flight test of transport aircraft. The flight test team has accumulated rich experience through multiple model flight tests, and has made significant progress in the technical fields of load flight test, safety monitoring based on measured loads, and model-based load flight testing. However, facing the future development trend of transportation aircraft, it is still necessary to continue conducting research on load flight test technology to further improve the effectiveness, safety, and economy of load flight test. © 2024 SPIE.

关键词： Calibration design Safety Environmental monitoring Transportation Unmanned aerial vehicles Control systems Data processing Structural health monitoring Velocity measurements

来源：评论

学校读者我要写书评

暂无评论

A Compaction Method for STLs for GPU in-field test

A Compaction Method for STLs for GPU in-field test

引用

2022 design, automation and test in europe conference and Exhibition, DATE 2022

作者： Guerrero-Balaguera, Juan-David Rodriguez Condia, Josie E. Reorda, Matteo Sonza Department of Control and Computer Engineering Politecnico di Torino Torino Italy

ISBN: (纸本)9783981926361

Nowadays, Graphics Processing Units (GPUs) are effective platforms for implementing complex algorithms (e.g., for Artificial Intelligence) in different domains (e.g., automotive and robotics), where massive parallelism and high computational effort are required. In some domains, strict safety-critical requirements exist, mandating the adoption of mechanisms to detect faults during the operational phases of a device. An effective test solution is based on Self-test Libraries (STLs) aiming at testing devices functionally. This solution is frequently adopted for CPUs, but can also be used with GPUs. Nevertheless, the in-field constraints restrict the size and duration of acceptable STLs. This work proposes a method to automatically compact the test programs of a given STL targeting GPUs. The proposed method combines a multi-level abstraction analysis resorting to logic simulation to extract the microarchitectural operations triggered by the test program and the information about the thread-level activity of each instruction and to fault simulation to know its ability to propagate faults to an observable point. The main advantage of the proposed method is that it requires a single fault simulation to perform the compaction. The effectiveness of the proposed approach was evaluated, resorting to several test programs developed for an open-source GPU model (FlexGripPlus) compatible with NVIDIA GPUs. The results show that the method can compact test programs by up to 98.64% in code size and by up to 98.42% in terms of duration, with minimum effects on the achieved fault coverage. © 2022 EDAA.

关键词： Graphics processing unit

来源：评论

学校读者我要写书评

暂无评论

proceedings - ITC-Asia 2024: 8th IEEE International test conference in Asia

Proceedings - ITC-Asia 2024: 8th IEEE International Test Con...

引用

8th IEEE International test conference in Asia, ITC-Asia 2024

ISBN: (纸本)9798331540333

The proceedings contain 48 papers. The topics discussed include: a high performance PODEM algorithm with the improved backtrace process;CRISP: triangle counting acceleration via content addressable memory-integrated 3D-stacked memory;design of ultra-high throughput and resource efficiency TRNG based on NAND-XOR and feedback XOR ring oscillators;advanced DFT clock control architectures with agile development for chisel-based high performance RISC-V processors;efficient functional safety method for gate-level fine-grained digital circuits with ISO-26262;ELSeM: an efficient and lightweight security mechanism for DSP;enhancing subthreshold stuck-at fault testing with polymorphic gates;a brief survey on randomizer design and optimization for efficient stochastic computing;and a scan slice reordering algorithm based on minimizing entropy to enhance test data compression efficiency.

关键词：

来源：评论

学校读者我要写书评

暂无评论

没有更多数据了...

全选清除本页清除全部题录导出标记到“检索档案”

共381页 << < 3 4 5 6 7 8 9 10 11 12 > >>

检索报告对象比较合并检索0

隐藏清空

合并搜索

回到顶部

执行限定条件

内容：

评分：

请选择保存的检索档案：

请选择收藏分类：

订阅名称：

通借通还

温馨提示：

图书名称：

借书校区：

取书校区：

手机号码：

邮箱地址：

一卡通帐号：

电话和邮箱必须正确填写，我们会与您联系确认。

联系人：

所在院系：

联系邮箱：

联系电话：

内蒙古自治区呼和浩特市赛罕区大学西街235号邮编: 010021

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：