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检索条件"任意字段=Three- Dimensional and Multidomensional Microscopy: Image Acquisition and Processing XII"

共 21 条记录，以下是1-10 订阅

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Progress in Biomedical Optics and Imaging - three-dimensional and Multidimensional microscopy: image acquisition and processing xii

Progress in Biomedical Optics and Imaging - Three-Dimensiona...

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three- dimensional and multidomensional microscopy: image acquisition and processing xii

The proceedings contain 23 papers from the conference on Progress in Biomedical Optics and Imaging - three-dimensional and Multidimensional microscopy: image acquisition and processing xii. The topics discussed include: using out-of-focus light to improve image acquisition time in confocal microscopy;three-dimensional optical computed-tomography microscope;image estimation for structured-illumination microscopy;microlymphatic flow using fast video microscopy;confocal reflectance theta line-scanner for imaging tissues in vivo;multimodal optical microscope for imaging biological systems;spectral domain phase microscopy: a new tool for measuring cellular dynamics and cytoplasmic flow;and an algorithm for image stitching and blending.

关键词： Imaging systems

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three-dimensional multiple nanometric local probes microscopy

Three-dimensional multiple nanometric local probes microscop...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Moneron, G Dubois, A Boccara, AC CNRS UPA A0005 Ecole Super Phys Chim Ind Lab Opt Phys F-75231 Paris France

ISBN: (纸本)0819456756

We present a microscope set-up designed to produce three-dimensional images of the internal structures of various samples with high spatial resolution (a few tens of nanometers in axial and transverse directions). This level of resolution is reached by the use of nanometric sub-wavelength spherical gold beads as multiple local probes, dispersed in the hollow structures. The exploration, by Brownian motion, of the internal structures allows their three-dimensional reconstruction.

关键词： interference microscopy three-dimensional microscopy optical coherence tomography white-light interferometry scanning probe microscopy

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image estimation for structured-illumination microscopy

Image estimation for structured-illumination microscopy

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Conchello, JA Oklahoma Med Res Fdn Program Mol Cell & Dev Biol Oklahoma City OK 73104 USA

ISBN: (纸本)0819456756

When recording three-dimensional (3D) images by the method of optical sectioning microscopy, each optical section contains the in-focus information plus out-of-focus contributions that obscure the in-focus detail and reduce contrast. There are several methods to remove or prevent the out-of-focus contributions from the stack of optical sections. One such method is image estimation -the use of a computer program based on a mathematical description of the microscope to remove the out-of-focus contributions. Another method is the use of structured illumination and a simple arithmetic operation to obtain a image that in which the out-of-focus contributions are greatly reduced. We derived a method for image estimation that uses the images collected from the structured-illumination microscope. The method improves the resolution of small detail over that possible with the structured illumination using the simple arithmetic formula.

关键词： image analysis Expectation maximization algorithms Microscopes microscopy 3D image processing Confocal microscopy image acquisition image processing Point spread functions Luminescence

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Scanning microscopy with extended depth of focus

Scanning microscopy with extended depth of focus

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Juskaitis, R Botcherby, EJ Wilson, T Univ Oxford Dept Engn Sci Oxford England

We demonstrate a simple and light-efficient way of generating non-diffracting Bessel beams for use in confocal microscopy. A number of imaging modalities using such beams is discussed. Preliminary experimental results... 详细信息

ISBN: (纸本)0819456756

关键词： confocal extended depth of focus Bessel beam fluorescence microscopy polarisation multi-photon

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three-dimensional state space realization algorithm: noise suppression of fluorescence microscopy images and point spread functions

Three-dimensional state space realization algorithm: noise s...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Lai, XM Ward, ES Lin, ZP Ober, RJ Univ Texas SW Med Ctr Ctr Immunol Dallas TX 75235 USA

ISBN: (纸本)0819456756

A recently developed algorithm is applied to calculate a state space realization of a 3D microscopy image set. It is based on interpreting the image set as the impulse response of a 3D se arable system. As an application it is shown how this algorithm. combined with approximation steps, can be used to suppress noise in 3D experimental point spread functions. The approach was motivated by a well known problem that a noisy point spread function degrades the results of deconvolution algorithms for the restoration of 3D fluorescence microscopy image sets. The proposed approach can also be applied to 3D fluorescence microscopy image sets of cells.

关键词： point spread function estimation state space algorithm noise suppression

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Lateral resolution enhancement in confocal self-interference microscopy

Lateral resolution enhancement in confocal self-interference...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Kang, D Gweon, D Korea Adv Inst Sci & Technol Med Engn Dept NOM Lab Taejon 305701 South Korea

ISBN: (纸本)0819456756

Lateral resolution enhancement in confocal self-interference microscopy (CSIM) is evaluated. CSIM, which uses the birefringence of the calcite plate to generate self-interference pattern, sharpens the central lobe of the effective spot. Numerical simulation results of two-dimensional imaging performances are presented. Two-point resolution of 149nm is achieved, which is enhanced by nearly 100% compared to that of confocal microscopy.

关键词： confocal microscopy superresolution birefringence self-interference

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High speed slit-scanning confocal laser microscopy with an acousto-optic beam deflector and a line scan camera

High speed slit-scanning confocal laser microscopy with an a...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Han, SM Im, KB Park, H Kim, D Kim, BM Yonsei Univ Dept Biomed Engn Kangwon Do 220710 South Korea

ISBN: (纸本)0819456756

Using an acousto-optic beam deflector and a line scan camera, we constructed a non-mechanical, slit-scanning confocal microscope. It generates two-dimensional 512x512 images with speed of 60 frames/sec, which can be easily expanded, to 100 frames/sec. The measured axial and lateral resolutions of the system are 3.3 mu m and < 1 mu m, respectively, with a 50X objective. This simple design can produce frames rates faster than other commercial products with comparable resolution, which may be useful for analysis of rapid interactions in various biological applications.

关键词： confocal microscope three-dimensional microscopy acousto-optic deflector line scan CCD

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Tomographic imagery by interference microscopy

Tomographic imagery by interference microscopy

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Dubois, A Guiot, E Schwartz, W Moneron, G Grieve, K Boccara, C CNRS UPR A0005 Ecole Super Phys & Chim Ind Lab Opt Phys F-75231 Paris France

ISBN: (纸本)0819456756

We have developed a white-light interference microscope as an alternative technique to conventional optical coherence tomography (OCT). The experimental setup is based on a Linnik interferometer illuminated with a tungsten halogen lamp. En face tomographic images are obtained in real-time without scanning by computing the difference of two phase-opposed interferometric images recorded by a CCD camera. The short coherence length of the source yields an optical sectioning ability with 0.7 mu m resolution (in water). Transverse resolution of 0.9 mu m is achieved by using high numerical aperture microscope objectives. A shot-noise limited detection sensitivity of 90 dB can be reached with similar to 1 s acquisition time. High-resolution images of mouse and tadpole embryos are shown.

关键词： interference microscopy three-dimensional microscopy optical coherence tomography medical and biomedical imaging

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Using out-of-focus light to improve image acquisition time in confocal microscopy

Using out-of-focus light to improve image acquisition time i...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Davis, BJ Karl, WC Goldberg, BB Swan, AK Ünlü, MS Boston Univ Dept Elect & Comp Engn Boston MA 02215 USA

ISBN: (纸本)0819456756

Light that would typically be discarded at a confocal microscope's detector pinhole will be collected and processed to allow a reduced spatial sampling rate and thus an improved image acquisition time. It is shown that collecting and appropriately processing the out-of-focus light will allow an axial sampling rate below that specified by the Nyquist criterion. To achieve this, a central detector pinhole and a number of out-of-focus regions are collected concurrently. This corresponds to imaging through several different channels, with differing point spread functions, in parallel. Since the spatial sampling rate is below the Nyquist frequency, aliasing occurs in the data from each of the channels. However, since the point spread functions are different, the aliasing effects are different in each channel. This allows the ensemble of aliased images to be processed into a sin-le dealiased and deconvolved image. This potential utility of out-of-focus light is demonstrated through simulated examples for differing collection schemes and scanning rates. Results are shown for under-sampling by up to a factor of four. Collecting the out-of-focus light also improves instrument collection efficiency.

关键词： confocal microscopy image acquisition time sampling rate aliasing out-of-focus light confocal pinhole high speed microscopy confocal collection efficiency

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A wide-field microscopy technique using a linear image sensor for obtaining 3D images

A wide-field microscopy technique using a linear image senso...

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Conference on 3-dimensional and Multidimensional microscopy - image acquisition and processing xii

作者： Macedo, MP Barata, AJ Fernandes, AG Correia, CM Inst Engn Coimbra Dept Phys & Math P-3030 Coimbra Portugal

ISBN: (纸本)0819456756

three-dimensional (3D) microscopy is a huge field that includes several microscopy techniques. Among these techniques the confocal microscopy is widely known and used due to its improved axial resolution or optical sectioning ability. However its high cost and image acquisition time as well as low signal-to-noise ratio are important drawbacks. Other techniques use wide-field structured illumination to get depth information from the sample. The detectors in commercial microscopes are normally of the point detector type (PMTs) in confocal and area sensors (CCDs) in widefield microscopy. Examples of microscopes that take advantage of lower cost and faster readout cycles of linear image sensors are very uncommon. The purpose of this work is to develop a low-cost microscopy technique for obtaining 3D images with lower acquisition time and higher signal-to-noise ratio (SNR) than in classical confocal microcopy. It uses a linear CMOS image sensor and specific reconstruction algorithms will be able to extract 3D information from the distribution of light intensity collected. The sensor readout circuitry has been developed and tests are currently running in a laboratory prototype in reflection mode with an epi-illuminated configuration of scanning-stage type. The light source is a commercial incandescent lamp with regulated intensity. For the development, test and optimization of the reconstruction algorithms the object is mounted on a 3-axis translation stage to scan the object in three perpendicular directions. Contrast and resolution results obtained using a resolution test slide and preliminary images of integrated circuit (IC) bonding are presented.

关键词： 3D microscopy confocal microscopy reconstruction algorithms optical sectioning linear sensor

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