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检索条件"任意字段=Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing IX"

共 591 条记录，以下是221-230 订阅

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three dimensional refractive index imaging with differential interference contrast microscopy

Three dimensional refractive index imaging with differential...

引用

Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Aung, Htet Buckley, Jared Kostyk, Piotr Rodriguez, Braulio Phelan, Shelley Xu, M. Fairfield Univ Dept Phys 1073 N Benson Rd Fairfield CT 06824 USA

ISBN: (纸本)9780819488701

We report here a new approach based on an extension of the transport of the intensity equation for three dimensional refractive index imaging of a weak phase object from a series of images recorded by a differential interference contrast microscope at different focus (z-stack). Our method is first validated by imaging polystyrene spheres. We then apply this method to monitor in vivo apoptosis of human breast MCF7 epithelial cells. The potential applications are discussed at the end.

关键词： DIC microscopy intensity propagation equation quantitative phase imaging 3D refractive index map

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Correction accuracy in image-based adaptive optics for nonlinear microscopy

Correction accuracy in image-based adaptive optics for nonli...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Facomprez, Aurelie Beaurepaire, Emmanuel Debarre, Delphine Ecole Polytech ParisTech Lab Opt & Biosci CNRS F-91128 Palaiseau France INSERM F-91128 Palaiseau France

ISBN: (纸本)9780819488701

We investigate the parameters governing the accuracy of correction in modal sensorless adaptive optics for microscopy. In this paper we focus on the case of two-photon excited fluorescence. Using analytical, numerical and experimental results, we show that using a suitable number of measurements, accurate correction can be achieved for up to 2 rad rms initial aberrations even without optimisation of the correction modes. We demonstrate that this correction can be achieved using low light levels to minimise photobleaching and toxicity, and we provide examples of such optimised correction.

关键词： Adaptive optics aberration correction multiphoton microscopy nonlinear microscopy

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Lens-less holographic microscopy with high resolving power for 4D measurement of microorganism swimming in water

Lens-less holographic microscopy with high resolving power f...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Otani, Mayu Sato, Kunihiro Univ Hyogo Dept Elect Eng & Comp Sci Grad Sch Engn Himeji Hyogo 6712201 Japan

ISBN: (纸本)9780819488701

A lens-less holographic microscopy is developed for observation of high-resolution 4-D (spatio-temporal) images. A complex-amplitude in-line hologram with a large numerical aperture is extracted from a large off-axis hologram by applying one-shot digital holography. An angular spectrum method is developed for fast numerical reconstruction of precise 3-D image from the in-line hologram with a large numerical aperture. 3-D intensity and phase images with no distortion, with a resolution higher than 1 mu m, and with a depth larger than 1mm are recorded and reconstructed by the present holographic microscopy. Possibility is demonstrated to realize 4-D measurement of microorganisms swimming in water.

关键词： lens-less holographic microscopy 4-D measurement microorganism phase measurement

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Improved contrast by modal illumination in scanning reflectance confocal microscopy

Improved contrast by modal illumination in scanning reflecta...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Glazowski, Christopher Zavislan, James Univ Rochester Inst Opt Rochester NY 14623 USA

ISBN: (纸本)9780819488701

Scanning reflectance confocal microscopy (SRCM) is a flexible technology that provides cellular resolution images of tissue morphology with tailored resolutions and fields of view. However, how accurately an object is represented, in other words its fidelity, is critical in medical imaging and is not represented simply by optical resolution. In this work we characterize the SRCMs fidelity of images derived within turbid media. We present theoretical and experimental results showing the improved fidelity when using modal illumination. We investigated the use of TEM10 illumination and a novel implementation of Nomarski differential-interference-contrast (DIC). Using a repeatable, stable turbid phantom the system fidelity was characterized.

关键词： microscopy turbid speckle confocal NRDIC pupil engineering phantom

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Dynamic phase imaging and processing of moving biological organisms

Dynamic phase imaging and processing of moving biological or...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Creath, Katherine Goldstein, Goldie 4D Technol Corp Tucson AZ 85706 USA

ISBN: (纸本)9780819488701

This paper describes recent advances in developing a new, novel interference Linnik microscope system and presents images and data of live biological samples. The specially designed optical system enables instantaneous 4-dimensional video measurements of dynamic motions within and among live cells without the need for contrast agents. "Label-free" measurements of biological objects in reflection using harmless light levels are possible without the need for scanning and vibration isolation. This instrument utilizes a pixelated phase mask enabling simultaneous measurement of multiple interference patterns taking advantage of the polarization properties of light enabling phase image movies in real time at video rates to track dynamic motions and volumetric changes. Optical thickness data are derived from phase images after processing to remove the background surface shape to quantify changes in cell position and volume. Data from a number of different pond organisms will be presented, as will measurements of human breast cancer cells with the addition of various agents that break down the cells. These data highlight examples of the image processing involved and the monitoring of different biological processes.

关键词： phase imaging interference microscopy polarization interferometry cellular imaging cell dynamics optical thickness measurement label-free imaging 4D microscopy

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Star Test Polarimetry using Stress-Engineered Optical Elements

Star Test Polarimetry using Stress-Engineered Optical Elemen...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Ramkhalawon, Roshita Beckley, Amber M. Brown, Thomas G. Univ Rochester Inst Opt Rochester NY 14627 USA

ISBN: (纸本)9780819488701

Stress-engineered optical elements have potential applications in snapshot polarimetry, in which a single irradiance image is used to measure a spatially varying polarization. In this paper, we present star test polarimetry which is a method of polarization retrieval by analyzing a single frame point spread function. A trigonally stressed window placed at the pupil plane of an imaging system is used to produce point spread functions which are then processed to extract the polarization state of the incoming beam under investigation. We outline several methods which are used to recover the Stokes parameters of a beam of unknown polarization from the irradiance distribution of its point spread function.

关键词： Polarimetry microscopy Unconventional Polarization states

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Measurement of the Polarimetric Response of Suspended Gallium Doped Silicon Nanowires

Measurement of the Polarimetric Response of Suspended Galliu...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Theisen, Michael J. McIntyre, Brian L. Brown, Thomas G. Univ Rochester Inst Opt Rochester NY 14627 USA Univ Rochester URnano Rochester NY USA

ISBN: (纸本)9780819488701

We describe an investigation of the polarimetric properties of suspended gallium doped silicon (Si:Ga) nanowires. Wire fabrication has been done with a combined gallium implantation (using a focused ion beam) and subsequent reactive ion and wet etches. A polarimetric microscope has been built and calibrated. Measurement of the polarimetric response shows a high reflectivity and strong retardance on reflection, with some samples showing low diattenuation, in contrast to conventional wire grid polarizers.

关键词： Polarimetry microscopy Nanowires

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Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering

Simultaneous quantitative depth mapping and extended depth o...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Zahreddine, Ramzi N. Cormack, Robert H. Cogswell, Carol J. Univ Colorado Dept Elect Comp & Energy Engn Boulder CO 80309 USA

ISBN: (纸本)9780819488701

An extended depth of field (EDF) microscope that allows for quantitative axial positioning has been constructed. Past work has shown that EDF microscopy allows for features in varying planes to appear sharply focused simultaneously, however an inherent consequence of this is that depth information is lost. Here, a specifically engineered phase plate is used to create a point spread function (PSF) that contains both of the necessary attributes for extended depth of field and quantitative depth mapping. A two-camera solution is used to separate and capture the information for individualized post processing. The result is a microscope that can serve as an essential tool for full 3D, real-time imaging.

关键词： 4D microscopy PSF engineering extended depth of field quantitative depth ranging

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A Wavelet-Based Bayesian Framework for 3D Object Segmentation in microscopy

A Wavelet-Based Bayesian Framework for 3D Object Segmentatio...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Pan, Kangyu Corrigan, David Hillebrand, Jens Ramaswami, Mani Kokaram, Anil Univ Dublin Trinity Coll Dept Elect & Elect Engn Dublin 2 Ireland Trinity Coll Dublin Inst Neurosci Dublin 2 Ireland

ISBN: (纸本)9780819488701

In confocal microscopy, target objects are labeled with fluorescent markers in the living specimen, and usually appear with irregular brightness in the observed images. Also, due to the existence of out-of-focus objects in the image, the segmentation of 3-D objects in the stack of image slices captured at different depth levels of the specimen is still heavily relied on manual analysis. In this paper, a novel Bayesian model is proposed for segmenting 3-D synaptic objects from given image stack. In order to solve the irregular brightness and out-of-focus problems, the segmentation model employs a likelihood using the luminance-invariant 'wavelet features' of image objects in the dual-tree complex wavelet domain as well as a likelihood based on the vertical intensity profile of the image stack in 3-D. Furthermore, a smoothness 'frame' prior based on the a priori knowledge of the connections of the synapses is introduced to the model for enhancing the connectivity of the synapses. As a result, our model can successfully segment the in-focus target synaptic object from a 3D image stack with irregular brightness.

关键词： image segmentation Wavelets 3D modeling 3D image processing 3D acquisition Feature extraction Confocal microscopy Binary data Discrete wavelet transforms microscopy

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Restoration of high-resolution AFM images captured with broken probes

Restoration of high-resolution AFM images captured with brok...

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Conference on three-dimensional and multidimensional microscopy - image acquisition and processing Xix

作者： Wang, Y. F. Corrigan, D. Forman, C. Jarvis, S. Kokaram, A. Univ Dublin Trinity Coll Dept Elect Engn Dublin 2 Ireland Univ Coll Dublin Conway Grp Nanoscale Funct Grp Dublin Ireland

ISBN: (纸本)9780819488701

A type of artefact is induced by damage of the scanning probe when the Atomic Force Microscope (AFM) captures a material surface structure with nanoscale resolution. This artefact has a dramatic form of distortion rather than the traditional blurring artefacts. Practically, it is not easy to prevent the damage of the scanning probe. However, by using natural image deblurring techniques in image processing domain, a comparatively reliable estimation of the real sample surface structure can be generated. This paper introduces a novel Hough Transform technique as well as a Bayesian deblurring algorithm to remove this type of artefact. The deblurring result is successful at removing blur artefacts in the AFM artefact images. And the details of the fibril surface topography are well preserved.

关键词： Atomic force microscopy Distortion Hough transforms Deconvolution image analysis image processing Convolution Gaussian filters image resolution Atomic force microscope

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