The overview of traditional measurement techniques of microwave noise indicates that the refiecto-metric and the source-pull tuners methods are all expen-sive and time-consuming because of the use of broad-band tuners...
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The overview of traditional measurement techniques of microwave noise indicates that the refiecto-metric and the source-pull tuners methods are all expen-sive and time-consuming because of the use of broad-band tuners and frequent calibration. Moreover, based on the two techniques, a complicated algorithm is usually needed to extract accurately the two-port noise feature parame-ters from the over-determined measured data. Recently, a novel technique is proposed to measure the noise figure at the single source (50Ω). To improve the accuracy, a mod-ified F50 Technique is presented here. And an extraction method of four noise parameters from the single measured data of F50 is also given using the Pospieszalski model of transistor and two-port noise analysis models as the addi-tional information. The experimental results demonstrate the practicability of the presented method as expected by showing the four noise parameters extracted from the sin-gle measurement of F50 are in agreement with the results obtained from source-pull tuners technique with 13 source admittances.
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