Y99-61677-205 0007330薄膜退耦电容器的建模与模拟=Modeling and simula-tion of thin film decoupling capacitors[会,英]/Chen,K.Y.& Brown,W.D.//Characterization of flip-chipCMOS ASIC simultaneous switching noise on mult...
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Y99-61677-205 0007330薄膜退耦电容器的建模与模拟=Modeling and simula-tion of thin film decoupling capacitors[会,英]/Chen,K.Y.& Brown,W.D.//Characterization of flip-chipCMOS ASIC simultaneous switching noise on multilayerorganic and ceramic BGA/CGA packages.—205～208(EG)对具有新型结构的薄膜退耦电容器的特性进行了模拟。对接触形状、电介质及金属层厚度对阻抗行为的影响进行了研究。模拟表明薄膜电容器具有优良的高频特性。
Y2000-62591-443 0115089锁相环中动力噪声引起的抖动分析:Analysis of jitterdue to power-supply noise in phase-locked Loops[会,英]/Heydari.P.& Pedram,—f.//2000 IEEE CustomIntegrated Circuits Conference.—443～446(EC)...
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Y2000-62591-443 0115089锁相环中动力噪声引起的抖动分析:Analysis of jitterdue to power-supply noise in phase-locked Loops[会,英]/Heydari.P.& Pedram,—f.//2000 IEEE CustomIntegrated Circuits Conference.—443～446(EC)Y2000-62591-447 0115090锁相及延迟锁定系统的非线性行为建模与模拟=Nonlinear behavioral modeling and simulation of phase-locked and delav-locked systems(会,英]/Wu,L.&Jim,H//2000 IEEE Custom Integrated Circuits Confer-ence.—447～450(EC)
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