The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The...
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The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.
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