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检索条件"主题词=3D Multi-class segmentation"
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3d defect detection and Metrology of HBMs using Semi-Supervised deep Learning  73
3D Defect Detection and Metrology of HBMs using Semi-Supervi...
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IEEE 73rd Electronic Components and Technology Conference (ECTC)
作者: Pahwa, Ramanpreet Singh Chang, Richard Jie, Wang Zhao Ziyuan Cai Lile Xun, Xu Sheng, Foo Chuan Choong, Chong Ser Rao, Vempati Srinivasa ASTAR I2R Singapore Singapore ASTAR Artificial Intelligence Analyt & Informat AI3 Singapore Singapore ASTAR Inst Microelect IME Singapore Singapore
3d deep Learning has made tremendous progress recently and is being widely used in various fields, such as medical imaging, robotics, and autonomous vehicle driving, to identify and segment various structures. In this... 详细信息
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