failure bitmaps of manufactured memory arrays may contain the information associated to some systematic defects and have hence been used to monitor the process and improve the memory *** is very important to develop a...
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ISBN:
(纸本)9781467324748
failure bitmaps of manufactured memory arrays may contain the information associated to some systematic defects and have hence been used to monitor the process and improve the memory *** is very important to develop a method to extract and classify the fault signatures in the failure *** fault signatures can be classified into two categories:local fault signatures and global fault *** on the local fault signatures,this paper introduces a supervised one-layer annmethod to solve the signatureclassification *** method is efficient for recognizing the local fault signatures in the failure bitmaps,and more importantly,it has the ability to find new signatures unseen before.
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