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检索条件"主题词=Algorithm Development"

共 1857 条记录，以下是1301-1310 订阅

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MAXIMUM-LIKELIHOOD METHOD FOR PROBABILISTIC MULTI-HYPOTHESIS TRACKING

MAXIMUM-LIKELIHOOD METHOD FOR PROBABILISTIC MULTI-HYPOTHESIS...

引用

Conference on Signal and Data Processing of Small Targets 1994

作者： STREIT, RL LUGINBUHL, TE USN CTR UNDERSEA WARFARE CTRDIV NEWPORTNEWPORTRI 02841

ISBN: (纸本)0819415391

In a multi-target multi-measurement environment, knowledge of the measurement-to-track assignments is typically unavailable to the tracking algorithm. In this paper, a strictly probabilistic approach to the measurement-to-track assignment problem is taken. Measurements are not assigned to tracks as in traditional multi-hypothesis tracking (MHT) algorithms; instead, the probability that each measurement belongs to each track is estimated using a maximum likelihood algorithm derived by the method of Expectation-Maximization. These measurement-to-track probability estimates are intrinsic to the multi-target tracker called the probabilistic multi-hypothesis tracking (PMHT) algorithm. Unlike MHT algorithms, the PMHT algorithm does not maintain explicit hypothesis lists. The PMHT algorithm is computationally practical because it requires neither enumeration of measurement-to-track assignments nor pruning.

关键词： Detection and tracking algorithms Silicon Expectation maximization algorithms algorithm development Error analysis Process modeling Filtering (signal processing) algorithms Environmental sensing Information operations

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CONTOUR ANALYSIS algorithmS FOR HIGH SPEED INSPECTION

CONTOUR ANALYSIS ALGORITHMS FOR HIGH SPEED INSPECTION

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13th Conference on Intelligent Robots and Computer Vision: 3D Vision, Product Inspection, and Active Vision

作者： KILLE, K FRAUNHOFER INST MFG ENGN & AUTOMAT D-70569 STUTTGARTGERMANY

ISBN: (纸本)0819416894

The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g., scale-space analysis) are presented. The performance of different approaches is shown by several industrial examples and applications.

关键词： Inspection Defect detection Gaussian filters Optical inspection Detection and tracking algorithms Object recognition Tolerancing algorithm development Analytical research Shape analysis

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MACHINE VISION METAL INSPECTION

MACHINE VISION METAL INSPECTION

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20th Annual SPIE Conference on Machine Vision Applications in Industrial Inspection

作者： MORRIS, J NOTARANGELO, J TELEDYNE BROWN ENGN INC HUNTSVILLEAL 35807

A new procedure is presented to introduce machine vision into a rolling mill environment for real-time on-line metal bar and rod inspection for flaw detection and characterization. Results are presented relating machi... 详细信息

ISBN: (纸本)0819414786

关键词： Inspection Machine vision Metals algorithm development Sensors Data processing Process control Computer simulations Environmental sensing Rods

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STUDIES OF ADVANCED DETECTION TECHNOLOGY SENSOR (ADTS) DATA

STUDIES OF ADVANCED DETECTION TECHNOLOGY SENSOR (ADTS) DATA

引用

Conference on algorithms for Synthetic Aperture Radar Imagery

作者： MORRISON, DP ECKERT, AC SHIELDS, FJ SCI APPLICAT INT CORP ARLINGTONVA 22203

ISBN: (纸本)0819415340

The need to understand the statistical and spectral characteristics of synthetic aperture radar (SAR) data prompted the analysis of ADTS SAR data. The analysis included statistical and spectral analyses, with an emphasis on understanding the impact of the SAR processing on the scene properties. Several models were developed, including a SAR Processing model and a scene generating model which explicitly models the scene speckle. As a result, a documented and tested FORTRAN program is available for spectral analysis. The statistical and spectral characteristics form the basis of ongoing SAR modeling.

关键词： Synthetic aperture radar Statistical analysis Data modeling Image processing Sensors Statistical modeling Speckle Analytical research Polarization algorithm development

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ELECTRICAL TEST STRUCTURE FOR OVERLAY METROLOGY REFERENCED TO ABSOLUTE LENGTH STANDARDS 8

ELECTRICAL TEST STRUCTURE FOR OVERLAY METROLOGY REFERENCED T...

引用

Conference on IC Inspection, Metrology, and Process Control VIII, at the SPIE Microlithography 1994 Symposium

作者： CRESSWELL, MW PENZES, WB ALLEN, RA LINHOLM, LW ELLENWOOD, CH TEAGUE, EC NATL INST STAND & TECHNOL DIV SEMICOND ELECTRGAITHERSBURGMD 20899

ISBN: (纸本)0819414913

This test structure is based on the voltage-dividing potentiometer principle and was originally replicated in a single lithography cycle to evaluate feature placement by a primary pattern generator. A new test structure has now been developed from the single-cycle version and has been used for measuring the overlay of features defined by two different exposures with a stepping projection aligner. The as-measured overlay values are processed by an algorithm that minimizes the effects of nominal random pattern imperfections. The algorithm further partitions measurements of overlay into contributions that derive, respectively, from misregistration of the image fields projected by the two masks and from the drawn misplacement of features on the masks. The numerical estimates of these contributions so obtained from the electrical measurements were compared with those extracted from the same features by the NIST line scale interferometer, providing traceability to absolute length standards. The two sets of measurements were found to agree to within the several-nanometer uncertainty cited for the line scale interferometer's readings alone.

关键词： Overlay metrology Interferometers Photomasks algorithm development Feature extraction Lithography

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SEGMENTATION-FREE MORPHOLOGICAL CHARACTER-RECOGNITION

SEGMENTATION-FREE MORPHOLOGICAL CHARACTER-RECOGNITION

引用

Conference on Document Recognition

作者： KRAUS, E DOUGHERTY, ER MONROE CTY COMMUNITY COLL DEPT MATHROCHESTERNY

ISBN: (纸本)081941476X

A basic class of structuring-element pairs for segmentation-free character recognition via the morphological hit-or-miss transform is developed for Courier font. Both hit and miss structuring elements are sparse and they are selected so that the hit-or-miss transform can be applied across the test image without prior segmentation. Besides being able to achieve high rates of accuracy on text with touching characters, the hit-or-miss algorithm, as developed herein, is shown to be very robust with respect to the threshold level for the input gray-scale data.

关键词： Image processing Image segmentation Optical character recognition Detection and tracking algorithms algorithm development Binary data Statistical analysis Structural design Optimization (mathematics) Silicon

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FAST VARIATIONAL algorithm FOR CLUTTER REMOVAL THROUGH PYRAMIDAL DOMAIN DECOMPOSITION

FAST VARIATIONAL ALGORITHM FOR CLUTTER REMOVAL THROUGH PYRAM...

引用

Conference on Chaos/Nonlinear Dynamics: Methods and Commercialization

作者： RUDIN, L KOEPFLER, G NORDBY, F MOREL, JM COGNITECH INC SANTA MONICACA

ISBN: (纸本)0819412864

Recent work has proven the feasibility and utility of 2-Normal segmentation as an image analysis tool. This technique, and the algorithm on which it is based, have shown dramatic and promising results for a number of image processing problems, such as clutter suppression, texture segmentation, motion analysis and object tracking. These capacities will be useful for clutter suppression, target location and classification, platform motion compensation, target tracking, vehicle guidance, battlefield mapping and target damage assessment. These and all applications of 2-Normal segmentation could easily employ and integrate multi-sensor data and /or multi-scale image preprocessing for analysis in two dimensions, three dimensions, or time sequence.

关键词： Image segmentation Wavelets Image processing algorithms and systems Image analysis Image processing algorithm development Detection and tracking algorithms Motion analysis Nonlinear filtering Wavelet transforms

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LARGE AREA OPTICAL DESIGN RULE CHECKER FOR LOGIC PSM APPLICATION

LARGE AREA OPTICAL DESIGN RULE CHECKER FOR LOGIC PSM APPLICA...

引用

1st International Symposium on Photomask and X-Ray Mask Technology (Photomask Japan 94)

作者： NISTLER, JL SPENCE, C BAROUCH, E HOLLEBACH, U ADV MICRO DEVICES INC SUNNYVALECA

ISBN: (纸本)0819415634

An aerial optical design rule checker (ODRC) that will handle large areas is used to validate the automatic CAD software used for application of alternating Phase Shift Mask technology to logic devices. An automatic alternating aperture layout algorithm developed internally by Advanced Micro Devices is applied to 0.24 to 0.50 micrometers electrical designs. The layout is then verified for different stepper and defocus values by the ODRC which utilizes the simulated aerial image to compare directly to the electrical design database. Entire databases are handled by fracturing the database into optically isolated areas or by using a sliding window technique. Small areas up to 420 um per side can be done with single processor workstations with at least 512 megabyte of memory. Larger problems require multiprocessor computers with at least 16 gigabyte of memory. Full circuit analysis should be done on systems with at least 64 gigabyte of memory in order to accomplish solving the problem in a reasonable time frame.

关键词： Photomasks Computer aided design Image processing Optical design Databases Logic X-ray technology Logic devices algorithm development Computing systems

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DETECTION OF LINEAR FEATURES IN IMAGES USING RADON AND HOUGH TRANSFORMS 3

DETECTION OF LINEAR FEATURES IN IMAGES USING RADON AND HOUGH...

引用

Conference on Signal Processing, Sensor Fusion, and Target Recognition III

作者： LIU, J STEWART, C GEORGE MASON UNIV SCH INFORMAT TECHNOL & ENGNFAIRFAXVA 22030

ISBN: (纸本)0819415367

Two algorithms were developed to detect linear or quasi-linear feature in images, one using the windowed Radon transform, and the other using the Hough transfrom. Two images from different types of sensors and with different features were processed using the two algorithms, and the results are compared with each other. The algorithm of the Radon transform yielded a reasonable noise reduction, and retained the major linear features. While using the Hough transform, linear feature plots containing different sets of line segments by taking different combinations of thresholds can be obtained.

关键词： Hough transforms Radon algorithm development Radon transform Denoising Detector development Image processing Image segmentation Sensors

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FULLY-AUTOMATIC VENTRICLE DETECTION FROM CARDIAC MR-IMAGES USING MACHINE LEARNING

FULLY-AUTOMATIC VENTRICLE DETECTION FROM CARDIAC MR-IMAGES U...

引用

Conference on Image Processing

作者： WENG, J SINGH, A CHIU, MY MICHIGAN STATE UNIV DEPT COMP SCIE LANSINGMI 48824

ISBN: (纸本)081941462X

The objective of this work is to develop a technique that is reliable, adaptive, versatile to solve the problem of region detection for a relatively wide class of medical images. Learning is essential in approaching this objective. In order to fully use the properties of the medical images and obtain a high efficiency, we compute a binary visual attention map which contains the region of interest as well as other things. The learning takes place in two stages: (1) learning for automatic selection of threshold values; (2) learning for automatic selection of the region of interest from candidate regions in the attention map. The result from the second stage is evaluated based on a learned cost measure and the outcome is fed back to the first stage when necessary. This feedback enhances the reliability of the entire system. Experiments have been conducted to approximately locate the endocardium boundaries of the left and right ventricles from gradient-echo MR images.

关键词： Magnetic resonance imaging Image processing Medical imaging Image segmentation 3D modeling 3D image processing Computing systems Machine learning algorithm development Binary data

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