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检索条件"主题词=Algorithm development"

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development of a composite UAV wing test-bed for structural health monitoring research

Development of a composite UAV wing test-bed for structural ...

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Conference on Health Monitoring of Structural and Biological Systems

作者： Oliver, J. A. Kosmatka, J. B. Farrar, Charles R. Park, Gyuhae Univ Calif San Diego Dept Struct Engn 9500 Gilman Dr La Jolla CA 92903 USA Los Alamos Natl Lab Engn Inst Los Alamos NM 87545 USA

ISBN: (纸本)9780819466532

In order to facilitate damage detection and structural health monitoring (SHM) research for composite unmanned aerial vehicles (UAV) a specialized test-bed has been developed. This test-bed consists of four 2.61 m all-composite test-pieces emulating composite UAV wings, a series of detailed finite element models of the test-pieces and their components, and a dynamic testing setup including a mount for simulating the cantilevered operation configuration of real wings. Two of the wings will have bondline damage built in;one undamaged and one damaged wing will also be fitted with a range of embedded and attached sensors-piezoelectric patches, fiber-optics, and accelerometers. These sensors will allow collection of realistic data;combined with further modal testing they will allow comparison of the physical impact of the sensors on the structure compared to the damage-induced variation, evaluation of the sensors for implementation in an operational structure, and damage detection algorithm validation. At the present time the pieces for four wings have been fabricated and modally tested and one wing has been fully assembled and re-tested in a cantilever configuration. The component part and assembled wing finite element models, created for ***, have been correlated to their respective structures using the modal information. This paper details the design and manufacturing of the test-pieces, the finite element model construction, and the dynamic testing setup. Measured natural frequencies and mode shapes for the assembled cantilevered wing are reported, along with finite element model undamaged modal response, and response with a small disbond at the root of the top main spar-skin bondline.

关键词： Sensors Unmanned aerial vehicles Skin Structural health monitoring Composites Data modeling Finite element methods Assembly equipment algorithm development Damage detection

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development OF THE SOFTWARE GASO FOR ANALYSIS OF BEAM PROFILE ON THE LASER-BEAM PRINTER

DEVELOPMENT OF THE SOFTWARE GASO FOR ANALYSIS OF BEAM PROFIL...

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Conferences on High-Resolution Cameras and Recording Devices, and Laser Scanning and Recording Systems

作者： YAMADA, O NANBA, K MINOLTA CAMERA CO LTD DIV REPROGR PROD DEV 1TOYOKAWAAICHIJAPAN

ISBN: (纸本)0819412368

In the optical design of laser beam printers, it is very important to know the spread function of the beam across the photoconductors. With the usual method, however, we cannot determine the spread function directly, but rather we have to infer it from the optical aberration in the system and the shape of the beam assuming no aberrations. The fundamental method to simulate the point spread function has already been described. In it, the pupil function is defined assuming irregular illumination deviation of the wave front. Fraunhofer diffraction is then applied. A thorough investigation of the method has not yet been performed, however. We developed an algorithm based on the above method and created a program which determines the laser distribution over the photoconductors taking into consideration the influence of both optical aberrations and truncation by the optical pupil. Experimental values agree well with the calculated values, confirming the efficiency of the program. With this method and software, evaluation of the influence of the pupil and aberrations in the optical system on an elliptical Gaussian beam have become possible.

关键词： Software development Printing algorithm development Far-field diffraction Optical aberrations Point spread functions Ray tracing Beam analyzers Gaussian beams Wavefronts

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TECHNIQUE FOR THE MEASUREMENT OF THE IN-SITU development RATE 8

TECHNIQUE FOR THE MEASUREMENT OF THE IN-SITU DEVELOPMENT RAT...

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Conference on IC Inspection, Metrology, and Process Control VIII, at the SPIE Microlithography 1994 Symposium

作者： DRENNAN, PG SMITH, BW ALEXANDER, D MOTOROLA INC TEMPEAZ 85284

ISBN: (纸本)0819414913

Using a site services development spray monitor (DSM 100) and a post processing algorithm, the in-situ measured development rates of photoresist were obtained. The interference signals for eight different wavelengths were simultaneously monitored on a patterned wafer as it spun on the development module of a wafer track. Since the interference signal is generated from a circularly polarized light source, the DSM 100 has demonstrated robustness to the red cloud effect, developer spray, bubbles in the developer, and ambient light. After collecting the eight interference curves, these post processing algorithms used the Marquardt Levenberg non- linear regression algorithm and a linear regression approach to find the development rate as a function of development time. The first approach generated the better curve. A plot of development rate versus depth was generated via numerical integration of the plot of development rate versus time. This technique is equally well suited for other types of exposure and resist chemistries.

关键词： algorithm development Photoresist developing Semiconducting wafers Clouds Light Light sources Numerical integration Photoresist materials Resist chemistry Signal generators

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Method of easily extracting resist development parameters for lithography simulation

Method of easily extracting resist development parameters fo...

引用

Conference on Optical Microlithography IX

作者： Lucas, KD Ivin, VV Kudrja, VP Larin, DY Makhviladze, TM Medvedeva, MG Rogov, AA Verzunov, SV Yang, DC MOTOROLA INC ADV PROD RES & DEV LABAUSTINTX 78721

ISBN: (纸本)0819421022

We present a description of a software tool and a methodology for easily creating photoresist development rate parameters in lithography simulation. The tool optimizes parameters using the Modified Simplex Method. The methodology uses the tool to provide insight into the effects of the development rate parameters and to find usable parameters quickly. The reasonings behind the methodology are discussed as well as advantages and disadvantages. Results from three different lithography simulators are shown to agree well with experimental cross-section SEM data.

关键词： Lithography Diffusion Photoresist developing Photoresist materials 3D modeling algorithm development Picture Archiving and Communication System Radon Scanning electron microscopy Software development

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Simulation of vehicle acoustics in support of netted sensor research and development

Simulation of vehicle acoustics in support of netted sensor ...

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Conference on Unattended Ground Sensor Technologies and Applications VII

作者： Christou, CT Jacyna, GM Mitre Corp Dept W407 Mclean VA 22102 USA

ISBN: (纸本)0819457817

The MITRE Corporation has initiated a three-year internally-funded research program in netted sensors, the first-year effort focusing on vehicle detection for border monitoring. An important component is developing an understanding of the complex acoustic structure of vehicle noise to aid in netted sensor-based detection and classification. This presentation will discuss the design of a high-fidelity vehicle acoustic simulator to model the generation and transmission of acoustic energy from a moving vehicle to a collection of sensor nodes. Realistic spatially-dependent automobile sounds are generated from models of the engine cylinder firing rates. muffler and manifold resonances, and speed-dependent tire whine noise. Tire noise is the dominant noise source for vehicle speeds in excess of 30 miles per hour (MPH). As a result, we have developed detailed models that successfully predict the tire noise spectrum as a function of speed, road surface wave-number spectrum, tire geometry, and tire tread pattern. We have also included realistic descriptions of the spatial directivity patterns for the engine harmonics, muffler, and tire whine noise components. The acoustic waveforms are propagated to each sensor node using a simple phase-dispersive mufti-path model. A brief description of the models and their corresponding outputs is provided.

关键词： Sensors Acoustics Roads Fourier transforms Kinematics Bandpass filters Wave propagation algorithm development Doppler effect Motion models

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Low Cost MATLAB-Based Pulse Oximeter for Deployment in Research and development Applications

Low Cost MATLAB-Based Pulse Oximeter for Deployment in Resea...

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35th Annual International Conference of the IEEE-Engineering-in-Medicine-and-Biology-Society (EMBC)

作者： Shokouhian, M. Morling, R. C. S. Kale, I. Univ Westminster Appl DSP & VLSI Res Grp Elect Network & Comp Engn Dept London W1R 8AL England Univ Westminster Appl DSP & VLSI Res Grp Dept Westminster London W1R 8AL England

ISBN: (纸本)9781457702167

Problems such as motion artifact and effects of ambient lights have forced developers to design different signal processing techniques and algorithms to increase the reliability and accuracy of the conventional pulse oximeter device. To evaluate the robustness of these techniques, they are applied either to recorded data or are implemented on chip to be applied to real-time data. Recorded data is the most common method of evaluating however it is not as reliable as real-time measurements. On the other hand, hardware implementation can be both expensive and time consuming. This paper presents a low cost MATLAB-based pulse oximeter that can be used for rapid evaluation of newly developed signal processing techniques and algorithms. Flexibility to apply different signal processing techniques, providing both processed and unprocessed data along with low implementation cost are the important features of this design which makes it ideal for research and development purposes, as well as commercial, hospital and healthcare application.

关键词： pulse oximeter pc-based algorithm development MATLAB

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Recent advances in the development of a novel aerosol sorting and deposition system for bio-threat sensing applications

Recent advances in the development of a novel aerosol sortin...

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Conference on Electro-Optical Remote Sensing, Detection, and Photonic Technologies and Their Applications

作者： Pletcher, Timothy McGinn, Joseph Keller, David Huston, Alan Eversole, Jay Sivaprakasum, Vasanthi Sarnoff Corp 201 Washington Rd Princeton NJ 08540 USA Naval Res Lab Washington DC 20375 USA

ISBN: (纸本)9780819468970

Sarnoff Corporation and the Naval Research Laboratory, through support of the U.S. Department of Homeland Security, are developing an automated, high throughput bio-aerosol physical enrichment system designed for use as part of a biological-threat protection system. The Biological Aerosol-Capture-Enrichment (BioACE) system is a bio-aerosol collection system that combines three unique technologies to create physically enriched aerosol samples that can be subsequently interrogated by any number of bio-threat detection systems for the presence of threat agents. An air-to-air concentrator uses an inertial separation technique to highly concentrate an aerosol sample presented to a dual wavelength ultra-violet laser induced fluorescence (UVLIF) optical trigger used to discriminate potential threat particles from non-threat particles conveyed in a collimated particle stream. This particle classification information is used to trigger an electrostatic deposition mechanism to deposit only those particles determined to be potential bio-threats onto a stainless steel substrate. Non-threat particles are discarded with the exiting airflow. The goal for the most recent development effort has been the integration and optimization of these technologies into a unit capable of producing highly enriched particulate samples from ambient air containing variable background aerosol loading and type. Several key technical and engineering challenges were overcome during the course of this development including a unique solution for compensating particle velocity dispersion within the airflow, development of a real-time signal acquisition and detection algorithm for determining material type on a particle by particle basis at rates greater than 2000 particles per second, and the introduction of a robust method for transferring deposited particulate into a 50ul wet sample suitable for most advanced bio-detection techniques. This paper will briefly describe the overall system architecture and

关键词： Particles Atmospheric particles algorithm development Aerosols Signal processing Ultraviolet radiation Near infrared Solar concentrators Crystals Luminescence

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ELECTROPHOTOGRAPHIC PROCESS-CONTROL SYSTEMS UTILIZING development BIAS CURRENTS

ELECTROPHOTOGRAPHIC PROCESS-CONTROL SYSTEMS UTILIZING DEVELO...

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CONF ON HARD COPY AND PRINTING MATERIALS, MEDIA, AND PROCESSES

作者： FOLKINS, JJ Xerox Corp. (United States)

ISBN: (纸本)0819403008

Both electrostatic and toner concentration (TC) electrophotographic process control systems can be constructed with the proper use of bias current measurements of the development subsystem. A TC I developability controller can be made by measuring the development bias current for each print or copy, summing the measurements, subtracting offset currents and dispensing toner proportionally to this developed charge measurement. If certain constraints are fulfilled, the system will operate at a constant developed toner mass. Similarly, a photoconductor electrostatic measurement I control system can be made by utilizing bias currents. This is accomplished by choosing a stable portion on the developed charge vs development voltage relationship of the development subsystem. This setpoint is then used to measure photoconductor test patch voltages by monitoring the bias current. In some cases this provides the same function as an electrostatic voltmeter. These low cost techniques enable the practical process control implementations in low and medium speed electrophotographic machines.

关键词： Control systems algorithm development Process control Printing Materials processing Photoresistors Magnetism Sensing systems Reliability

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Industry-university microassembly development initiatives

Industry-university microassembly development initiatives

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Conference on Education in Microelectronics and MEMS

作者： Stephanou, HE Winther, KT Mehalso, R Rensselaer Polytech Inst Ctr Automat Technol Troy NY 12180 USA

ISBN: (纸本)0819434957

The Center for Automation Technologies (CAT) at Rensselaer Polytechnic Institute is pioneering a novel model of industryuniversity collaboration. The model is built around the fundamental principle that education, research, and economic development must be tightly integrated into a program that provides first-rate responsiveness to the synergistic needs of its two major constituencies: graduate students and corporate clients.

关键词： Microsystems Computed tomography Manufacturing Microelectromechanical systems Packaging Prototyping algorithm development Sensors Silicon Micromachining

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development of a new defect sensitivity monitor for advanced OPC reticle technology

Development of a new defect sensitivity monitor for advanced...

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15th European Conference on Mask Technology for Integrated Circuits and Microcomponents

作者： Staud, W Eran, Y Reynolds, P Sager, C PDC Grp Appl Mat Santa Clara CA USA

ISBN: (纸本)0819431397

Latest trends in optical lithography will dramatically change the way we need to look at defect printability and the impact that defects have on the performance of our devices. The prediction is, that linewidth variations will have the most severe impact, causing devices to perform under specification, or at least costing the manufacturers substantial photo limited yield by having to bin die in lower speed performance bins. A mask error enhancement factor [ MEEF ] may actually make defects print more severe in certain pattern context, and linewidth variations across the plate will cause severe problems in the device manufacturing process to maintain ACLV [ across chip linewidth variations ] at an acceptable level. Having to use RET technologies, such as OPC and PSM, may actually aggravate the printability problems. In this study, a special reticle design was used to investigate defect size, location and permutation, to evaluate: defect sensitivity and capture in an advanced reticle inspection system, printability prediction using a sophisticated wafer image simulation software package, printability of 'traditional' vs. hidden linewidth error defects, the true CD impact of a given defect on LW performance using an advanced CD-SEM.

关键词： Optical proximity correction Reticles Inspection Photomasks Manufacturing Semiconducting wafers Resolution enhancement technologies Sensors algorithm development Critical dimension metrology

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