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32nd Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

作者： Malan, Nicholas A. Das, Sunil R. Biswas, Satyendra N. Assaf, Mansour H. Morton, Scott Petriu, Emil M. Groza, Voicu Troy Univ Coll Arts & Sci Dept Comp Sci Montgomery AL 36103 USA Univ Ottawa Fac Engn Sch Informat Technol & Engn Ottawa ON K1N 6N5 Canada Ahsanullah Univ Sci & Technol Dept Elect & Elect Engn Dhaka 1208 Bangladesh USP Dept Elect & Elect Engn Suva 19128 Fiji

ISBN: (纸本)9781479961139

Implementing aliasing-free (zero-aliasing) space compressors for built-in self-testing of very large scale integration circuits and systems is of great significance, especially in view of the technological paradigm shift in recent years from system-on-board to system-on-chip design. This paper investigates and provides new approach to realizing aliasing-free elementary-tree space compaction hardware targeting specifically embedded cores-based system-on-chips for single stuck-line faults, extending well-known concept from conventional switching theory, viz. that of compatibility relation as used in the minimization of incompletely specified sequential machines. For a pair of response data outputs of the circuit under test, the paper introduces the notion of fault detection compatibility and conditional fault detection compatibility (conditional upon some other response output pair being simultaneously fault detection compatible) with respect to two-input AND/NAND and XOR/XNOR logic. The process is illustrated in the paper with details of synthesis of space compressors for the International Symposium on Circuits and Systems (ISCAS) 85 combinational and ISCAS 89 full-scan sequential benchmark circuits using fault simulation programs ATALANTA, FSIM and HOPE, exemplifying the relevance of the technique from the standpoint of simplicity, resultant low area overhead and full fault coverage for single stuck-line faults, making it thus a logical choice in commercial design environments.

关键词： built-in self-testing in very large scale integration cores-based system-on-chips fault detection compatibility and conditional fault detection compatibility space compression

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Cascade of Two-Input Nonlinear Logic in Designing Space Compression Networks in VLSI

Cascade of Two-Input Nonlinear Logic in Designing Space Comp...

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IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

作者： Das, Sunil R. Hossain, Altaf Groza, Voicu Assaf, Mansour H. Univ Ottawa Fac Engn Sch Informat Technol & Engn Ottawa ON K1N 6N5 Canada Univ Troy Coll Arts & Sci Dept Comp Sci Montgomery AL 36103 USA Univ South Pacific Sch Engn & Phys Fac Sci & Technol Suva Fiji

ISBN: (纸本)9781424479351

Realizing aliasing-free space compressor for built-in self-testing of very large scale integration circuits and systems is of immense practical significance, especially due to the design paradigm shift in recent years from system-on-board to system-on-chip. This paper explores and provides new results on extending the scope of a recently developed approach to synthesizing aliasing-free space compaction hardware targeting particularly embedded cores-based system-on-chips for single stuck-line faults, utilizing well known concept from conventional switching theory, viz. that of compatibility relation as used in the minimization of incompletely specified sequential machines. For a pair of response outputs of the circuit under test, the method uses the notion of fault detection compatibility and conditional fault detection compatibility ( conditional upon some other response output pair being simultaneously fault detection compatible) with respect to two-input AND/NAND nonlinear logic. The process is illustrated with development details of space compressors for the International Symposium on Circuits and Systems or ISCAS 85 combinational and ISCAS 89 full-scan sequential benchmark circuits ( results on full-scan sequential circuits though not included in the paper) using simulation programs ATALANTA and FSIM, showing the relevance of the technique from the viewpoint of simplicity, resultant low area overhead and full fault coverage for single stuck-line faults, thereby making it an ideal choice in actual design environments.

关键词： Aliasing-free space compaction ATALANTA built-in self-testing in very large scale integration fault detection and conditional fault detection compatibility FSIM system-on-chips

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Response compression in space with cascade of two-input linear and nonlinear logic

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WORLD JOURNAL OF ENGINEERING 2013年第3期10卷 283-295页

作者： Das, Sunil R. Applegate, Alexander R. Biswas, Satyendra N. Petriu, Emil M. Univ Ottawa Sch Informat Technol & Engn Fac Engn Ottawa ON K1N 6N5 Canada Troy Univ Coll Arts & Sci Dept Comp & Informat Sci Montgomery AL 36103 USA Independent Univ Sch Engn & Comp Sci Dhaka 1329 Bangladesh

The design of aliasing-free space support hardware for built-in self-testing in very large scale integration circuits and systems is of immense significance, specifically due to the design paradigm shift in recent years from system-on-board to system-on-chip. This paper discusses approach to realizing aliasing-free space compaction hardware targeting particularly embedded cores-based system-on-chips for single stuck-line faults, extending well-known concept from conventional switching theory, viz. that of compatibility relation as used in the minimization of incompletely specified sequential machines. For a pair of response outputs of the circuit under test, the method introduces the notion of fault detection compatibility and conditional fault detection compatibility (conditional upon some other response output pair being simultaneously fault detection compatible) with respect to two-input AND/NAND, OR/NOR and XOR/XNOR logic, respectively. The process is illustrated with design details of space compactors for the International Symposium on Circuits and Systems or ISCAS 85 combinational (and ISCAS 89 full-scan sequential) benchmark circuits using simulation programs ATALANTA and FSIM, attesting to the relevance of the technique from the viewpoint of simplicity, resultant low area overhead and full fault coverage for single stuck-line faults, thereby making it an appropriate choice in commercial design environments.

关键词： Aliasing-free space compaction ATALANTA built-in self-testing in very large scale integration Fault detection and conditional fault detection compatibility FSIM

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Cascade of two-input nonlinear logic in designing space compression networks in VLSI

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WORLD JOURNAL OF ENGINEERING 2012年第3期9卷 199-206页

作者： Das, Sunil R. Biswas, Satyendra N. Groza, Voicu Assaf, Mansour H. Univ Ottawa Fac Engn Sch Informat Technol & Engn Ottawa ON K1N 6N5 Canada Troy Univ Coll Arts & Sci Dept Comp Sci Montgomery AL 36103 USA Independent Univ Sch Engn & Comp Sci Dhaka 1329 Bangladesh USP Fac Sci & Technol Suva Fiji

Realizing aliasing-free space compressor for built-in self-testing of very large scale integration circuits and systems is of immense practical significance, especially due to the design paradigm shift in recent years from system-on-board to system-on-chip. This paper explores and provides new results on extending the scope of a recently developed approach to synthesizing aliasing-free space compaction hardware targeting particularly embedded cores-based system-on-chips for single stuck-line faults. For a pair of response outputs of the circuit under test, the method uses the notion of fault detection compatibility and conditional fault detection compatibility (conditional upon some other response output pair being simultaneously fault detection compatible) with respect to two-input AND/NAND nonlinear logic. The process is illustrated with development details of space compressors for the International Symposium on Circuits and Systems or ISCAS 85 combinational and ISCAS 89 full-scan sequential benchmark circuits (results on full-scan sequential circuits though not included in the paper) using simulation programs ATALANTA and FSIM, showing the relevance of the technique from the viewpoint of simplicity, resultant low area overhead and full fault coverage for single stuck-line faults, thereby making it an ideal choice in actual design environments.

关键词： Aliasing-free space compaction ATALANTA built-in self-testing in very large scale integration Fault detection and conditional fault detection compatibility FSIM

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Designing Elementary-Tree Space Compressors Using AND/NAND and XOR/XNOR Combinations

Designing Elementary-Tree Space Compressors Using AND/NAND a...

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IEEE International Instrumentation and Measurement Technology Conference

作者： Nicholas A. Malan Sunil R. Das Satyendra N. Biswas Mansour H. Assaf Scott Morton Emil M. Petriu Voicu Groza Department of Computer Science College of Arts and Sciences Troy University Montgomery AL 36103 USA Department of Electrical and Electronic Engineering Ahsanullah University of Science and Technology Dhaka 1208 Bangladesh Department of Electrical and Electronic Engineering University of the South Pacific (USP) Suva 19128 Fiji School of Information Technology and Engineering Faculty of Engineering University of Ottawa Ottawa ON K1N 6N5 Canada

ISBN: (纸本)9781479961153

关键词： built-in self-testing in very large scale integration cores-based system-on-chips fault detection compatibility and conditionalfault detection compatibility space compression

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