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检索条件"主题词=CMOS Logic Circuits"
4527 条 记 录,以下是581-590 订阅
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A pure logic cmos based low power non-volatile random access memory for RFID application
A pure logic CMOS based low power non-volatile random access...
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International Conference on ASIC
作者: Yaru Yan Dong Wu Huijuan Liu Liyang Pan Jun Xu Institute of Microelectronics Tsinghua University Beijing China Institute of Microelectronics Tsinghua National Laboratory for Information Science and Technology Tsinghua University Beijing China
A 1.8V, 0.18 ¿m pure logic cmos based low power non-volatile random access memory for RFID application is developed in this paper. Low power consumption is achieved based on a novel two-dimension architecture and... 详细信息
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FPGA Implementation of a Decimal Floating-Point Accurate Scalar Product Unit with a Parallel Fixed-Point Multiplier
FPGA Implementation of a Decimal Floating-Point Accurate Sca...
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International Conference on Reconfigurable Computing and FPGAs (ReConFig)
作者: Malte Baesler Thomas Teufel Institute for Reliable Computing Hamburg University of Technology Hamburg Germany
Decimal floating point (DFP) operations are very important for applications, that cannot tolerate errors from conversions between binary and decimal formats, for instance scientific, commercial, financial and internet... 详细信息
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Multiobjective optimization for transistor sizing of cmos logic standard cells using set-oriented numerical techniques
Multiobjective optimization for transistor sizing of CMOS lo...
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Norchip
作者: Matthias Blesken Ulrich Rückert Dominik Steenken Katrin Witting Michael Dellnitz System and Circuit Technology University of Paderborn Germany Applied Mathematics University of Paderborn Germany
The design of resource efficient integrated circuits (IC) requires solving a minimization problem of more than one objective given as measures of available resources. This multiobjective optimization problem (MOP) can... 详细信息
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High performance 16-bit MCML multiplier
High performance 16-bit MCML multiplier
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European Conference on Circuit Theory and Design, ECCTD
作者: Yavuz Delican Avni Morgul Electrical Engineering Department Bogazici University Istanbul Turkey Electrical & Communications Engineering Department Bilkent University Istanbul Turkey
This paper presents a high performance 16times16 bit 2's complement multiplier using MOS current mode logic (MCML). A small library of MCML logic gates consisting of NAND/AND, XOR/XNOR, MUX and full adder are desi... 详细信息
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Analysis and design of ultra-low power subthreshold MCML gates
Analysis and design of ultra-low power subthreshold MCML gat...
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IEEE International Symposium on circuits and Systems (ISCAS)
作者: Massimo Alioto Yusuf Leblebici Department of Information Engineering University of Sienna Siena Italy Microelectronic Systems Laboratory Ecole Polytechnique Fédérale de Lausanne Lausanne Switzerland
In this paper, ultra-low power current-mode subthreshold MOS current-mode logic (MCML) gates are discussed from a modeling and design perspective. A detailed analysis of the DC characteristics is presented, and the ef... 详细信息
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Design and reliability of a micro-relay technology for zero-standby-power digital logic applications
Design and reliability of a micro-relay technology for zero-...
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International Electron Devices Meeting (IEDM)
作者: Hei Kam Vincent Pott Rhesa Nathanael Jaeseok Jeon Elad Alon Tsu-Jae King Liu Department of EECS University of California Berkeley CA USA
Micro-electro-mechanical (MEM) relays recently have been proposed for ultra-low-power digital logic applications because their ideal switching behavior can potentially allow the supply voltage (V DD ) to be scaled dow... 详细信息
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Towards a balanced ternary FPGA
Towards a balanced ternary FPGA
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IEEE International Conference on Field-Programmable Technology (FPT)
作者: Paul Beckett Electrical & Computer Engineering RMIT University Melbourne Australia
We propose and analyze an organization for a field-programmable gate array structure that operates using a balanced ternary logic system where the logic set {±1, 0} maps directly to equivalent voltage levels {... 详细信息
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Evaluation of energy-recovering interconnects for low-power 3D stacked ICs
Evaluation of energy-recovering interconnects for low-power ...
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IEEE International Conference on 3D System Integration, 3DIC
作者: P. Asimakopoulos G. Van der Plas A. Yakovlev P. Marchal School of EECE Newcastle University UK IMEC Belgium
Energy-recovering schemes have been proposed in the literature as an alternative approach to low-power design, while their performance has been demonstrated to be extremely promising when driving large capacitive load... 详细信息
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Integration of tall triple-gate devices with inserted-Ta/sub x/N/sub y/ gate in a 0.274/spl mu/m/sup 2/ 6T-SRAM cell and advanced cmos logic circuits
Integration of tall triple-gate devices with inserted-Ta/sub...
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Symposium on VLSI Technology
作者: L. Witters N. Collaert A. Nackaerts M. Demand S. Demuynek C. Delvaux A. Lauwers C. Baerts S. Beckx W. Bouilart S. Brus B. Degroote J.F. de Marneffe A. Dixit K. De Meyer M. Ercken M. Goodwin E. Hendrickx N. Heylen P. Jaenen D. Laidler P. Leray S. Locorotondo M. Maenhoudt M. Moclants I. Pollentier K. Ronse R. Rooyackers J. Van Aelst G. Vandenberghe T. Vandeweyer S. Vanhaelemeersch M. Van Hove J. Van Olmen S. Verhaegen J. Versluijs C. Vrancken V. Wiaux P. Willems J. Wouters M. Jurezak S. Biesemans IMEC Leuven Belgium Interuniversitair Micro-Elektronica Centrum Leuven Vlaams-Brabant BE K.U.Leuven ESAT-INSYS Heverlee Belgium Texas Instruments Inc. Dallas TX USA Philips Research Leuven Leuven Belgium
We present the fabrication process of a fully functional 0.274/spl mu/m2 6T-SRAM cell with inserted-Ta/sub x/N/sub y/ tall tripple gate devices. Several advancements over our previous report by A. Naekaerts et al. (20... 详细信息
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Electric field for detecting open leads in cmos logic circuits by supply current testing
Electric field for detecting open leads in CMOS logic circui...
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IEEE International Symposium on circuits and Systems (ISCAS)
作者: M. Hashizume M. Ichimiya H. Yotsuyanagi T. Tamesada Faculty of Engineering University of Tokushima Tokushima Japan
Open leads are one type of defect occurring frequently when logic circuits are implemented on printed circuit boards (PCBs) with ICs. A powerful supply current test method has been proposed for detecting an open lead ... 详细信息
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