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检索条件"主题词=Compact binary differential evolution algorithm"
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Automated Functional Test Generation for Digital Systems Through a compact binary differential evolution algorithm
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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2015年 第4期31卷 361-380页
作者: Martinez Cruz, Alfonso Barron Fernandez, Ricardo Molina Lozano, Heron Ramirez Salinas, Marco Antonio Villa Vargas, Luis Alfonso Ctr Res Comp CIC IPN Mexico City 07738 DF Mexico
At present, the functional verification of a device represents the highest cost during manufacturing. To reduce that cost, several methods have been suggested. In this work we propose a method which produces a set of ... 详细信息
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