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检索条件"主题词=Computer debugging"
110 条 记 录,以下是61-70 订阅
排序:
BURIED CAPACITANCE TECHNOLOGY FOR POWER BUS DECOUPLING ON HIGH SPEED DIGITAL PCB's  14
BURIED CAPACITANCE TECHNOLOGY FOR POWER BUS DECOUPLING ON HI...
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14th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, EMC 2001
作者: Ricchiuti, V. Orlandi, A. Antonini, G. Siemens ICN L’Aquila Italy University of L’Aquila L’Aquila Italy
In the modern digital equipments, as the speed of the ASICs and the complexity of the PCBs increase, the electronic designers have to control the noise on the boards to avoid EMC and signal integrity problems. One of ... 详细信息
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Testing the Xbox game controller
EE-EVALUATION ENGINEERING
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EE-EVALUATION ENGINEERING 2001年 第11期40卷 16-19页
作者: Alexander, J Duraiappah, L Scarfe, D Microsoft Corp Redmond WA 98052 USA VI Engn Farmington Hills MI 48331 USA
Xbox is Microsoft's future-generation video-game console system that has been developed using National Instruments' LabVIEW, the PXI platform, and Windows 2000. This functional test station is reliable, flexib... 详细信息
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Real-time debugging & wireless devices
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Dr. Dobb's Journal 2001年 第3期26卷
作者: Gonzales, David Ruimy Branson, Brian Motorola's M-CORE Technology Cent
The system-on-chip (SOC) design methodologies were described for cellular products capable to interact with the Internet. The importance of SOC design methodologies was established by the IEEE-ISTO Nexus 5001 Forum. T... 详细信息
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Emerging on-chip debugging techniques for real-time embedded systems
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COMPUTING & CONTROL ENGINEERING JOURNAL 2000年 第6期11卷 295-303页
作者: MacNamee, C Heffernan, D Univ Limerick Dept Elect & Comp Engn Limerick Ireland Univ Limerick Area Fieldbus & Control Network Dev Res Grp Limerick Ireland
The increased clock frequencies and higher integration levels of today's high-performance embedded microcontrollers have led to the widespread incorporation of on-chip debugging logic into new microcontroller chip... 详细信息
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Efficient error detection, localization, and correction for FPGA-based debugging  00
Efficient error detection, localization, and correction for ...
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37th Annual Design Automation Conference (DAC)
作者: Lach, J Mangione-Smith, WH Potkonjak, M Univ Calif Los Angeles EE Dept Los Angeles CA 90095 USA
Simulations for modern designs are often performed on Field Programmable Gate Array technology in a functional test and debugging process known as emulation, allowing for more complex simulations than possible in soft... 详细信息
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Logic mapping on a microprocessor
Logic mapping on a microprocessor
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Proceedings International Test Conference
作者: Kinra, Anjali Balachandran, Hari Thomas, Regy Carulli, John Texas Instruments Inc Stafford United States
Improving debug techniques for logic failures is a constant imperative. This paper describes the results of implementing a logic mapping methodology that integrates in-line manufacturing defect data and scan-based dia... 详细信息
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Symbolic debugging scheme for optimized hardware and software
Symbolic debugging scheme for optimized hardware and softwar...
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IEEE/ACM International Conference on computer Aided Design (ICCAD)
作者: Koushanfar, Farinaz Kirovski, Darko Potkonjak, Miodrag Univ of California Los Angeles United States
Symbolic debuggers are system development tools that can accelerate the validation speed of behavioral specifications by allowing a user to interact with an executing code at the source level. In response to a user qu... 详细信息
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debugging standard for high-performance computing
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Scientific Programming 2000年 第2期8卷 95-108页
作者: Francioni, Joan M. Pancake, Cherri M. Winona State Univ Winona United States
Throughout 1998, the High Performance debugging Forum worked on defining a base level standard for high performance debuggers. The standard had to meet the sometimes conflicting constraints of being useful to users, r... 详细信息
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Hardware-driven profiling scheme for identifying program hot spots to support runtime optimization
Conference Proceedings - Annual International Symposium on C...
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Conference Proceedings - Annual International Symposium on computer Architecture, ISCA 1999年 136-147页
作者: Merten, Matthew C. Trick, Andrew R. George, Christopher N. Gyllenhaal, John C. Hwu, Wen-mei W. Univ of Illinois Urbana United States
This paper presents a novel hardware-based approach for identifying, profiling, and monitoring hot spots in order to support runtime optimization of general-purpose programs. The proposed approach consists of a set of... 详细信息
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Silicon debug: scan chains alone are not enough
Silicon debug: scan chains alone are not enough
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Proceedings of the 1999 ITC International Test Conference (ITC'99)
作者: van Rootselaar, Gert Jan Vermeulen, Bart Philips Research Lab Eindhoven Netherlands
For today's multi-million transistor designs, existing design verification techniques cannot guarantee that first silicon is designed error free. Therefore, techniques are necessary to efficiently debug first-sili... 详细信息
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