咨询与建议

限定检索结果

文献类型

  • 2 篇 会议
  • 1 篇 期刊文献

馆藏范围

  • 3 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 3 篇 工学
    • 2 篇 软件工程
    • 1 篇 电气工程
    • 1 篇 计算机科学与技术...

主题

  • 3 篇 data flow testin...
  • 3 篇 control flow tes...
  • 1 篇 variability mode...
  • 1 篇 component
  • 1 篇 reasoning
  • 1 篇 statistical usag...
  • 1 篇 data flow
  • 1 篇 mutation testing
  • 1 篇 program testing
  • 1 篇 software testing
  • 1 篇 software product...
  • 1 篇 white box testin...
  • 1 篇 activity diagram
  • 1 篇 testing techniqu...

机构

  • 1 篇 mohyal educ & re...
  • 1 篇 daejeon univ col...
  • 1 篇 korea adv inst s...
  • 1 篇 univ politecn ma...
  • 1 篇 new delhi inst m...
  • 1 篇 amity univ amity...

作者

  • 1 篇 juristo natalia
  • 1 篇 moreno ana
  • 1 篇 khatri sunil kum...
  • 1 篇 vegas sira
  • 1 篇 kang sungwon
  • 1 篇 kaur kamaldeep
  • 1 篇 shull forrest
  • 1 篇 lee jihyun
  • 1 篇 datta rattan

语言

  • 3 篇 英文
检索条件"主题词=Control Flow Testing"
3 条 记 录,以下是1-10 订阅
排序:
A Look at 25 Years of Data
收藏 引用
IEEE SOFTWARE 2009年 第1期26卷 15-17页
作者: Juristo, Natalia Moreno, Ana Vegas, Sira Shull, Forrest Univ Politecn Madrid E-28040 Madrid Spain
Is 25 years enough time to build up a coherent body of knowledge that can help point to useful principles? As a testbed for helping us answer this question, software testing techniques are a good place to start. Few s... 详细信息
来源: 评论
Applying Statistical Usage testing Along with White Box testing Techniques  50th
Applying Statistical Usage Testing Along with White Box Test...
收藏 引用
50th Annual Convention of the Computer-Society-of-India (CSI) on Digital Life
作者: Khatri, Sunil Kumar Kaur, Kamaldeep Datta, Rattan Amity Univ Amity Inst Informat Technol Noida India New Delhi Inst Management Dept Comp Sci New Delhi India Mohyal Educ & Res Inst Technol Delhi India
Cleanroom software engineering (CSE) reference model is a rigorous incremental model that focuses on defect prevention using sound mathematical principles combined with statistical usage testing (Linger, Trammell, in ... 详细信息
来源: 评论
A Systematic Product Line Test Derivation from Activity Diagrams
A Systematic Product Line Test Derivation from Activity Diag...
收藏 引用
IEEE 16th International Conference on Computational Science and Engineering (CSE)
作者: Kang, Sungwon Lee, Jihyun Korea Adv Inst Sci & Technol Dept Comp Sci Taejon 305701 South Korea Daejeon Univ Coll Liberal Arts Taejon South Korea
The state of the art software product line testing methods attempted test derivation from product lines modeled as activity diagrams (ADs) with the test coverage goals of control flow and data flow. However, the exist... 详细信息
来源: 评论