Programmed logic arrays [1], [2] are common in computer design. A form of this method of design has been used since the beginnings of computers, in telephone relay networks [3]. Optimization of such realizations of fu...
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Programmed logic arrays [1], [2] are common in computer design. A form of this method of design has been used since the beginnings of computers, in telephone relay networks [3]. Optimization of such realizations of functions were begun by Karnaugh [4], Quine [5], McCluskey [6], and Roth [7]. Substantial use was mnade of such programs by Preiss [8] and Perlman [9]. despite the existence of exact procedures, "fast," "approximate" procedures have been widely used. A new approximate procedure, using the d algorithm [1], [10], [11] is introduced here. It gets around a large computation, in complementation, using prior methods. Running programs "verify" this expectation.
The paper proposes fault diagnosis system that simplify circuit before using d algorithm, aiming at creating detection vector inefficient. Through simplifying circuit, the hour of creating detection vector is cut and ...
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ISBN:
(纸本)9783037855447
The paper proposes fault diagnosis system that simplify circuit before using d algorithm, aiming at creating detection vector inefficient. Through simplifying circuit, the hour of creating detection vector is cut and establishment of fault diagnosis databases is easy. This method is applied to diagnose fault of output circuit board on tank. In conclusion, this method of the fault diagnosis to circuit board orientates the fault accurately and quickly.
The optimal power flow (OPF) is an important tool for the secure and economic operation of the power system. It attracts many researchers to pay close attention. Many algorithms are used to solve the OPF problem. The ...
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The optimal power flow (OPF) is an important tool for the secure and economic operation of the power system. It attracts many researchers to pay close attention. Many algorithms are used to solve the OPF problem. The decomposition-based multi-objective algorithm (MOEA/d) is one of them. However, the effectiveness of the algorithmdecreases as the size of the power system increases. Therefore, an improved MOEA/d (IMOEA/d) is proposed in this paper to solve the OPF problem. The main goal of IMOEA/d is to speed up the convergence of the algorithm and increase species diversity. To achieve this goal, three improvement strategies are introduced. Firstly, the competition strategy between the barnacle optimization algorithm anddifferential evolution algorithm is adopted to overcome the reduced species diversity. Secondly, an adaptive mutation strategy is employed to enhance species diversity at the latter stage of iteration. Finally, the selective candidate with similarity selection is used to balance the exploration and exploitation capabilities of the proposed algorithm. Simulation experiments are performed on IEEE 30-bus and IEEE 57-bus test systems. The obtained results show that the above three measures can effectively improve the diversity of the population, and also demonstrate the competitiveness and effectiveness of the proposed algorithm for the OPF problem.
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause a sudden drop or rise in power supply voltage. This change is known as power droop and is an instance of power sup...
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Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause a sudden drop or rise in power supply voltage. This change is known as power droop and is an instance of power supply noise. Although power droop can cause an IC to fail, such failures cannot currently be screenedduring testing because they are not covered by conventional fault models. This article presents a technique for screening such failures. The authors propose a heuristic method to generate test sequences that create worst-case power drop by accumulating the high- and low-frequency effects. The authors employ a dynamically constrained version of the classical d-algorithm, which generates new constraints on the fly, for test generation. The obtained patterns can be used for manufacturing testing as well as for early silicon validation. The authors have implemented a prototype ATPG to demonstrate the feasibility of this approach, and they generate test sequences for ISCAS circuits.
Multi-objective evolutionary algorithm based on decomposition (MOEA/d) decomposes a multi-objective problem into a number of scalar optimization problems using uniformly distributed weight vectors. However, uniformly ...
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Multi-objective evolutionary algorithm based on decomposition (MOEA/d) decomposes a multi-objective problem into a number of scalar optimization problems using uniformly distributed weight vectors. However, uniformly distributed weight vectors do not guarantee uniformity of solutions on approximated Pareto-Front. This study proposes an adaptive strategy to modify these scalarizing weights after regular intervals by assessing the crowdedness of solutions using crowding distance operator. Experiments carried out over several benchmark problems with complex Pareto-Fronts show that such a strategy helps in improving the convergence anddiversity of solutions on approximated Pareto-Front. Proposed algorithm also shows better performance when compared with other state-of-the-art multi-objective algorithms over most of the benchmark problems.
This correspondence presents a test generation methodology for VLSI circuits described at the functional level. A VLSI circuit is modeled as a network of functional modules such as registers, adders, RAM"s, and M...
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This correspondence presents a test generation methodology for VLSI circuits described at the functional level. A VLSI circuit is modeled as a network of functional modules such as registers, adders, RAM"s, and MUX"s. The functions of the individual modules are described using binary decision diagrams. A functional fault model is developed independent of the implementation details of the circuit. A generalizedd algorithm is proposed for generating tests to detect functional as well as gate-level faults. algorithms which perform fault excitation, implication, d propagation, and line justification on the functional modules are also described.
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple...
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A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the d-algorithm, do not find any test although one exists.
This file introduces and compares some ATPG algorithms. Some method is presented to make these algorithm can be easily processed by computer, these method includes: In Boolean difference, the approach to get the logic...
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ISBN:
(纸本)7560317685
This file introduces and compares some ATPG algorithms. Some method is presented to make these algorithm can be easily processed by computer, these method includes: In Boolean difference, the approach to get the logic expression between output and input in circuit automatically, the approach to get test patterns from logic expression automatically, the approach to get pc(particle cube) from logic expression in d algorithm automatically.
Path Planning algorithms are indispensable in Autonomous Navigators. Though rover may not have prior information about the environment, path planning algorithms must be robust enough to navigate it to the target. A an...
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Path Planning algorithms are indispensable in Autonomous Navigators. Though rover may not have prior information about the environment, path planning algorithms must be robust enough to navigate it to the target. A andd are grid based Path Planning algorithms which enable to reach the target in shortest path. Cost computations are fixed in A algorithm while re- computations are done in d algorithm, whenever new obstacles are identified. A modified version of d algorithm is presented in this paper where cost re-computation is done based on certain criterion. By reducing the number of times cost re-computation occurs, Modifiedd aims to produce shortest path similar to d algorithm with less memory requirements and execution time. This paper also brings out the implementation of A, d and Modifiedd algorithms with NXT LEGO Mindstorms kit and their evaluation in real time scenario. Comparison of the above algorithms is elicited.
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