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检索条件"主题词=Data processing methods"
642 条 记 录,以下是301-310 订阅
排序:
A software system for rapid analysis of plastics using laser-induced breakdown spectroscopy
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JOURNAL OF INSTRUMENTATION 2020年 第4期15卷
作者: Liu, K. Tian, D. Yue, X. Yang, G. Jilin Univ Coll Instrumentat & Elect Engn 938 Ximinzhu Ave Changchun 130061 Peoples R China
With the extensive use of plastic products, the recycling and reuse of plastics raises more concerns. Laser-induced breakdown spectroscopy (LIBS) has become a powerful technology for plastic analysis. To meet differen... 详细信息
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Novel tracking approach based on fully-unsupervised disentanglement of the geometrical factors of variation
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JOURNAL OF INSTRUMENTATION 2020年 第3期15卷
作者: Vladymyrov, M. Ariga, A. Univ Bern Albert Einstein Ctr Fundamental Phys Lab High Energy Phys Sidlerstr 5 CH-3012 Bern Switzerland Univ Bern Theodor Kocher Inst Freiestr 1 CH-3012 Bern Switzerland Univ Bern Sci IT Support Sidlerstr 5 CH-3012 Bern Switzerland
Efficient tracking algorithms are a crucial part of particle tracking detectors. While a lot of work has been done in designing a plethora of algorithms, these usually require tedious tuning for each use case. (Weakly... 详细信息
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Coincidence time resolution investigation of BaF2-based H6610 detectors for a digital positron annihilation lifetime spectrometer
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JOURNAL OF INSTRUMENTATION 2020年 第6期15卷
作者: Ye, R. Zhao, Q. H. Wang, H. B. Gu, B. C. Pan, Z. W. Liu, J. D. Ye, B. J. Univ Sci & Technol China State Key Lab Particle Detect & Elect Hefei 230026 Peoples R China
BaF2-based detectors have been used in many fields requiring fast timing, especially in positron annihilation lifetime (PAL) spectroscopy. The performance of a PAL spectrometer is closely correlated with the time resp... 详细信息
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Multiple time-over-threshold readout electronics for fast timing and energy resolving in a SiPM-based positron annihilation lifetime spectrometer
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JOURNAL OF INSTRUMENTATION 2020年 第11期15卷
作者: Wang, H. B. Liu, J. D. Zhang, H. J. Liang, H. Ye, B. J. Univ Sci & Technol China State Key Lab Particle Detect & Elect Hefei 230026 Peoples R China
Fast timing and energy resolving capabilities are crucial for a silicon-photomultiplier-based positron annihilation lifetime (SiPM-PAL) spectrometer. Time-over-threshold (ToT) offers an attractive method for combining... 详细信息
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Parametrizing the detector response with neural networks
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JOURNAL OF INSTRUMENTATION 2020年 第1期15卷
作者: Cheong, S. Cukierman, A. Nachman, B. Safdari, M. Schwartzman, A. SLAC Natl Accelerator Lab Elementary Particle Phys Div 2575 Sand Hill Rd Menlo Pk CA 94025 USA Stanford Univ Dept Phys 450 Jane Stanford Way Stanford CA 94305 USA Lawrence Berkeley Natl Lab Div Phys 1 Cyclotron Rd Berkeley CA USA
In high energy physics, characterizing the response of a detector to radiation is one of the most important and fundamental experimental tasks. In many cases, this task is accomplished by parameterizing summary statis... 详细信息
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A spectral clustering based method for automatic plasma pattern identification in electron cyclotron emission imaging on EAST Tokamak
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JOURNAL OF INSTRUMENTATION 2020年 第7期15卷
作者: Zhu, Y. Xiao, J. Lan, T. Xie, J. Univ Sci & Technol China Sch Phys Sci Dept Engn & Appl Phys 96 Jinzhai Rd Hefei Peoples R China
Electron cyclotron emission imaging (ECEI) diagnostic system of Experimental Advanced Superconducting Tokamak (EAST) can provide two-dimensional electron temperature fluctuation on the cross section of the EAST Tokama... 详细信息
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Evaluation of dynamic spectrum extraction method based on salami slicing method
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INFRARED PHYSICS & TECHNOLOGY 2020年 111卷 103551-103551页
作者: Xiao, Qiuyue Li, Gang Yan, Wenjuan He, Guoquan Lin, Ling Tianjin Univ State Key Lab Precis Measurement Technol & Instru Tianjin 300072 Peoples R China Tianjin Univ China & Tianjin Key Lab Biomed Detecting Tech & I Tianjin 300072 Peoples R China Yangtze Normal Univ Sch Elect Informat Engn Chongqing 408100 Peoples R China
With the rapid development of computer technology, a variety of data processing methods are used to process more and more data. The evaluation of the quality of the data and the processing methods is an urgent problem... 详细信息
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Wasserstein distance based deep multi-feature adversarial transfer diagnosis approach under variable working conditions
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JOURNAL OF INSTRUMENTATION 2020年 第6期15卷
作者: She, D. Peng, N. Jia, M. Pecht, M. G. Southeast Univ Sch Mech Engn 79 Suyuan Ave Nanjing 211189 Peoples R China Univ Maryland Ctr Adv Life Cycle Engn CALCE 1104 Engn Lab Bldg College Pk MD 20742 USA
Intelligent mechanical fault diagnosis is a crucial measure to ensure the safe operation of equipment. To solve the problem that network features is not fully utilized in the adversarial transfer learning, this paper ... 详细信息
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Fast inference of Boosted Decision Trees in FPGAs for particle physics
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JOURNAL OF INSTRUMENTATION 2020年 第5期15卷
作者: Summers, S. Di Guglielmo, G. Duarte, J. Harris, P. Hoang, D. Jindariani, S. Kreinar, E. Loncar, V Ngadiuba, J. Pierini, M. Rankin, D. Tran, N. Wu, Z. CERN Esplanade Particules 1 CH-1211 Geneva 23 Switzerland Columbia Univ Dept Comp Sci 500 West 120 St New York NY 10027 USA Univ Calif San Diego Dept Phys 9500 Gilman Dr La Jolla CA 92093 USA MIT Dept Phys 77 Massachusetts Ave Cambridge MA 02139 USA Rhodes Coll Dept Phys 2000 North Pkwy Memphis TN 38112 USA Fermilab Natl Accelerator Lab POB 500 Batavia IL 60510 USA HawkEye360 Herndon VA 20170 USA Inst Phys Belgrade Pregrevica 118 Belgrade Serbia Univ Illinois Dept Phys W Taylor St Chicago IL 60607 USA
We describe the implementation of Boosted Decision Trees in the hls4ml library, which allows the translation of a trained model into FPGA firmware through an automated conversion process. Thanks to its fully on-chip i... 详细信息
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Detection of true Gaussian shaped pulses at high count rates
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JOURNAL OF INSTRUMENTATION 2020年 第6期15卷
作者: Kantor, M. Yu Sidorov, A., V Ioffe Inst Polytekhnicheskaya 26 St Petersburg Russia
A new true Gaussian digital shaper of detector pulses is analised for applications with soft X-ray spectrometers at the highest count rates. The true Gaussian shaper allows for shaping detector pulses into a symmetric... 详细信息
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