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26th Asia-Pacific Software Engineering Conference (APSEC)

作者： Syed-Mohamad, Sharifah Mashita Akhir, Nur Shazwani Md. Univ Sains Malaysia Sch Comp Sci George Town Malaysia

ISBN: (纸本)9781728146485

Pull-based software development is a distributed development model that offers an opportunity to review a pull request before it gets merged into the main repository. A pull request addresses new features, bug fixing, and maintenance issues submitted by both integrators or contributors. It appears that many empirical studies are conducted to discover how pull request evaluation is done, and to our knowledge, limited research exists for assessing release readiness of pull requests. Studies also reported that the failure rate of pull-requests rapidly increases when there are many forks created. It is therefore, questions worth exploring are whether the code review really contributing to the code quality, and how to determine the release readiness of pull requests? In our previous work, test and defect coverage-based analytics model (TDCAM) has been proven to be suitable to determine the readiness of releases for software that is rapidly evolving, in which this is also a characteristic of pull-based software development. In this paper, the TDCAM has been extended to include pull request coverage indicators. The proposed model, namely as SoReady and the visualization analysis presented herein has enabled five developers in a commercial setting to make informed and evidence- based decisions regarding the test status of each pull request and overall reliability of an open source software through a prototype dashboard.

关键词： Pull-based software development agile software release readiness pull requests test coverage defect coverage metrics test analytics

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Cell-Aware ATPG to improve defect coverage for FPGA IPs and next generation Zynq® MPSoCs 26

Cell-Aware ATPG to improve Defect Coverage for FPGA IPs and ...

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26th IEEE Asian Test Symposium (ATS)

作者： Potluri, Seetal Mathew, Aaron Nerukonda, Rambabu Hartanto, Ismed Toutounchi, Shahin Xilinx Asia Pacific Pte Ltd Singapore Singapore Xilinx Inc San Jose CA USA

ISBN: (纸本)9781538624371

The increased penetration of FPGAs into automotive applications demand stringent defect coverage levels for FPGA IPs. The increased use of FinFETs and the possible defects thereby, motivates the usage of cell-aware methods to improve the defect coverage levels ding testing. Simulation results on 16nm 30 million gate Zynq (R) MPSoC system demonstrate the effectiveness of top-off based cell-aware methods in terms of test coverage, pattern volume and ATPG runtime simultaneously. Silicon results on 20nm and 16nm Xilinx FinFET-based FPGAs show the effectiveness of cell-aware methods in catching test escapes.

关键词： FPGA IPs MPSoCs defect coverage Cell Aware Test Test Escapes

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Test and defect coverage Analytics Model for the Assessment of Software Test Adequacy 9

Test and Defect Coverage Analytics Model for the Assessment ...

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9th Malaysian Software Engineering Conference (MySEC)

作者： Haron, Nur Hafizah Syed-Mohamad, Sharifah Mashita Univ Sains Malaysia Sch Comp Sci George Town 11800 Malaysia

ISBN: (纸本)9781467382274

Software testing is an essential activity in software development process that has been widely used as a means of achieving software reliability and quality. Software practitioners rely on test coverage to decide whether software under test has achieved an acceptable level of reliability and can be released. The researchers in the field of software testing focus on defining meaningful test coverage as measures which are frequently used interchangeably with the notion of test adequacy criteria. Test and defect-based information are among widely used adequacy criteria in the literature. However, little work has been conducted into integrating the two important indicators from the analytics perspective. Therefore, in this paper, Test and defect coverage Analytics Model (TDCAM) is proposed. TDCAM provides an analytical view for practitioners to assess and validate the testing results. A case study has been conducted to reveal the practical implications of the proposed model. One of the findings shows that components with low branch coverage percentage tend to have more number of defects detected, in which supports previous work.

关键词： test adequacy criteria software testing test coverage defect coverage software analytics

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All Digital Low-Cost Built-in defect Testing Strategy for Operational Amplifiers with High coverage 28

All Digital Low-Cost Built-in Defect Testing Strategy for Op...

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28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)

作者： Sekyere, Michael Saikiran, Marampally Chen, Degang Iowa State Univ Dept Elect & Comp Engn Ames IA 50011 USA

ISBN: (数字)9781665473552

ISBN: (纸本)9781665473552

Backed by standards like ISO26262, achieving near 100% defect coverage is becoming a common reliability requirement in the ever-growing automotive industry. However, achieving high defect coverage in an analog circuit has been proven to be a difficult/expensive task even with sophisticated analog and digital testing circuitry. In this work, we present a simple design for testability (DfT) technique that achieves 98% defect coverage for operational amplifiers including Widlar current reference and biasing circuitry. Our robust testing method utilizes purely digital testing circuits and is extremely time-efficient reducing the test cost. The proposed method can be used both at production test and for on-line health monitoring post-deployment to detect zero-time and latent defects. Also, the digital nature of our method presents a way for defect localization through the recorded bit streams. In this work, we also introduce a simple method to detect defects in the Widlar current reference and the bias current circuit. We validate all our results using extensive transistor-level simulations in UMC65nm technology.

关键词： defect coverage on-line health monitoring operational amplifier DPPM

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A Comprehensive Framework for Counterfeit defect coverage Analysis and Detection Assessment

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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2014年第1期30卷 25-40页

作者： Guin, Ujjwal DiMase, Daniel Tehranipoor, Mohammad Univ Connecticut Dept ECE Storrs CT 06269 USA Honeywell Inc Morristown NJ USA

The increasing threat of counterfeit electronic components has created specialized service of testing, detection, and avoidance of such components. However, various types of counterfeit components - recycled, remarked, overproduced, defective, cloned, forged documentation, and tampered - pose serious threats to supply chain. Over the past few years, standards and programs have been put in place throughout the supply chain that outline testing, documenting, and reporting procedures. However, there is little uniformity in the test results among the various entities. Currently, there are no metrics for evaluating these counterfeit detection methods. In this paper, we have developed a detailed taxonomy of defects present in counterfeit components. Based on this taxonomy, a comprehensive framework has been developed to find an optimum set of detection methods considering test time, test cost, and application risks. We have also performed an assessment of all the detection methods based on the newly introduced metrics - counterfeit defect coverage, under-covered defects, and not-covered defects.

关键词： Counterfeit IC Detection methods Assessment defect coverage

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Analysis of the postoperative outcome of 81 cases of nasal reconstruction with direct closure

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DERMATOLOGIE 2024年第4期75卷 309-319页

作者： Arif, Nawa Hetjens, Svetlana Huebers, Corinne Felcht, Moritz Heidelberg Univ Klin Dermatol Venerol & Allergol Exzellenzzentrum Dermatol Mannheim Landes Bade Wu Univ Klinikum MannheimMed Fak Mannheim Heidelberg Germany Heidelberg Univ Abt Med Stat & Biomath Univ Klinikum Mannheim Med Fak Mannheim Heidelberg Germany Heidelberg Univ Zentrum Dermatochirurg St Josefskrankenhaus Heidelberg Akad LehrkrankenhausUniv Klinikum MannheimMed F Landhausstr 25 D-69115 Heidelberg Germany

Background: Direct wound closure (side-to-side closure) for closing nasal defects, is controversially discussed. Yet, data supporting one or the other are lacking. Material and method: An explorative, partly retrospective, partly prospective observational study including 81 patients was carried out for assessment of the operative results of after direct wound closure stretching rhinoplasty. The occurrence of complications, the esthetic result and influencing factors were examined. To assess the esthetic result the patient and observer scar assessment scale (POSAS) scores of patients and observers were determined. In both scores seven values were determined (1 point normal skin, 10 points worst imaginable scar). The individual values were added to give a total value (minimum 7-maximum 70). Results: After direct wound closure stretching rhinoplasty, 12 out of 81 patients (15%) developed complications, in 5 cases suture dehiscence, in 5 cases cyst formation, in 4 cases a wound infection and 2 patients developed cyst formation and a wound infection. All suture dehiscences occurred on the lower third of the nose. Most of the patients were satisfied and assessed the scar with an average total value of 13.4 +/- 7.07 (minimum 7, maximum 70, n = 42). In the individual assessments pain (1.14 +/- 0.57;minimum 1, maximum 10) was rated best and scar color (2.50 +/- 1.76;minimum 1, maximum 10) was rated worst. The total assessment in the observer-POSAS was also good with 12.9 +/- 4.8 (minimum 7, maximum 70;n = 32). Elasticity was rated best (1.47 +/- 0.88;minimum 1, maximum 7) and scar pigmentation (2.34 +/- 1.54;minimum 1, maximum 7) worst. No correlations with a complication were found. Conclusion: Direct wound closure stretching rhinoplasty is a safe method, especially for defect coverage in the upper two thirds of the soft tissue covering the nose, which in most cases achieved a good cosmetic result.

关键词： Esthetic result Scar score defect coverage Scar pigmentation Elasticity Nose Skin tumor Basal cell carcinoma Squamous epithelium carcinoma

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Two-stage microsurgical soft tissue reconstruction of a complex sacral wound using an arteriovenous loop

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HANDCHIRURGIE MIKROCHIRURGIE PLASTISCHE CHIRURGIE 2024年第4期56卷 286-290页

作者： Geber, Benjamin Landscheidt, Kristina Goertz, Ole Hernekamp, Jochen-Frederick Martin Luther Krankenhaus Klin Plast Rekonstrukt & Asthet Chirurg Handchirurg Berlin Germany

The surgical reconstruction of sacral soft tissue defects is challenging, and complications are frequent. We report a successful two-stage three-dimensional microsurgical soft tissue reconstruction of a wide and deep sacral defect anastomosing a free combined ALT/TFL/rectus femoris flap to an ipsilateral vena saphena magna arteriovenous loop which was applied primarily. This case shows that complex microsurgical procedures can be promising in this demanding patient population if the indication is correct and the operative/perioperative strategy is clear.

关键词： decubitus arteriovenous loop free flap pressure ulcer defect coverage

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Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2023年第2期39卷 227-243页

作者： Jiang, Hui Zhang, Fanchen Dworak, Jennifer Nepal, Kundan Manikas, Theodore Southern Methodist Univ Elect & Comp Engn Dept 6425 Boaz Lane Dallas TX 75205 USA Cisco Syst Inc Cisco Bldg 163700 Cisco Way San Jose CA 95134 USA Univ St Thomas Elect & Comp Engn Dept 2115 Summit Ave St Paul MN 55105 USA Southern Methodist Univ Comp Sci Dept 6425 Boaz Lane Dallas TX 75205 USA

Test sets that target standard fault models may not always be sufficient for detecting all defects. To evaluate test sets for the detection of unmodeled defects, n-detect test sets (which detect all modeled faults at least n times) have previously been proposed. Unfortunately, n-detect test sets are often prohibitively long. In this paper, we investigate the ability of shadow flip-flops connected into a MISR (Multiple Input Signature Register) to detect stuck-at faults fortuitously multiple times during scan shift. We explore which flip-flops should be shadowed to increase the value of n for the least detected stuck-at faults for each circuit studied. We then identify which circuit characteristics are most important for determining the cost of the MISR needed to achieve high values of n. For example, circuits that contain a few flip-flops with upstream fault cones that cover a large percentage of all faults in the circuit can often achieve high n-detect coverage fortuitously with a low-cost MISR. This allows a DFT engineer to predict the viability of this MISR-based approach early in the design cycle.

关键词： DFT n-detect Stuck-at faults Scan shift capture defect coverage MISR Fault cone

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Surgical excision of eyelid tumors and subsequent ophthalmoplastic reconstruction

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OPHTHALMOLOGIE 2024年第1期121卷 23-32页

作者： Gaca, P. J. Rejdak, R. Lewandowicz, M. Kopecky, A. Kakkassery, V. Heindl, L. M. Univ Cologne Fac Med Cologne Germany Univ Cologne Univ Hosp Cologne Cologne Germany Med Univ Lublin Chair & Dept Gen & Pediat Ophthalmol Lublin Poland Multidisciplinary M Copernicus Voivodeship Ctr Onc Dept Oncol Surg Lodz Poland Univ Hosp Ostrava Ophthalmol Clin Ostrava Czech Republic Ctr Integrated Oncol CIO Aachen Bonn Cologne Cologne Germany Univ Ostrava Med Fac Ostrava Czech Republic Univ Med Ctr Schleswig Holstein Dept Ophthalmol Lubeck Germany Univ Cologne Fac Med Kerpener Str 62 D-50937 Cologne Germany Univ Cologne Univ Hosp Cologne Kerpener Str 62 D-50937 Cologne Germany

In recent years new modern therapeutic concepts have been developed in the treatment of malignant eyelid tumors;however, surgical restoration remains an important component of the therapeutic options addressed, which include microsurgical tumor excision into healthy tissue and subsequent coverage of the defects. An ophthalmic surgeon experienced in oculoplastic surgery is responsible for the recognition and evaluation of the existing alterations and planning a procedure together with the patient that meets the patient's expectations. The planning of surgery must always be individualized and fit the initial findings. Depending on the defect size and localization, different coverage strategies are available to the surgeon. To ensure successful reconstruction, every surgeon should master a wide range of reconstructive techniques. In den letzten Jahren haben sich neue, moderne Therapiekonzepte in der Behandlung von malignen Lidtumoren entwickelt. Die chirurgische Sanierung bleibt jedoch weiterhin ein wichtiger Bestandteil der Therapiemoglichkeiten, welche die mikrochirurgische Tumorexzision im gesunden Gewebe sowie die anschliessende Deckung der Defekte umfassen. Ein okuloplastisch erfahrener Ophthalmochirurg ist fur die Erkennung und Bewertung der vorhandenen Veranderung zustandig und sollte zusammen mit dem Patienten ein dessen Vorstellungen entsprechendes Vorgehen planen. Die Operationsplanung muss stets individuell erfolgen und passend zum Ausgangsbefund durchgefuhrt werden. Abhangig von der Defektgrosse und Lokalisation stehen dem Operateur unterschiedliche Deckungsstrategien zur Verfugung. Um eine erfolgreiche Rekonstruktion zu gewahrleisten, sollte jeder Operateur eine breite Palette rekonstruktiver Techniken beherrschen.

关键词： Microsurgical tumor excision defect coverage Ophthalmic surgeon Oculoplasty Reconstructive techniques Mikrochirurgische Tumorexzision Defektdeckung Ophthalmochirurg Okuloplastik Rekonstruktive Techniken

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Surgical excision of eyelid tumors and subsequent ophthalmoplastic reconstruction

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OPHTHALMOLOGIE 2023年第3期120卷 252-261页

作者： Gaca, P. J. Rejdak, R. Lewandowicz, M. Kopecky, A. Kakkassery, V. Heindl, L. M. Univ Cologne Med Fak Zentrum Augenheilkunde Cologne Germany Univ Cologne Uniklin Koln Cologne Germany Med Univ Lublin Abt Allgemeine Ophthalmol Padiatr Ophthalmol Lublin Poland Multidisziplinares M Copernicus Woiwodschaftszentr Abt onkol Chirurg Lodz Poland Univ Krankenhaus Ostrava Klin Augenheilkunde Ostrava Czech Republic Bonn Dusseldorf Koln Centrum Integrierte Onkologie CIO Cologne Germany Univ Ostrava Mediniz Fak Ostrava Czech Republic Univ klinikum Schleswig Holstein Klin Augenheilkunde Campus Lubeck Lubeck Germany

关键词： Microsurgical tumor excision defect coverage Ophthalmic surgeon Oculoplasty Reconstructive techniques

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