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18th IEEE European Test Symposium (ETS)

作者： Vatajelu, Elena I. Bosio, A. Dilillo, L. Girard, P. Todri, A. Virazel, A. Badereddine, N. Univ Montpellier 2 CNRS LIRMM 161 Rue Ada F-34392 Montpellier 5 France Intel Mobile Commun F-06560 Valbonne France

ISBN: (纸本)9781467363778

Functional operations of a Static Random Access Memory (SRAM) are strongly affected by random variability in core-cell transistors and by the variability-induced threshold voltage mismatch between the transistors of the Input-Output (IO) circuitry (especially Sense Amplifiers). This variability also affects the faulty behavior of the SRAM array. This paper is focused on the analysis of static and dynamic faults due to resistive-open defects in the SRAM core-cell, taking into account the effects of random process variability in core-cells and IO circuitry. Statistical analyses have been performed to evaluate the SRAM failure probabilities accounting for defects at each possible location. The results show that random process variability in the SRAM core-cell and IO circuitry have an important effect on the behavior of an SRAM array and also on the defect coverage of various commonly-used test sequences. It is shown that under variability, the minimum defect size detected with maximum probability is more than 2X larger than the minimum size detected in nominal conditions, thus leaving a large range of defects undetected. Several stress conditions during test have been evaluated to assess their capability to increase the defect coverage under random process variability.

关键词： SRAM Test Process Variability defect coverage

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A flap simulator for training in local defect coverage

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CHIRURG 2008年第12期79卷 1141-1144页

作者： Meyer-Marcotty, M. V. Redeker, J. Herold, C. Busch, K. H. Rennekampff, H. O. Vogt, P. M. Hannover Med Sch Klin Plast Hand & Wiederherstellungschirurg D-30625 Hannover Germany

The Hannover Medical School (Germany) developed the "Flap Lab I" flap simulator, a practical improvement to surgeon training. It provides realistic conditions for understanding and following the principles for planning and performing local flaps for coverage of skin defects. The Flap Lab I has proved to be a very good training model in several training courses. This article introduces among others the Z-flap, reverse Z-flap (so-called hanging man), and Limberg flap.

关键词： Local skin graft defect coverage Grafting simulator Flap Lab I Training model

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The free lateral arm flap-a reliable option for reconstruction of the forearm and hand

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Hand 2012年第2期7卷 163-171页

作者： Sauerbier, M. Germann, G. Giessler, G.A. Salakdeh, M. Sedigh Döll, M. Department for Plastic Hand and Reconstructive Surgery Cooperation Department for Plastic Surgery of the University Hospital Frankfurt Main-Taunus-Hospitals GmbH 65812 Bad Soden am Taunus Kronberger Str. 36 Germany Ethianum Heidelberg Clinic for Plastic Reconstructive Aesthetic Surgery and Preventive Medicine University Hospital Heidelberg Heidelberg Germany Department for Plastic Hand and Reconstructive Microsurgery BG Trauma Center Murnau Murnau Germany Plastic and Hand Surgery University Hospital Erlangen Erlangen Germany

Background: This retrospective study was performed to verify the advantages and disadvantages of the free lateral arm flap for defect reconstruction of the forearm and hand. Patients and Methods: Between 2001 and 2010, 21 patients underwent defect coverage of the forearm and hand with the free lateral arm flap. The mean patient age was 48 years (17-78). The results concerning defect origin, flap size, pedicle length, operative time, revisions of the anastomoses or other complications, donor site morbidity, and length of hospital stay were evaluated. Results: The majority of defects were caused by infections or chronic wounds. The defects were localized at the forearm in 6 cases and at the hand in 15 cases. The flap width ranged from 3 to 8 cm, and the length was from 5 to 20 cm. All flaps survived. Only in one case, a revision of the anastomosis was necessary. Primary closure of the donor site was possible in all patients. No complications occurred during the healing procedure. The majority of the patients were satisfied with the aesthetic result at the recipient site as well as at the donor site. Conclusion: The free lateral arm flap is a very reliable option for defect coverage at the forearm and hand for small and medium size defects. A satisfactory aesthetic appearance, an excellent tissue quality, and frequent primary donor site closure are great advantages for selecting this flap. © 2012 American Association for Hand Surgery.

关键词： defect coverage Donor site morbidity Free lateral arm flap Reconstruction of the forearm and hand

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Principles and treatment options for soft tissue coverage at the distal lower leg and ankle

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Fuss und Sprunggelenk 2012年第1期10卷 46-61页

作者： Hierner, Robert Lendemans, Sven Klinik für Plastische und Handchirurgie Brandverletztenzentrum an den Berufsgenossenschaftlichen Kliniken Bergmannstrost Halle/Saale 06112 Halle Merseburger Straße 165 Germany Klinik für Unfallchirurgie Universitätsklinikum Essen Universität Duisburg-Essen 45147 Essen Hufelandstraße 55 Germany

The lower leg is the most often severely injured part of the lower extremity. Despite improved operative techniques, soft tissue defects alone or in combination with bone defects that cannot be closed by secondary suture still present a complex diagnostic and therapeutic problem. Modern treatment of severe trauma to the distal lower leg requires a global defect management which is based on: 1) profound basic knowledge, 2) multidisciplinary treatment team using a " common language" concerning diagnosis, classification and treatment, and 4) an integrated treatment concept. Adequate primary defect reconstruction is the basis of any successful treatment. For function improvement a variety of secondary operations like muscle/tendon transfer, tenodesis, capsulodesis, arthrodesis or ultimatively free functional muscle transplantation alone or in combination are available. Moreover adjuvant procedures such as orthesis, orthopaedic shoes, etc. may be useful at any time of treatment. © 2012.

关键词： Ankle Bone defect defect coverage Lower leg Soft tissue defect

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Low Power Test-Compression for High Test-Quality and Low Test-Data Volume

Low Power Test-Compression for High Test-Quality and Low Tes...

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20th Asian Test Symposium (ATS)

作者： Tenentes, Vasileios Kavousianos, Xrysovalantis Univ Ioannina Dept Comp Sci GR-45110 Ioannina Greece

ISBN: (纸本)9780769545837

Test data decompressors targeting low power scan testing introduce significant amount of correlation in the test data and thus they tend to adversely affect the coverage of unmodeled defects. In addition, low power decompression needs additional control data which increase the overall volume of test data to be encoded and inevitably increase the volume of compressed test data. In this paper we show that both these deficiencies can be efficiently tackled by a novel pseudorandom scheme and a novel encoding method. The proposed scheme can be combined with existing low power decompressors to increase unmodeled defect coverage and almost totally eliminate control data. Extensive experiments using ISCAS and IWLS benchmark circuits show the effectiveness of the proposed method when it is combined with state-of-the-art decompressors.

关键词： defect coverage Test Data Compression

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Investigation into Voltage and Process Variation-Aware Manufacturing Test

Investigation into Voltage and Process Variation-Aware Manuf...

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International Test Conference (ITC)

作者： Ingelsson, Urban Al-Hashimi, Bashir M. Linkoping Univ Linkoping Sweden Univ Southampton Southampton Hants England

ISBN: (纸本)9781457701528

Traditional test methods that use abstract fault models potentially results in low defect coverage and test escapes for ICs with multiple supply voltage (Vdd) settings for adaptive power management, and in the presence of process variation. In this paper, we address two important defect types, resistive bridge defects and full open defects, and present foundational work on variation-aware test methods. To test ICs with multiple Vdds, Multi-Vdd Test Generation (MVTG) produces Vdd-specific test sets, such that tests are applied using the most effective Vdd. For Process Variation-aware Test Generation(PVTG), we target the most significant test escapes, guided by a novel process variation-aware metric for test quality, called test robustness. We implemented our test methods, and integrated them into a flow of commercial EDA tools. Experimental results on benchmark designs and realistic defects, extracted from layout, show that our test methods achieve high defect coverage while keeping the test sets size low. This serves as proof-of-concept for variation-aware test.

关键词： Bridge circuits Integrated circuits Logic gates Mathematical model Resistance Testing Threshold voltage Vdd-specific test sets abstract fault models adaptive power management automatic test pattern generation commercial EDA tools defect coverage defect types full open defects integrated circuit testing multi-Vdd test generation multiple supply voltage settings process variation-aware manufacturing test resistive bridge defects test quality test robustness variation-aware test methods

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Cell-aware Analysis for Small-delay Effects and Production Test Results from Different Fault Models

Cell-aware Analysis for Small-delay Effects and Production T...

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International Test Conference (ITC)

作者： Hapke, F. Schloeffel, J. Redemund, W. Glowatz, A. Rajski, J. Reese, M. Rearick, J. Rivers, J. Mentor Graph Corp Hamburg Germany Mentor Graph Corp Wilsonville OR 97070 USA AMD Inc Austin TX 78735 USA

ISBN: (纸本)9781457701528

This paper focuses on a new approach to significantly improve the overall defect coverage for CMOS-based designs with the final goal to eliminate any system-level test. This methodology describes the pattern generation flow for detecting cell-internal small-delay defects caused by cell-internal resistive bridges. Results have been evaluated on 1,900 library cells of a 32-nm technology. First production test results are presented from evaluating additional defect detections achieved with different fault models on a 45-nm design.

关键词： Bridge circuits Bridges CMOS integrated circuits CMOS-based designs Delay Libraries Logic gates Switching circuits automatic test pattern generation cell-aware analysis cell-internal resistive bridges cell-internal small-delay defects defect coverage delays fault diagnosis fault models integrated circuit design integrated circuit testing pattern generation flow production test production testing size 32 nm size 45 nm system-level test

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Transosseous route of vascular pedicles in microsurgical tissue transfer

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CHIRURG 2011年第1期82卷 74-77页

作者： Goertz, O. Druecke, D. Lehnhardt, M. Steinau, H. -U. Ruhr Univ Bochum Klin Plast Chirurg Schwerbrandverletzte Handchirurg ZentrumBG Univ Klinikum Bergmannshel D-44789 Bochum Germany Univ Kiel Univ Klinikum Schleswig Holstein Abt Plast Hand & Mikrochirurg D-24098 Kiel Germany

In cases of damaged recipient vessels or short vascular pedicles of the flaps, arteriovenous loops or long vein interposition are necessary for microsurgical defect coverage. These procedures require additional anastomoses with extended access and prolonged surgery and increase the risk of complications. The following article presents an alternative transosseous route of vascular pedicles for improved access to the recipient vessel based on three case studies.

关键词： defect coverage Complication risk Transosseous route Microsurgical tissue transfer Vessel anastomoses

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Perforator Flaps in the Upper Extremity

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CLINICS IN PLASTIC SURGERY 2010年第4期37卷 667-+页

作者： Sauerbier, Michael Unglaub, Frank Goethe Univ Frankfurt Dept Plast Hand & Reconstruct Surg Main Taunus Hosp GmbH Acad Hosp D-65812 Bad Soden Germany Univ Erlangen Nurnberg Dept Plast & Hand Surg D-91054 Erlangen Germany

Perforator flaps are frequently used for defect coverage for the whole body. There are strong indications for the use of perforator flaps in the upper extremity. This article demonstrates the possibilities for defect coverage with perforator flaps as well as their anatomic and technical considerations. Lateral arm, posterior interosseous artery, ulnar artery, radial artery perforator flaps, and intrinsic hand flaps are described.

关键词： Perforator flaps Upper extremity Vascular anatomy defect coverage Intrinsic flaps

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defect-Oriented Cell-Internal Testing 41

Defect-Oriented Cell-Internal Testing

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International Test Conference 2010

作者： Hapke, F. Redemund, W. Schloeffel, J. Krenz-Baath, R. Glowatz, A. Wittke, M. Hashempour, H. Eichenberger, S. Mentor Graph Corp Tempowerkring 1B D-21079 Hamburg Germany NXP Semicond NL-5656AA Eindhoven Netherlands NXP Semicond NL-6534AE Nijmegen Netherlands

ISBN: (纸本)9781424472055

Industry is facing very high quality requirements for today's and tomorrow's ICs. Especially in the automotive market these quality requirements need to be fulfilled. To achieve this we need to improve currently used test methods and fault models to improve the overall defect coverage. This paper presents two new methodologies to significantly improve this situation. One method will focus on cell-internal Bridges over a wide range of Bridge resistor values and the second method concentrates on library cell-internal high-resistive Open defects. The fault models used during the ATPG are enhanced to directly target the layout-based intra-cell Open and Bridge defects. Both methods have been evaluated on 1500 library cells of a 65nm technology. In addition the wide range of intra-cell Bridges has been evaluated on 10 real industrial designs with up to 60 million faults. Various results are presented from all 1500 library cells and from the 10 industrial designs as well.

关键词： ATPG CMOS IC testing CMOS integrated circuits automatic test pattern generation bridge circuits bridge resistor values cell-internal bridges defect coverage defect-oriented cell-internal testing fault diagnosis fault models industrial designs integrated c

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