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检索条件"主题词=Defect quantification study"
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Detection Model for Automatic defect quantification and Segmentation for Stepped Eddy Current Thermography
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IEEE SENSORS JOURNAL 2025年 第7期25卷 10784-10799页
作者: Gao, Yuan Zhang, Liang Liang, Zheng Zheng, Ting Deng, Xiong Chen, Xin Southwest Petr Univ Sch Mech Engn Chengdu 610500 Peoples R China Luzhou Vocat & Tech Coll Sch Intelligent Mfg & Automot Engn Luzhou 646000 Sichuan Peoples R China Southwest Petr Univ Petr Engn Sch Chengdu 610500 Sichuan Peoples R China
The stepped eddy current thermography (SECT) nondestructive testing (NDT) technique is characterized by long heating time and nonuniform temperature rise. This causes it to remain challenging to quantify the geometric... 详细信息
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