Accurate and effective localization of reliability-critical gates (RCGs) is one of the important prerequisites for low-cost circuit fault tolerance in the early stages of circuit design. This article introduces an acc...
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Accurate and effective localization of reliability-critical gates (RCGs) is one of the important prerequisites for low-cost circuit fault tolerance in the early stages of circuit design. This article introduces an accurate and effective approach for localizing RCGs in combinational logic blocks through a benchmarking technique. In the proposed approach, uniform non-Bernoulli sequences are used to produce a set of input vectors for driving circuits. A full-period linear congruential algorithm is employed to generate a sequence that provides the sampled order for the RCGs to be analyzed. This ensures that each gate in the circuit is treated as fairly as possible. To accelerate the localization process, an input-vector-based pruning technique combined with a counting method is also introduced to identify the specified number of RCGs. Then, the criticality of gate reliability for each RCG is measured through benchmarking. A clustering algorithm carries out the convergence checking for the proposed approach. The performance of the proposed approach was evaluated in terms of accuracy, stability, and time-space overhead by various simulations on 74-series circuits and ISCAS-85 benchmark circuits. The results show that its accuracy is close to that of the Monte Carlo model and its stability is better than that of other approximate methods. Moreover, compared with approximate methods, the time overhead of our approach is advantageous in the presence of similar memory overheads.
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