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检索条件"主题词=GATE array circuits"
310 条 记 录,以下是171-180 订阅
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An interpolating time-to-digital converter on an FPGA
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INSTRUMENTS AND EXPERIMENTAL TECHNIQUES 2009年 第6期52卷 788-792页
作者: Chulkov, V. A. Medvedev, A. V. Penza State Technol Acad Penza 440605 Russia
A simple and sufficiently precise unit converting single time intervals to digital codes on an EP2C20F484C7N Altera field programmable gate array is proposed. The resolution of the converter, the principle of operatio... 详细信息
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Characterizing universal gate sets via dihedral benchmarking
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Physical Review A 2015年 第6期92卷 060302(R)-060302(R)页
作者: Arnaud Carignan-Dugas Joel J. Wallman Joseph Emerson Institute for Quantum Computing and the Department of Applied Mathematics University of Waterloo Waterloo Ontario Canada N2L 3G1 Canadian Institute for Advanced Research Toronto Ontario Canada M5G 1Z8
We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including small single-qubit rotations. Our dihedral benchmarking protoc... 详细信息
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Topological quantum gate entanglers for a multi-qubit state
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JOURNAL OF PHYSICS A-MATHEMATICAL AND THEORETICAL 2007年 第32期40卷 9877-9882页
作者: Heydari, Hoshang Nihon Univ Inst Quantum Sci Chiyoda Ku Tokyo 1018308 Japan
We establish a relation between topological and quantum entanglement for a multi-qubit state by considering the unitary representations of the Artin braid group. We construct topological operators that can entangle a ... 详细信息
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A High-Resolution Surface Image Capture and Mapping System for Public Roads
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SAE INTERNATIONAL JOURNAL OF PASSENGER CARS-ELECTRONIC AND ELECTRICAL SYSTEMS 2017年 第2期10卷 301-309页
作者: Hu, Yazhe Furukawa, Tomonari Virginia Tech Blacksburg VA 24061 USA
This paper presents a system designed to develop a high-resolution map of public roads by capturing high-resolution surface images. Unlike conventional system, the proposed system applies a field programmable gate arr... 详细信息
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Carbon nanotube technology for solid state and vacuum electronics
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IEE PROCEEDINGS-circuits DEVICES AND SYSTEMS 2004年 第5期151卷 443-451页
作者: Teo, KBK Lacerda, RG Yang, MH Teh, AS Robinson, LAW Dalal, SH Rupesinghe, NL Chhowalla, M Lee, SB Jefferson, DA Hasko, DG Amaratunga, GAJ Milne, WL Legagneux, P Gangloff, L Minoux, E Schnell, JP Pribat, D Univ Cambridge Cambridge CB2 1PZ England Thales Res & Technol F-91401 Orsay France
The authors demonstrate the fabrication of solid state and vacuum electronic devices using carbon nanotubes as the active channel and emitters. Single wall and multiwall carbon nanotubes (CNT) are deposited directly o... 详细信息
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Tunable THz metamaterials based on an array of paraelectric SrTiO3 rods
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APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 2011年 第3期103卷 689-692页
作者: Yahiaoui, R. Nemec, H. Kuzel, P. Kadlec, F. Kadlec, C. Mounaix, P. Univ Bordeaux 1 CNRS Lab Ondes & Mat Aquitaine UMR 5798 F-33405 Talence France Acad Sci Czech Republ Inst Phys Prague 18221 8 Czech Republic
This work presents theoretical and experimental investigations of a tunable metamaterial which exhibits negative permeability in the THz frequency range. The tunability is obtained by temperature changes, and the samp... 详细信息
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Quad-level bit-stream adders and multipliers with efficient FPGA implementation
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ELECTRONICS LETTERS 2008年 第12期44卷 722-723页
作者: Ng, C. W. Wong, N. Ng, T. S. Univ Hong Kong Dept Elect & Elect Engn Hong Kong Hong Kong Peoples R China
Novel adder and multiplier circuits for bit-stream signal processing customised for quad-level sigma-delta modulated signals are proposed. Compared with existing sorter-based quad-level sigma-delta adders and multipli... 详细信息
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The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET
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MICROELECTRONICS RELIABILITY 2013年 第2期53卷 265-269页
作者: Yeh, Wen-Kuan Chen, Po-Ying Gan, Kwang-Jow Wang, Jer-Chyi Lai, Chao Sung Natl Univ Kaohsiung Dept Elect Engn Kaohsiung Taiwan I Shou Univ Dept Informat Engn Kaohsiung Taiwan Natl Chiayi Univ Dept Elect Engn Chiayi Taiwan Chang Gung Univ Dept Elect Engn Tao Yuan Taiwan
The impact of interface/border defect on performance and reliability was investigated for gate-first and gate-last high-k/metal-gate CMOSFET. For high-k/metal-gate CMOSFET, V-FB roll-off is critical as effective oxide... 详细信息
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Improved high-field reliability for a SiC metal-oxide-semiconductor device by the incorporation of nitrogen into its HfTiO gate dielectric
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JOURNAL OF APPLIED PHYSICS 2007年 第5期102卷 054515.1-054515.5页
作者: Lin, L. M. Lai, P. T. Univ Hong Kong Dept Elect & Elect Engn Hong Kong Hong Kong Peoples R China
Materials with high dielectric constant (k) have been used in SiC-based metal-oxide-semiconductor (MOS) devices to reduce the electric field in the gate dielectric and thus suppress a high-field reliability problem. I... 详细信息
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One-way gates based on EPR, GHZ and decoherence-free states of W class
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PHYSICS LETTERS A 2009年 第38期373卷 3410-3412页
作者: Basharov, A. M. Gorbachev, V. N. Trubilko, A. I. Yakovleva, E. S. Kurchatov Inst Lab Nonlinear Opt Moscow Russia
The logical gates using quantum measurement as a primitive of quantum computation are considered. It is found that these gates achieved with EPR, GHZ and W entangled states have the same structure, allow encoding the ... 详细信息
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