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检索条件"主题词=Machine Vision Defect Detection"
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Research on Chip defect System based on machine vision
International Core Journal of Engineering
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International Core Journal of Engineering 2021年 第9期7卷 572-580页
作者: Bitong Zhao Qingzhong He Kehong Li
At present, machine vision based defect detection is a hot research channel to realize automatic defect detection technology. Based on the ultra thin Gigabyte single port network transformer chip product as the carrie... 详细信息
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