The cylindrical model of optical thin films microstructure is assumed for the derivation of theequations expressing the structure-dependent anisotropic optical parameters in this paper. Theequations are given for vari...
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ISBN:
(纸本)0819403857
The cylindrical model of optical thin films microstructure is assumed for the derivation of the
equations expressing the structure-dependent anisotropic optical parameters in this paper. The
equations are given for various values of cylinder obliquity and for several incident plane
orientations. The equations are based on a capacitive model in which two index components are
given and on the dielectric ellipsoid theory. They are applied to modeling ZnS thin films and the
computed results have been given. We discuss the results, especially noting consistency of our
model-based computations with measurements.
Machine vision remains a remarkably elusive goal. There are two separate categories in which the state of current machine vision systems fall short. Using a familiar dichotomy I shall refer to these two categories as ...
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Machine vision remains a remarkably elusive goal. There are two separate categories in which the state of current machine vision systems fall short. Using a familiar dichotomy I shall refer to these two categories as hardware and software. In a more descriptive sense I mean by hardware and software
This paper summarizes research completed for the development of a prototype expert system to diagnose failures of a complex computer down to an individual component. Our research goal was to model the diagnostic proce...
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This paper summarizes research completed for the development of a prototype expert system to diagnose failures of a complex computer down to an individual component. Our research goal was to model the diagnostic process followed by expert technicians to achieve a component-level diagnosis. The development goal was to construct an initial prototype system for a single board of the computer which could be used as a model for the construction of a diagnostic system for the entire computer.
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