By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability, the testability indexes of system level BIT are determined on the basis of maximum system re...
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ISBN:
(纸本)9783037852828
By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability, the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimizationmodel of system-level BIT testability indexes is established. The multi-objective optimizationmodel is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimizationmodel is proved through an example.
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