A new channel waveguide fabrication process for use in glass is described. The new technique uses an electron-beam induced effect to directly alter the refractive index of the glass.
A new channel waveguide fabrication process for use in glass is described. The new technique uses an electron-beam induced effect to directly alter the refractive index of the glass.
A signal enhancement of 10 dB at 1535 nm with a low launched pump power of 1 mW at 1480 nm is achieved for sputtered Er3+:Y2O3 channel waveguides on oxidised silicon substrates. With the developed reactive co-sputteri...
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A signal enhancement of 10 dB at 1535 nm with a low launched pump power of 1 mW at 1480 nm is achieved for sputtered Er3+:Y2O3 channel waveguides on oxidised silicon substrates. With the developed reactive co-sputtering process using sputterguns the erbium concentration can be varied easily and reproducibly.
The propagation loss characteristics of silica-based opticalwaveguides with various bending curvatures fabricated on 5 inch Si wafers are investigated. Low loss waveguides more than 1 m long with a delta of 0.75% are...
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The propagation loss characteristics of silica-based opticalwaveguides with various bending curvatures fabricated on 5 inch Si wafers are investigated. Low loss waveguides more than 1 m long with a delta of 0.75% are successfully fabricated and the loss is found to be independent of the curvature radius over 5mm. A minimum loss of 3.5 dB/m at approximately 1.55 mum is obtained in a waveguide 1.6m long.
This article shows that the full guided mode expansion method and its limit, the optimized sine method, provide simple, fast, and accurate calculations of the propagation constant, even near the cutoff frequency. Use ...
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This article shows that the full guided mode expansion method and its limit, the optimized sine method, provide simple, fast, and accurate calculations of the propagation constant, even near the cutoff frequency. Use of a smaller scale matrix results in good agreement with previous works.
We present a theoretical method that makes it possible to analyze 3-D integrated opticalwaveguides with arbitrary refractive-index profiles. With this method it is easy to obtain effective indices, propagation consta...
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We present a theoretical method that makes it possible to analyze 3-D integrated opticalwaveguides with arbitrary refractive-index profiles. With this method it is easy to obtain effective indices, propagation constants, and coupling/switching properties of planar and channel opticalwaveguides. This theoretical approach involves modeling the original opticalwaveguide by means of an equivalent opticalwaveguide whose effective index is evaluated by applying a technique that we call the asymptotic effective-index method. The numerical Values show good convergence and accuracy for effective indices, propagation constants, and coupling/switching characteristics. Theoretical and experimental values are given.
The Photon Scanning Tunneling Microscope (PSTM) is based on the frustration of total internal reflection by the apex of an optical fiber placed near the surface of reflection. It was so far been used to obtain topogra...
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The Photon Scanning Tunneling Microscope (PSTM) is based on the frustration of total internal reflection by the apex of an optical fiber placed near the surface of reflection. It was so far been used to obtain topographic information. This article shows that it also allows one to reach local variations of the refraction index of the sample. The PSTM, like many local probes, is operated on a constant intensity level. In that cases a theoretical analysis based on a simple model shows that a change of the refraction index can actually be seen with the PSTM. We find thc corrugation height depends on the distance between the tip and the sample surface. The local refraction index of microguides diffused in glass has been studied experimentally with the PSTM. Relative variations in the order of 10(-3) have been observed. If the sample surface is not perfectly flat, images simultaneously display the topography and the local index changes of the sample. Spectroscopic images can be performed in order to separate the two contributions. This can be achieved by modulating the fiber to sample distance at high frequencies and by reading the corresponding intensity variations. We show that under specific conditions the intensity variations mainly depend on the refraction index.
We describe an interferometric method that uses an interference microscope that permits the determination of the complete two-dimensional refractive-index profile of integrated opticalwaveguides, provided that the fo...
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We describe an interferometric method that uses an interference microscope that permits the determination of the complete two-dimensional refractive-index profile of integrated opticalwaveguides, provided that the form of the one-dimensional depth profile is known. Results are reported for potassium-sodium ion-exchanged channel waveguides and are shown to be in good agreement with theory.
Scaling rules implicit in the model for field assisted ion diffusion into glass have been experimentally observed in planar guides made by the diffusion of silver ions from silver films into soda-lime glass. These sca...
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Scaling rules implicit in the model for field assisted ion diffusion into glass have been experimentally observed in planar guides made by the diffusion of silver ions from silver films into soda-lime glass. These scaling rules are observed despite the relatively poor agreement between the refractive index profile and calculations.
It is shown how discontinuities such as sharp bends, offsets and steps in opticalwaveguides can be analysed with the method of lines. 3-D results for rib-waveguide bends and offsets are presented. It is shown that ev...
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It is shown how discontinuities such as sharp bends, offsets and steps in opticalwaveguides can be analysed with the method of lines. 3-D results for rib-waveguide bends and offsets are presented. It is shown that even a small bend angle results in remarkable transmission loss.
Silicon germanium waveguides with losses of less than 1 dB/cm have been fabricated and characterised at 1.32-mu-m. Propagation losses are as low as 0.62 dB/cm for TM polarised light and 0.50 dB/cm for TE polarised light.
Silicon germanium waveguides with losses of less than 1 dB/cm have been fabricated and characterised at 1.32-mu-m. Propagation losses are as low as 0.62 dB/cm for TM polarised light and 0.50 dB/cm for TE polarised light.
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