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检索条件"主题词=Process Control Monitor parameters"
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Modeling the Dependencies between Circuit and Technology parameters for Sensitivity Analysis using Machine Learning Techniques  16
Modeling the Dependencies between Circuit and Technology Par...
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16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) / 15th Conference on PhD Research in Microelectronics and Electronics (PRIME)
作者: Sandru, Elena-Diana Burileanu, Corneliu David, Emilian Buzo, Andi Pelz, Georg Univ Politehn Bucuresti Bucharest Romania Infineon Technol Neubiberg Germany
The sensitivity of integrated circuit parameters regarding manufacturing process variation represents a very important ongoing topic in the semiconductor industry. Establishing the functional relationship between them... 详细信息
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Pre-Silicon Yield Estimation using Machine Learning Regression  26
Pre-Silicon Yield Estimation using Machine Learning Regressi...
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26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
作者: Sandru, Elena-Diana David, Emilian Pelz, Georg Univ Politehn Bucuresti Bucharest Romania Infineon Technol Neubiberg Germany
Early (pre-silicon) yield estimation with regard to technology variations represents a cost-effective solution in the semiconductor industry. This paper presents preliminary results on a yield estimation methodology t... 详细信息
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Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to process Variations  27
Machine Learning-Based Local Sensitivity Analysis of Integra...
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27th IEEE International Conference on Electronics, Circuits and Systems (IEEE ICECS)
作者: Sandru, Elena-Diana David, Emilian Pelz, Georg Univ Politehn Bucuresti Bucharest Romania Infineon Technol Bucharest Romania
This paper presents a local sensitivity analysis methodology of circuit performances, i.e. Electrical parameters (EPs), with manufacturing process variations, based on modelling the EPs dependence on the process Contr... 详细信息
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