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COMPUTER 2020年第1期53卷 37-44页

作者： Kuhn, Rick Kacker, Raghu N. Lei, Yu Simos, Dimitris NIST Comp Secur Div Gaithersburg MD 20899 USA NIST Appl & Computat Math Div Gaithersburg MD 20899 USA Univ Texas Arlington Dept Comp Sci & Engn Arlington TX 76019 USA SBA Res Appl Discrete Math Informat Secur Res Vienna Austria SBA Res Math Testing Reliabil & Informat Secur Res Grp Vienna Austria

testing is the most commonly used approach for software assurance, yet it remains as much judgment and art as science. We suggest that structural coverage measures must be supplemented with measures of input space cov... 详细信息

关键词： program testing Software Metrics Input Space Coverage Software Assurance Structural Coverage Measures Input Model Software testing Quality Assurance Software Measurement Performance Evaluation

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Model-based testing of embedded systems in hardware in the loop environment

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IET SOFTWARE 2012年第4期6卷 364-376页

作者： Keranen, J. S. Raty, T. D. VTT Tech Res Ctr Finland Oulu 90571 Finland

The evolution of software testing technologies has significantly reduced software testing execution times, but the test design and generation are still often implemented with slow manual-oriented methods. Model-based testing (MBT) offers automation to test design and generation, and different MBT solutions are familiar from research, but more effort needs to be done to adopt MBT for industrial use. Hardware in the loop (HIL) is a simulation and testing technique used in the development and testing of embedded systems. HIL is a challenging application field for MBT due to complex and non-deterministic nature of some embedded systems. To tackle this problem, the authors present a novel prototype platform in which online and offline MBT is applied to HIL environment. MBT in general has been introduced for HIL in scientific literature before, but the application of online MBT in HIL is a novel approach. The whole novel MBT in HIL prototype platform along with the used MBT tool, platform architecture and MBT process are presented accompanied by experimental results and analysis of two case studies with an example embedded system under test.

关键词： platform architecture hardware in the loop testing technique MBT tool online MBT Diagnostic, testing, debugging and evaluating systems embedded systems software testing technologies model-based testing Software engineering techniques digital simulation MBT process software architecture HIL prototype platform hardware in the loop simulation automatic test software program testing HIL environment offline MBT software testing execution time

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THE WORLDS LARGEST EASTER EGG AND WHAT CAME OUT OF IT

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IEEE COMPUTER GRAPHICS AND APPLICATIONS 1988年第2期8卷 16-23页

作者： BLINN, JF

The use of an interesting triangulation scheme to design a monumental sculpture of an easter egg is described. The triangulation method used to approximate the egg\'s surface is based on paper folding. The development of the program and its generalization to three dimensions are examined. The calculation of the three parts of the egg (a middle-barrel section and the two end caps) and some unsolved questions regarding this technique are discussed.

关键词： program testing Easter eggs origami THREE-PART END-CAPPING triangulation

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Test cases generation for multiple paths based on PSO algorithm with metamorphic relations

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IET SOFTWARE 2018年第4期12卷 306-317页

作者： Lv, Xue-Wei Huang, Song Hui, Zhan-Wei Ji, Hai-Jin Army Engn Univ PLA Command Informat Inst Software Engn Dept Nanjing Jiangsu Peoples R China Huaiyin Normal Univ Sch Comp Sci & Technol Huaian Peoples R China PLA Mil Training Software Testing & Evaluat Ctr Test Management Dept Nanjing Jiangsu Peoples R China

The generation of multiple-path test cases can greatly enhance the efficiency of path-wise testing. Various methods adopting meta-heuristic algorithm to generate multiple-path test cases have been proposed, but existing methods focus on improving the meta-heuristic algorithm to get better test case generation efficiency, and test cases covering each path needs to be generated by meta-heuristic algorithm searching. To improve efficiency, a test case generation method for multiple-path coverage is proposed in this study, which combines a particle swarm optimisation (PSO) algorithm with metamorphic relations (MRs). The method first generates a test case using the PSO algorithm, and then generates new test cases by repeatedly using MRs between test cases. This method reduces evolving numbers of PSO algorithm. The experimental results show that the proposed method can significantly enhance the efficiency in terms of fitness evaluations and time consumption.

关键词： particle swarm optimisation program testing search problems metamorphic relations PSO algorithm test cases generation multiple-path test cases path-wise testing test case generation efficiency test case generation method multiple-path coverage particle swarm optimisation algorithm metaheuristic algorithm searching

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Using software reliability growth models in practice

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IEEE SOFTWARE 2007年第6期24卷 82-88页

作者： Almering, Vincent van Genuchten, Michiel Cloudt, Ger Sonnemans, Peter J. M. NXP Semicond Redhill Surrey England Eindhoven Univ Technol Fac Technol Management & Ind Design NL-5600 MB Eindhoven Netherlands

Researchers used four software reliability growth models in the final test phases of three embedded software projects to predict the software''s remaining faults. They compared the models'' predictions to expert predictions and the actual results. The models outperformed the experts in predicting the total number of faults at 25 percent of the elapsed test-time. The researchers concluded that software reliability growth models are useful for supporting management decisions during a software product''s final test phases, provided they''re combined with results from other estimation methods.

关键词： estimation methods fault prediction modeling software reliability software testing Growth models Statistical analysis Software reliability program testing Modeling

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Multilevel testing for design verification of embedded systems

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IEEE DESIGN & TEST OF COMPUTERS 2002年第2期19卷 60-69页

作者： Schulz, S Rozenblit, JW Buchenrieder, KJ Nokia Irving TX 75062 USA Univ Arizona Tucson AZ 85721 USA

A multilevel testing approach for embedded systems addresses mixed hardware and software implementations. Contrary to conventional approaches, it provides consistent generation of scenarios throughout all levels of testing, an early assessment of alternative design implementations, integrated system and component testing, and performance assessments of design specifications starting from the system level.

关键词： Hardware Software Codesign Embedded Systems program testing Formal Verification Formal Specification Design Specifications Multilevel testing Embedded Systems Mixed Hardware Software Implementations Design Verification Consistent Scenario Generation Component testing System testing Performance Assessments System testing Embedded System Software testing Hardware Embedded Software Prototypes Computational Modeling Computer Architecture Software Prototyping Refining

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Combining genetic algorithm and pairwise testing for optimised test generation from UML ADs

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IET SOFTWARE 2019年第5期13卷 423-433页

作者： Anbunathan, R. Basu, Anirban Bharathiar Univ Coimbatore Tamil Nadu India APS Coll Engn Dept CSE Bangalore Karnataka India

Unified modelling language (UML) activity diagram (AD) is used to represent system behaviour abstractly and is used by testers to generate test cases and test data. During the design of test cases, AD with concurrent activities may lead to a large number of paths, and it may not always be possible to test all execution paths. Research on deriving test cases from AD having concurrent activities has focused on conventional search techniques such as breadth-first search and depth-first search which has been found to be inefficient in such cases. To overcome this drawback, the authors propose a method using pairwise testing and genetic algorithm to derive a reduced number of test cases in AD with concurrent activities. Experiments conducted on various real-life concurrent systems show that the proposed technique generates a reduced number of test cases compared with existing methods.

关键词： genetic algorithms program testing Unified Modeling Language genetic algorithm pairwise testing optimised test generation UML activity diagram test cases test data concurrent activities

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Markov chains for damage accumulation of organic and ceramic matrix composites

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JOURNAL OF ENGINEERING MECHANICS-ASCE 2001年第9期127卷 915-926页

作者： Pappas, YZ Spanos, PD Kostopoulos, V Univ Patras Appl Mech Lab Patras 26500 Greece FORTH ICEHT Patras 26500 Greece Rice Univ LB Ryon Chair Engn Houston TX 77251 USA

A systematic presentation of the concept of a well-defined stochastic damage accumulation model for fatigue calculation is attempted;the model is applicable for both organic and ceramic matrix composites. Stationary and nonstationary, with one or more blocks, discrete time and finite state Markov chain models are employed. They are found appropriate for yielding fatigue life probability distributions and damage evolution information at different stress levels. The structure, applicability, flexibility, and limitations of the model are examined in detail. The theoretical concepts are elucidated by the incorporation of data from a comprehensive testing program.

关键词： Incorporation program testing Probability distribution damage development Markov chain discrete-time Fatigue damage(fatigue strength) Ceramic matrix composites statistical distribution

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Test-driven GUI development with testNG and abbot

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IEEE SOFTWARE 2007年第3期24卷 51-+页

作者： Ruiz, Alex Price, Yvonne Wang Cryogenic Laboratory Chinese Academy of Sciences PO Box 2711 Beijing 100080 China

Regardless of test-driven development's well-known benefits, it has suffered slow adoption in GUI development. Because GUIs are one of an application's most important components, testing them is essential for improving the entire system's safety and robustness. testing GUIs is difficult, but several recommendations and practices can simplify test-driven GUI development for Java Swing applications.

关键词： Java application program interfaces graphical user interfaces program testing API Abbot Java Swing application TestNG software complexity test-driven GUI development GUI testing Swing test-driven development testing

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Bayes-TDG: effective test data generation using Bayesian belief network: toward failure-detection effectiveness and maximum coverage

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IET SOFTWARE 2018年第3期12卷 225-235页

作者： Feyzi, Farid Parsa, Saeed Iran Univ Sci & Technol Sch Comp Engn Tehran Iran

This study presents a novel test data generation method called Bayes-TDG. It is based on principles of Bayesian networks and provides the possibility of making inference from probabilistic data in the model to increase the prime path-coverage ratio for a given programme under test (PUT). In this regard, a new programme structure-based probabilistic network, TDG-NET, is proposed that is capable of modelling the conditional dependencies among the programme basic blocks (BBs) on one hand and conditional dependencies of the transitions between its BBs and input parameters on the other hand. To achieve failure-detection effectiveness, the authors propose a path selection strategy that works based on the predicted outcome of generated test cases. So, they mitigate the need for a human oracle, and the generated test suite could be directly used in fault localisation. Several experiments are conducted to evaluate the performance of Bayes-TDG. The results reveal that the method is promising and the generated test suite could be quite effective.

关键词： belief networks Bayes methods program testing probability Bayesian belief network failure-detection effectiveness maximum coverage test data generation method Bayesian networks probabilistic data prime path-coverage ratio programme structure probabilistic network TDG-NET conditional dependencies programme basic blocks BBs path selection strategy generated test cases generated test suite test data generation Bayes-TDG

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