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检索条件"主题词=Programmable Logic Arrays"
4442 条 记 录,以下是3871-3880 订阅
排序:
CHARGE-COUPLED DEVICE IMPLEMENTATION OF MULTIVALUED logic SYSTEMS
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IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES 1989年 第4期136卷 306-315页
作者: ABDELBARR, MH VRANESIC, ZG UNIV TORONTO DEPT ELECT ENGN TORONTO M5S 1A4 ONTARIO CANADA
A survey of recent developments in the implementation of multivalued logic circuits using charge-coupled device technology is presented. A set of basic logic gate structures which is suitable for synthesis of both bin... 详细信息
来源: 评论
DFT EXPERT - DESIGNING TESTABLE VLSI CIRCUITS
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IEEE DESIGN & TEST OF COMPUTERS 1989年 第5期6卷 8-19页
作者: BHAWMIK, S PALCHAUDHURI, P INDIAN INST TECHNOL DEPT COMP SCIKHARAGPUR 721302W BENGALINDIA
A set of expert-system modules for designing easily testable VLSI circuits called DFT Expert is described. DFT Expert operates at the register-transfer level of circuit description, classifying circuit components into... 详细信息
来源: 评论
A 76-MHZ BICMOS programmable logic SEQUENCER
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IEEE JOURNAL OF SOLID-STATE CIRCUITS 1989年 第5期24卷 1287-1294页
作者: SUNG, C SASAKI, PT LEUNG, R CHU, YM LE, KM CONNER, GW LANE, RH DEJONG, JL CLINE, R SIGNET CORP PLD DESIGN GRPSUNNYVALECA 94088 SIGNET CORP DEPT BIPOLAR BICMOS ADV TECHNOL DEVSUNNYVALECA 94088 SIGNET CORP ADV TECHNOL DEV GRPSUNNYVALECA 94088
A BiCMOS programmable logic sequencer with a maximum operating frequency of 76 MHz at a power dissipation of 370 mW has been developed. The device is organized as 16 inputs, 48 product terms, and eight registered outp... 详细信息
来源: 评论
GRAPH THEORETIC ALGORITHMS FOR THE PLA FOLDING PROBLEM
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IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 1989年 第9期8卷 1014-1021页
作者: LECKY, JE MURPHY, OJ ABSHER, RG Department of Computer Science and Electrical Engineering University of Vermont Burlington VT USA
Graph theoretic properties of the PLA folding problem which not only give insight into the various folding problems but also provide efficient algorithms for solving the problems are presented. This work is based on t... 详细信息
来源: 评论
BOOLEAN DECOMPOSITION IN MULTILEVEL logic OPTIMIZATION
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IEEE JOURNAL OF SOLID-STATE CIRCUITS 1989年 第2期24卷 399-408页
作者: DEVADAS, S WANG, AR NEWTON, AR SANGIOVANNIVINCENTELLI, A UNIV CALIF BERKELEY DEPT ELECT ENGN & COMP SCIBERKELEYCA 94720
Algorithms are presented for Boolean decomposition, which can be used to decompose a programmable logic array (PLA) into a set of smaller interconnected PLAs such that the overall area of the resulting logic network, ... 详细信息
来源: 评论
FAST STRUCTURED DESIGN OF VLSI CIRCUITS
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IEEE TRANSACTIONS ON EDUCATION 1989年 第3期32卷 246-258页
作者: SMITH, KF GU, J Department of Computer Science University of Utah Salt Lake UT USA
It is suggested that a structured, user-friendly, cost-effective tool for rapid implementation of VLSI circuits which encourages students to participate directly in research projects is the key component in digital in... 详细信息
来源: 评论
ON THE SIZE OF PLAS REQUIRED TO REALIZE BINARY AND MULTIPLE-VALUED FUNCTIONS
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IEEE TRANSACTIONS ON COMPUTERS 1989年 第1期38卷 82-98页
作者: BENDER, EA BUTLER, JT USN POSTGRAD SCHDEPT ELECT & COMP ENGNMONTEREYCA 93943
Upper and lower bounds are shown for the average number of product terms required in the minimal realization, as a function of the number of nonzero output values. The variance, in addition to the bounds, allows concl... 详细信息
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A TOTALLY SELF-CHECKING CHECKER FOR BORDEN CODE
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IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 1989年 第7期8卷 731-736页
作者: JHA, NK Department of Electrical Engineering Princeton University Princeton NJ USA
It is well known that a large number of errors in VLSI circuits are unidirectional in nature. J.M. Borden (Inf. Control, vol.53, p.66-73, April 1982) has studied a code for detecting only t, not all, unidirectional er... 详细信息
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SCHWARZ-CHRISTOFFEL TRANSFORMATION FOR THE SIMULATION OF TWO-DIMENSIONAL CAPACITANCE
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IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 1989年 第9期8卷 1025-1027页
作者: KOC, CK ORDUNG, PF UNIV CALIF SANTA BARBARA DEPT ELECT & COMP ENGNSANTA BARBARACA 93106
An inherent problem in the use of simulators for the determination of capacitance in VLSI circuits is the verification of the reliability of the simulation. The problem is due to the numerical approximations made in o... 详细信息
来源: 评论
DESIGN OF FAULT DIAGNOSABLE AND REPAIRABLE PLAS
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IEEE JOURNAL OF SOLID-STATE CIRCUITS 1989年 第5期24卷 1451-1454页
作者: CHANG, TY WEY, CL Department of Electrical Engineering Michigan State University East Lansing MI USA
Presents a complete fault-tolerant programmable logic array (PLA) design that includes both fault diagnosability and repairability. The proposed PLA design is capable of detecting, locating, and repairing single and m... 详细信息
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