Mixed-signal oscilloscope shows what is happening by simultaneously displaying data lines as analog waveforms along with clock and chip-select signals as digital waveforms.
Mixed-signal oscilloscope shows what is happening by simultaneously displaying data lines as analog waveforms along with clock and chip-select signals as digital waveforms.
Designers commonly use 0- to 20-mA, 0 to 10V isolated inputs forindustrial-application-control signals. A combination of isolated supplies, the built-in isolationof an Analog Devices (***) AD7400 sigma-delta modulator...
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Designers commonly use 0- to 20-mA, 0 to 10V isolated inputs forindustrial-application-control signals. A combination of isolated supplies, the built-in isolationof an Analog Devices (***) AD7400 sigma-delta modulator, and a Texas Instruments(***) MSP430 microcontroller creates a design for industrial designers requiring complete,isolated, and robust analog-signal interfaces. A precise signal-conditioning circuit generates thesmall differential voltage that the AD7400 requires (Figure 1). The circuit generates the required200-mV differential voltage. For clarity, the figure omits overvoltage diodes and protectioncircuits.
DESIGNERS MUST MEET STRINGENT CONSTRAINTS TO COMPLY WITH THE USB-IF SPEC, CLEVER TECHNIQUES CAN HELP YOU DESIGN YOUR SYSTEM TO MEET THESE SPECS. Measuring the signal quality of USB (Universal Serial Bus) interfaces re...
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DESIGNERS MUST MEET STRINGENT CONSTRAINTS TO COMPLY WITH THE USB-IF SPEC, CLEVER TECHNIQUES CAN HELP YOU DESIGN YOUR SYSTEM TO MEET THESE SPECS. Measuring the signal quality of USB (Universal Serial Bus) interfaces requires that designers meet the stringent constraints of the USB-IF (USB Implemented Forum, www. ***) specification. Nothing is more frustrating, however, than attempting to hunt down signal-quality issues in your design when your test setup has introduced curve errors. By isolating setup-testing issues from design-testing issues, designers can ensure that they are making proper measurements of the signal quality of USB-data lines. This accomplishment will lead to uncovering rather than masking design problems.
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