咨询与建议

限定检索结果

文献类型

  • 3 篇 期刊文献

馆藏范围

  • 3 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 3 篇 工学
    • 3 篇 计算机科学与技术...
  • 2 篇 管理学
    • 2 篇 管理科学与工程(可...

主题

  • 3 篇 semiconductor fi...
  • 2 篇 problem
  • 2 篇 makespan
  • 1 篇 crow search algo...
  • 1 篇 invasive weed op...
  • 1 篇 cooperative co-e...
  • 1 篇 q-learning
  • 1 篇 probability matr...
  • 1 篇 greedy-based
  • 1 篇 eda

机构

  • 1 篇 liaocheng univ s...
  • 1 篇 shandong normal ...
  • 1 篇 tsinghua univ de...
  • 1 篇 tsinghua univ pe...
  • 1 篇 guilin univ elec...
  • 1 篇 yangtze memory t...

作者

  • 2 篇 liu min
  • 1 篇 sang hong-yan
  • 1 篇 cheng guanyi
  • 1 篇 lin yi
  • 1 篇 hu weiguo
  • 1 篇 liu tao
  • 1 篇 duan pei-yong
  • 1 篇 zhang long
  • 1 篇 dong mingyu
  • 1 篇 zhang yabin
  • 1 篇 li jun-qing
  • 1 篇 xu chuanpei

语言

  • 2 篇 其他
  • 1 篇 英文
检索条件"主题词=Semiconductor final testing scheduling"
3 条 记 录,以下是1-10 订阅
排序:
A new EDA algorithm combined with Q-learning for semiconductor final testing scheduling problem
收藏 引用
COMPUTERS & INDUSTRIAL ENGINEERING 2024年 193卷
作者: Zhang, Long Lin, Yi Xu, Chuanpei Liu, Min Guilin Univ Elect Technol Guangxi Key Lab Cognit Radio & Informat Proc Minist Educ Guilin Peoples R China Tsinghua Univ Dept Automat BNRIST Beijing Peoples R China
In recent years, the semiconductor final testing scheduling Problem (SFTSP), recognized as a unique multiresource scheduling challenge, attracts increasingly attention of academia and industry in the semiconductor man... 详细信息
来源: 评论
A greedy-based crow search algorithm for semiconductor final testing scheduling problem
收藏 引用
COMPUTERS & INDUSTRIAL ENGINEERING 2023年 第1期183卷
作者: Hu, Weiguo Liu, Min Dong, Mingyu Liu, Tao Zhang, Yabin Cheng, Guanyi Tsinghua Univ Beijing Peoples R China Yangtze Memory Technol Co Ltd Wuhan Peoples R China
The semiconductor final testing scheduling problem (SFTSP) is of great importance to the efficiency of integrated circuit firms and has been widely investigated in the field of intelligent optimization. In this paper,... 详细信息
来源: 评论
An effective invasive weed optimization algorithm for scheduling semiconductor final testing problem
收藏 引用
SWARM AND EVOLUTIONARY COMPUTATION 2018年 38卷 42-53页
作者: Sang, Hong-Yan Duan, Pei-Yong Li, Jun-Qing Liaocheng Univ Sch Comp Sci Liaocheng 252059 Peoples R China Shandong Normal Univ Sch Informat Sci & Engn Jinan 250014 Shandong Peoples R China
In this paper, we address a semiconductor final testing problem from the semiconductor manufacturing process. We aim to determine both the assignment of machines and the sequence of operations on all the machines so a... 详细信息
来源: 评论