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检索条件"主题词=Test Program Generation"
31 条 记 录,以下是1-10 订阅
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test program generation for Mixed-Signal Integrated Circuits Based on Automata Network
Test Program Generation for Mixed-Signal Integrated Circuits...
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IEEE East-West Design and test Symposium (EWDTS)
作者: Mosin, Sergey Vladimir State Univ Dept Comp Engn Vladimir Russia
testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching f... 详细信息
来源: 评论
Automatic test program generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors
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IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 2013年 第7期21卷 1220-1233页
作者: Zhang, Ying Li, Huawei Li, Xiaowei Chinese Acad Sci Inst Comp Technol State Key Lab Comp Architecture Beijing 100190 Peoples R China Linkoping Univ Embedded Syst Lab SE-58183 Linkoping Sweden
Software-based self-testing (SBST) has been a promising method for processor testing, but the complexity of the state-of-art processors still poses great challenges for SBST. This paper utilizes the executing trace co... 详细信息
来源: 评论
Automatic test program generation for Transition Delay Faults in Pipelined Processors  5
Automatic Test Program Generation for Transition Delay Fault...
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5th IEEE International test Conference in Asia (ITC-Asia)
作者: Chen, Kai-Hsun Yang, Bo-Yi Liang, Jia-Ruei Chen, Hung-Lin Huang, Jiun-Lang Natl Taiwan Univ Grad Inst Elect Engn Taipei Taiwan Natl Taiwan Univ Dept Elect Engn Taipei Taiwan
For processor cores, software-based self-test (SBST) is a promising complement to scan-based testing, especially for applications that demand high reliability. However, most prior SBST techniques only target stuck-at ... 详细信息
来源: 评论
MicroTESK: A Tool for Constrained Random test program generation for Microprocessors  11th
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11th International Andrei P. Ershov Informatics Conference on Perspectives of System Informatics (PSI)
作者: Kamkin, Alexander Tatarnikov, Andrei Russian Acad Sci Inst Syst Programming Moscow Russia Lomonosov Moscow State Univ Moscow Russia Moscow Inst Phys & Technol Dolgoprudnyi Moscow Region Russia Natl Res Univ Higher Sch Econ Moscow Russia
The paper presents MicroTESK, a tool for test program generation for functional verification of microprocessors. It generates test programs from templates which describe generation tasks in terms of constraints that m... 详细信息
来源: 评论
Compiler Bug Isolation via Effective Witness test program generation  2019
Compiler Bug Isolation via Effective Witness Test Program Ge...
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27th ACM Joint Meeting on European Software Engineering Conference (ESEC) / Symposium on the Foundations of Software Engineering (FSE)
作者: Chen, Junjie Han, Jiaqi Sun, Peiyi Zhang, Lingming Hao, Dan Zhang, Lu Tianjin Univ Coll Intelligence & Comp Tianjin Peoples R China Peking Univ MoE Key Lab High Confidence Software Technol Beijing Peoples R China Univ Texas Dallas Richardson TX 75083 USA Peking Univ Beijing Peoples R China
Compiler bugs are extremely harmful, but are notoriously difficult to debug because compiler bugs usually produce few debugging information. Given a bug-triggering test program for a compiler, hundreds of compiler fil... 详细信息
来源: 评论
test program generation for Mixed-Signal Integrated Circuits Based on Automata Network
Test Program Generation for Mixed-Signal Integrated Circuits...
收藏 引用
IEEE East-West Design & test Symposium
作者: Sergey Mosin Computer engineering department Vladimir State University (VSU) Vladimir Russia
testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching f... 详细信息
来源: 评论
Reinforcement-Learning Based test program generation for Software-Based Self-test
Reinforcement-Learning Based Test Program Generation for Sof...
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28th IEEE Asian test Symposium (ATS)
作者: Chen, Ching-Yuan Huang, Jiun-Lang Natl Taiwan Univ Grad Inst Elect Engn Taipei Taiwan Natl Taiwan Univ Dept Elect Engn Taipei Taiwan
Software-based Self-test (SBST) has been recognized as a promising complement to scan-based structural Built-in Self-test (BIST), especially for in-field self-test applications. In response to the ever-increasing comp... 详细信息
来源: 评论
Compiler test-program generation via Memoized Configuration Search  23
Compiler Test-Program Generation via Memoized Configuration ...
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45th IEEE/ACM International Conference on Software Engineering (ICSE)
作者: Chen, Junjie Suo, Chenyao Jiang, Jiajun Chen, Peiqi Li, Xingjian Tianjin Univ Coll Intelligence & Comp Tianjin Peoples R China
To ensure compilers' quality, compiler testing has received more and more attention, and test-program generation is the core task. In recent years, some approaches have been proposed to explore test configurations... 详细信息
来源: 评论
Detecting Compiler Error Recovery Defects via program Mutation Exploration
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IEEE TRANSACTIONS ON SOFTWARE ENGINEERING 2025年 第2期51卷 389-412页
作者: Tang, Yixuan Zhang, Jingxuan Li, Xiaochen Huang, Zhiqiu Jiang, He Nanjing Univ Aeronaut & Astronaut Coll Comp Sci & Technol Nanjing 211106 Peoples R China Dalian Univ Technol DUT Sch Software Dalian 116600 Peoples R China Minist Ind & Informat Technol Key Lab Safety Crit Software Dev & Verificat Nanjing 211106 Peoples R China Collaborat Innovat Ctr Novel Software Technol & In Nanjing 211106 Peoples R China
Compiler error recovery diagnostics facilitates software development as it provides the possible causes and suggestions on potential programming errors. However, due to compiler bugs, error recovery diagnostics could ... 详细信息
来源: 评论
On the Automatic generation of Optimized Software-Based Self-test programs for VLIW Processors
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IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 2014年 第4期22卷 813-823页
作者: Sabena, Davide Reorda, Matteo Sonza Sterpone, Luca Politecn Torino Dipartimento Automat & Informat I-10129 Turin Italy
Very long instruction word (VLIW) processors are increasingly employed in a large range of embedded signal processing applications, mainly due to their ability to provide high performances with reduced clock rate and ... 详细信息
来源: 评论